Patents by Inventor Yayoi Shitara

Yayoi Shitara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9194876
    Abstract: A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a window generation portion for generating a monitor window. The inspection request data contains a priority, an order time, a required time and inspection items and the sample processing information contains an inspection start time and an inspection estimate finish time. The monitor window has a work area in which the samples represented by sample bars parallel to the abscissa are arranged in a vertical direction and a past record and a future schedule are allocated to this abscissa with the present time as the base. The sample bars display a simulation execution portion for executing simulation on the basis of the inspection start time, the inspection estimate finish time and a delay time. The management server displays the simulation result.
    Type: Grant
    Filed: March 23, 2010
    Date of Patent: November 24, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Tatsuya Tokunga, Naomi Ishii, Takashi Noguchi, Masaki Takano, Yayoi Shitara
  • Patent number: 8929627
    Abstract: An examination information display device of the present invention includes: a storage unit that stores examination information of an object; a display unit that has a display screen on which the examination information is displayed; an extraction unit that extracts candidate examination information, which is a candidate referred to or compared with a reference examination to be diagnosed, using supplementary information of the examination information of the object stored in the storage unit; and a display control unit that displays the candidate examination information in a predetermined display region of the display screen.
    Type: Grant
    Filed: March 23, 2011
    Date of Patent: January 6, 2015
    Assignee: Hitachi Medical Corporation
    Inventors: Masato Suzuki, Maiko Kawase, Yayoi Shitara, Yuki Fukuyama
  • Publication number: 20130093781
    Abstract: An examination information display device of the present invention includes: an acquisition unit that acquires examination information of an object including a medical image captured by a medical image capturing apparatus and attribute information which is added to the examination information and which includes attributes of an examination date and an examination type or unique attributes of the object; a display unit that displays the examination information acquired by the acquisition unit; a generation unit that generates a history area defined by two axes of a first axis indicating one item of the attribute information and a second axis indicating different attribute information from the one item of the attribute information; and a display control unit that performs control to display the examination information at a corresponding coordinate position of the first and second axes of the history area on a display screen of the display unit.
    Type: Application
    Filed: March 23, 2011
    Publication date: April 18, 2013
    Applicant: HITACHI MEDICAL CORPORATION
    Inventors: Masato Suzuki, Maiko Kawase, Yayoi Shitara
  • Publication number: 20130088512
    Abstract: An examination information display device of the present invention includes: a storage unit that stores examination information of an object; a display unit that has a display screen on which the examination information is displayed; an extraction unit that extracts candidate examination information, which is a candidate referred to or compared with a reference examination to be diagnosed, using supplementary information of the examination information of the object stored in the storage unit; and a display control unit that displays the candidate examination information in a predetermined display region of the display screen.
    Type: Application
    Filed: March 23, 2011
    Publication date: April 11, 2013
    Applicant: HITACHI MEDICAL CORPORATION
    Inventors: Masato Suzuki, Maiko Kawase, Yayoi Shitara, Yuki Fukuyama
  • Publication number: 20100250174
    Abstract: A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a window generation portion for generating a monitor window. The inspection request data contains a priority, an order time, a required time and inspection items and the sample processing information contains an inspection start time and an inspection estimate finish time. The monitor window has a work area in which the samples represented by sample bars parallel to the abscissa are arranged in a vertical direction and a past record and a future schedule are allocated to this abscissa with the present time as the base. The sample bars display a simulation execution portion for executing simulation on the basis of the inspection start time, the inspection estimate finish time and a delay time. The management server displays the simulation result.
    Type: Application
    Filed: March 23, 2010
    Publication date: September 30, 2010
    Inventors: Tatsuya TOKUNAGA, Naomi Ishii, Takashi Noguchi, Masaki Takano, Yayoi Shitara