Abstract: Techniques and mechanisms for fabricating an eyepiece from a lens blank including blank bodies that are bonded to each other. In an embodiment, the blank bodies are formed by injection molding and adhered to one another. Fabrication of the eyepiece includes variously machining the blank bodies to shape respective lens bodies of the eyepiece. One or more blocking structures are coupled to reinforce the lens blank during at least part of such machining. In another embodiment, any blocking structures that are to resist forces of a particular machining process are coupled only indirectly to one of the blank bodies.

Abstract: Techniques and mechanisms for fabricating an eyepiece from a lens blank including blank bodies that are bonded to each other. In an embodiment, the blank bodies are formed by injection molding and adhered to one another. Fabrication of the eyepiece includes variously machining the blank bodies to shape respective lens bodies of the eyepiece. One or more blocking structures are coupled to reinforce the lens blank during at least part of such machining. In another embodiment, any blocking structures that are to resist forces of a particular machining process are coupled only indirectly to one of the blank bodies.

Abstract: The present invention relates to OLEDs comprising an electron impeding layer between the cathode and the emissive layer. An organic light emitting device, comprising: an anode; a hole transport layer; an organic emissive layer comprising an emissive layer host and an emissive dopant; an electron impeding layer; an electron transport layer; and a cathode disposed, in that order, over a substrate.

Abstract: A method for evaluating reliance level of a virtual metrology system is disclosed. In this method, a reliance index (RI) and a RI threshold value are calculated by analyzing the process data of production equipment, thereby determining if the virtual metrology result is reliable. Besides, in this method, a global similarity index (GSI) and individual similarity indexes (ISI) are also provided for defining the degree of similarity between the current set of process data and all of the sets of historical process data used for establishing the conjecture model, thereby assisting the RI in gauging the degree of reliance and locating the key parameter(s) that cause major deviation.

Abstract: A method for evaluating reliance level of a virtual metrology system is disclosed. In this method, a reliance index (RI) and a RI threshold value are calculated by analyzing the process data of production equipment, thereby determining if the virtual metrology result is reliable. Besides, in this method, a global similarity index (GSI) and individual similarity indexes (ISI) are also provided for defining the degree of similarity between the current set of process data and all of the sets of historical process data used for establishing the conjecture model, thereby assisting the RI in gauging the degree of reliance and locating the key parameter(s) that cause major deviation.

Abstract: The present invention relates to OLEDs comprising an electron impeding layer between the cathode and the emissive layer. An organic light emitting device, comprising: an anode; a hole transport layer; an organic emissive layer comprising an emissive layer host and an emissive dopant; an electron impeding layer; an electron transport layer; and a cathode disposed, in that order, over a substrate.