Patents by Inventor Ye-eun PARK

Ye-eun PARK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240280435
    Abstract: Provided is an optical measurement apparatus. The optical measurement apparatus includes a light source; an objective lens; a reflector configured to change an optical path of light emitted from the light source such that the light is directed toward the objective lens; a detector configured to detect a pupil image; a first adjuster configured to rotate the light source around the reflector; and a second adjuster configured to rotate the reflector.
    Type: Application
    Filed: January 2, 2024
    Publication date: August 22, 2024
    Inventors: Seung Ryeol LEE, Ye Eun PARK, Jin Woo AHN, Seung Woo LEE, Tae Joong KIM, Myung Jun LEE
  • Patent number: 11455302
    Abstract: Methods for distributed histogram computation in a framework utilizing data stream sketches and samples are performed by systems and devices. Distributions of large data sets are scanned once and processed by a computing pool, without sorting, to generate local sketches and value samples of each distribution. The local sketches and samples are utilized to construct local histograms on which cardinality estimates are obtained for query plan generation of distributed queries against distributions. Local statistics of distributions are also merged and consolidated to construct a global histogram representative of the entire data set. The global histogram is utilized to determine a cardinality estimation for query plan generation of incoming queries against the entire data set. The addition of new data to a data set or distribution involves a scan of the new data from which new statistics are generated and then merged with existing statistics for a new global histogram.
    Type: Grant
    Filed: August 31, 2020
    Date of Patent: September 27, 2022
    Assignee: MICROSOFT TECHNOLOGY LICENSING, LLC
    Inventors: Sumeet Priyadarshee Dash, Arnd Christian König, Kabita Mahapatra, Dang Hai Pham, Ye Eun Park, Chi Yang, Mahadevan Sankara Subramanian, Cesar Alejandro Galindo-Legaria
  • Publication number: 20210357403
    Abstract: Methods for distributed histogram computation in a framework utilizing data stream sketches and samples are performed by systems and devices. Distributions of large data sets are scanned once and processed by a computing pool, without sorting, to generate local sketches and value samples of each distribution. The local sketches and samples are utilized to construct local histograms on which cardinality estimates are obtained for query plan generation of distributed queries against distributions. Local statistics of distributions are also merged and consolidated to construct a global histogram representative of the entire data set. The global histogram is utilized to determine a cardinality estimation for query plan generation of incoming queries against the entire data set. The addition of new data to a data set or distribution involves a scan of the new data from which new statistics are generated and then merged with existing statistics for a new global histogram.
    Type: Application
    Filed: August 31, 2020
    Publication date: November 18, 2021
    Inventors: Sumeet Priyadarshee Dash, Arnd Christian König, Kabita Mahapatra, Dang Hai Pham, Ye Eun Park, Chi Yang, Mahadevan Sankara Subramanian, Cesar Alejandro Galindo-Legaria
  • Patent number: 11037283
    Abstract: Provided is a hyperspectral imaging (HSI)-based inspection apparatus capable of quickly and stably performing two-dimensional (2D) HSI for an inspection object, and accordingly, capable of quickly and accurately inspecting the inspection object. The HSI-based inspection apparatus includes: a stage on which an inspection object is arranged; an optical system configured to allow light to be incident on the inspection object and emit the light reflected from the inspection object; a scan mirror configured to reflect the emitted light from the optical system while rotating; and a hyperspectral camera configured to obtain an image having a wavelength direction and a line direction as two axes for light reflected from the scan mirror, wherein, by using the rotation of the scan mirror, the hyperspectral camera is configured to perform the 2D HSI for the inspection object.
    Type: Grant
    Filed: June 18, 2019
    Date of Patent: June 15, 2021
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung-Ho Jang, Yasuhiro Hidaka, Young-kyu Park, Ye-eun Park, Yu-Sin Yang
  • Publication number: 20200184624
    Abstract: Provided is a hyperspectral imaging (HSI)-based inspection apparatus capable of quickly and stably performing two-dimensional (2D) HSI for an inspection object, and accordingly, capable of quickly and accurately inspecting the inspection object. The HSI-based inspection apparatus includes: a stage on which an inspection object is arranged; an optical system configured to allow light to be incident on the inspection object and emit the light reflected from the inspection object; a scan mirror configured to reflect the emitted light from the optical system while rotating; and a hyperspectral camera configured to obtain an image having a wavelength direction and a line direction as two axes for light reflected from the scan mirror, wherein, by using the rotation of the scan mirror, the hyperspectral camera is configured to perform the 2D HSI for the inspection object.
    Type: Application
    Filed: June 18, 2019
    Publication date: June 11, 2020
    Inventors: Sung-ho JANG, Yasuhiro HIDAKA, Young-kyu PARK, Ye-eun PARK, Yu-sin YANG