Patents by Inventor Yazan A. Alqudah

Yazan A. Alqudah has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8064682
    Abstract: In one embodiment, a method to analyze a semiconductor wafer comprises extracting inline defect data from a data source, counting a total number of inline defects and end-of-line defects, terminating the analysis when the total number of inline defects and end-of-line defects exceeds a threshold, and mapping the inline defects onto the end-of-line defects when the total number of inline defects and end-of-line defects is less than a threshold.
    Type: Grant
    Filed: June 29, 2007
    Date of Patent: November 22, 2011
    Assignee: Intel Corporation
    Inventors: Yazan A. Alqudah, Hazem Hajj, Mohamed Abdel Moneum
  • Publication number: 20090006436
    Abstract: Systems and methods associated with automated semiconductor fabrication device yield analysis are described. One embodiment includes a computing system that includes a working file storage system that stores files corresponding to semiconductor fabrication test devices. The working file storage system may include working directories and executable flows corresponding to working directories. The computing system also includes a data controller that may select a working directory, transfer an input file to the selected working directory, and execute a flow to process an input file and to produce an output file. The output file may include a yield analysis based on data provided by a semiconductor fabrication test device.
    Type: Application
    Filed: June 29, 2007
    Publication date: January 1, 2009
    Inventors: Yazan A. Alqudah, Hazem Hajj, Mohamed Abdelmoneum, Jan M. Neirynck
  • Publication number: 20090003684
    Abstract: In one embodiment, a method to analyze a semiconductor wafer comprises extracting inline defect data from a data source, counting a total number of inline defects and end-of-line defects, terminating the analysis when the total number of inline defects and end-of-line defects exceeds a threshold, and mapping the inline defects onto the end-of-line defects when the total number of inline defects and end-of-line defects is less than a threshold.
    Type: Application
    Filed: June 29, 2007
    Publication date: January 1, 2009
    Inventors: Yazan A. Alqudah, Hazem Hajj, Mohamed Abdel Moneum