Patents by Inventor Yean San Long

Yean San Long has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230333168
    Abstract: A method and a device for battery detection are provided. In the method, multiple characteristic values measured from a battery during operation of the battery are captured via a data capturing device to form a characteristic curve. Curve fitting is performed on the characteristic curve to obtain a curve error. According to the magnitude of the curve error, it is determined whether the battery is normal. When the determination result is abnormal, a step-curvature radius analysis is performed on the characteristic curve to determine whether the battery is normal.
    Type: Application
    Filed: January 11, 2023
    Publication date: October 19, 2023
    Applicant: Industrial Technology Research Institute
    Inventors: Teng-Chun Wu, Yean-San Long, Cho-Fan Hsieh, Min-An Tsai, Hsiu-Ming Chang, Feng-Ming Chuang, Tze-An Liu
  • Patent number: 10461690
    Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error is not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.
    Type: Grant
    Filed: December 4, 2017
    Date of Patent: October 29, 2019
    Assignee: Industrial Technology Research Institute
    Inventors: Yean-San Long, En-Yun Wang, Ren-Chin Shr, Yu-Ting Yen, Hsiang-Ying Cheng
  • Patent number: 10333462
    Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.
    Type: Grant
    Filed: December 19, 2016
    Date of Patent: June 25, 2019
    Assignee: Industrial Technology Research Institute
    Inventors: Ren-Chin Shr, Yean-San Long, En-Yun Wang, Min-An Tsai, Hung-Sen Wu, Teng-Chun Wu, Cho-Fan Hsieh, Chin Lien
  • Publication number: 20190173423
    Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error s not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.
    Type: Application
    Filed: December 4, 2017
    Publication date: June 6, 2019
    Applicant: Industrial Technology Research Institute
    Inventors: Yean-San Long, En-Yun Wang, Ren-Chin Shr, Yu-Ting Yen, Hsiang-Ying Cheng
  • Publication number: 20180123510
    Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.
    Type: Application
    Filed: December 19, 2016
    Publication date: May 3, 2018
    Applicant: Industrial Technology Research Institute
    Inventors: Ren-Chin Shr, Yean-San Long, En-Yun Wang, Min-An Tsai, Hung-Sen Wu, Teng-Chun Wu, Cho-Fan Hsieh, Chin Lien
  • Patent number: 9866171
    Abstract: A measuring device for the property of a photovoltaic device and a measuring method using the same are provided. The measuring device includes several light sources and a feedback control module. The light color of each light source is different and includes several light-emitting elements symmetrically configured. The feedback control module is used for controlling illuminations of the light-emitting elements for measuring the property of a photovoltaic device.
    Type: Grant
    Filed: December 10, 2015
    Date of Patent: January 9, 2018
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Yean-San Long, Shu-Tsung Hsu, Teng-Chun Wu, Min-An Tsai
  • Publication number: 20170104448
    Abstract: A measuring device for the property of a photovoltaic device and a measuring method using the same are provided. The measuring device includes several light sources and a feedback control module. The light color of each light source is different and includes several light-emitting elements symmetrically configured. The feedback control module is used for controlling illuminations of the light-emitting elements for measuring the property of a photovoltaic device.
    Type: Application
    Filed: December 10, 2015
    Publication date: April 13, 2017
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Yean-San LONG, Shu-Tsung HSU, Teng-Chun WU, Min-An TSAI
  • Publication number: 20150039270
    Abstract: A method and a system for inspecting a defect of a solar cell are provided, and the method includes: receiving inspecting data corresponding to the solar cell from an inspecting device; obtaining a current-voltage (I-V) curve of the solar cell according to the inspecting data; defining a first reference region on the I-V curve, and obtaining a plurality of first curve characteristics of the I-V curve in the first reference region; determining a defect type of the solar cell according to the first curve characteristics.
    Type: Application
    Filed: June 11, 2014
    Publication date: February 5, 2015
    Inventors: Yean-San Long, Teng-Chun Wu, Cho-Fan Hsieh, Shu-Tsung Hsu, Chan-Hsiao Ho
  • Patent number: 8224598
    Abstract: The method for forming the optimal characteristic curve of a solar cell comprises the steps of: providing a first acceptable error; and determining a current-voltage polynomial regression equation, whose square root of the residual sum of square is less than the first acceptable error for a set of solar cell measured data. The order of the current-voltage polynomial regression equation is gradually increased until the square root of the residual sum of square of the current-voltage polynomial regression equation is less than the first acceptable error.
    Type: Grant
    Filed: July 11, 2008
    Date of Patent: July 17, 2012
    Assignee: Industrial Technology Research Institute
    Inventors: Teng Chun Wu, Bor Nian Chuang, Jang Shii Song, Hung Sen Wu, Yean San Long
  • Publication number: 20090234601
    Abstract: The method for forming the optimal characteristic curve of a solar cell comprises the steps of: providing a first acceptable error; and determining a current-voltage polynomial regression equation, whose square root of the residual sum of square is less than the first acceptable error for a set of solar cell measured data. The order of the current-voltage polynomial regression equation is gradually increased until the square root of the residual sum of square of the current-voltage polynomial regression equation is less than the first acceptable error.
    Type: Application
    Filed: July 11, 2008
    Publication date: September 17, 2009
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: TENG CHUN WU, BOR NIAN CHUANG, JANG SHII SONG, HUNG SEN WU, YEAN SAN LONG