Abstract: A foldable laundry hamper having a folded and unfolded state, and in the folded state a floor panel and a cover of the hamper are sandwiched between the front and back panels and the hamper occupies a relatively small volume.

Abstract: There is provided a method and a system configured to compensate for image distortions. An example method includes first receiving a warped image of an array of cells of a specimen. Each cell of the array comprises one or more structural elements of a substrate. A reference image of a region associated with a cell of the array of cells is generated and a first cell of the array of cells is identified using the reference image and at least part of the warped image. One or more locations comprising cells that differ from the first cell are identified and, based at least on the one or more locations, a warped compensation transform is determined. The warped compensation transform is applied on the warped image to generate an undistorted image.

Abstract: There is provided a method and a system configured to compensate for image distortions.

Abstract: An annuloplasty structure includes a flexible sleeve and an elongate contraction wire. The sleeve has a first sleeve-end-portion, a second sleeve-end-portion, and a circumferential wall that defines a longitudinal lumen between the first and second sleeve-end-portions. The contraction wire has a first wire-end and a second wire-end, the first wire-end being attached to the sleeve at the first sleeve-end-portion. The wire extends, in association with the circumferential wall, from the first sleeve-end-portion to the second sleeve-end-portion. The wire is arranged with respect to the sleeve such that increasing a longitudinal proportion of the wire that is disposed within the lumen longitudinally contracts the sleeve. Other embodiments are also provided.

Abstract: There is provided a method and a system configured obtain an image of a semiconductor specimen including one or more arrays, each including repetitive structural elements, and one or more regions, each region at least partially surrounding a corresponding array and including features different from the repetitive structural elements, wherein the PMC is configured to, during run-time scanning of the semiconductor specimen, perform a correlation analysis between pixel intensity of the image and pixel intensity of a reference image informative of at least one of the repetitive structural elements, to obtain a correlation matrix, use the correlation matrix to distinguish between one or more first areas of the image corresponding to the one or more arrays and one or more second areas of the image corresponding the one or more regions, and output data informative of the one or more first areas of the image.

Abstract: There is provided a method and a system configured obtain an image of a semiconductor specimen including one or more arrays, each including repetitive structural elements, and one or more regions, each region at least partially surrounding a corresponding array and including features different from the repetitive structural elements, wherein the PMC is configured to, during run-time scanning of the semiconductor specimen, perform a correlation analysis between pixel intensity of the image and pixel intensity of a reference image informative of at least one of the repetitive structural elements, to obtain a correlation matrix, use the correlation matrix to distinguish between one or more first areas of the image corresponding to the one or more arrays and one or more second areas of the image corresponding the one or more regions, and output data informative of the one or more first areas of the image.

Abstract: A foldable laundry hamper having a folded and unfolded state, and in the folded state a floor panel and a cover of the hamper are sandwiched between the front and back panels and the hamper occupies a relatively small volume.

Abstract: There is provided a method and a system configured to compensate for image distortions.

Abstract: There is provided a method and a system configured obtain an image of a semiconductor specimen including one or more arrays, each including repetitive structural elements, and one or more regions, each region at least partially surrounding a corresponding array and including features different from the repetitive structural elements, wherein the PMC is configured to, during run-time scanning of the semiconductor specimen, perform a correlation analysis between pixel intensity of the image and pixel intensity of a reference image informative of at least one of the repetitive structural elements, to obtain a correlation matrix, use the correlation matrix to distinguish between one or more first areas of the image corresponding to the one or more arrays and one or more second areas of the image corresponding the one or more regions, and output data informative of the one or more first areas of the image.

Abstract: An annuloplasty structure includes a flexible sleeve and an elongate contraction wire. The sleeve has a first sleeve-end-portion, a second sleeve-end-portion, and a circumferential wall that defines a longitudinal lumen between the first and second sleeve-end-portions. The contraction wire has a first wire-end and a second wire-end, the first wire-end being attached to the sleeve at the first sleeve-end-portion. The wire extends, in association with the circumferential wall, from the first sleeve-end-portion to the second sleeve-end-portion. The wire is arranged with respect to the sleeve such that increasing a longitudinal proportion of the wire that is disposed within the lumen longitudinally contracts the sleeve. Other embodiments are also provided.

Abstract: A reconfigurable container is disclosed, the container being reconfigurable between a first configuration in which the container defines a receptacle for receiving an item, and a second configuration in which the container comprises a collapsed configuration for storage. The container comprises: a base and a wall which is arranged to extend around the base, the wall comprising at least two hingedly coupled wall portions, the base being hingedly coupled to a lower region of at least one wall portion, the wall further comprising a ledge disposed along a lower region thereof which is arranged to extend inwardly of the container, for supporting the base when the container is configured in the first configuration.

Abstract: A reconfigurable container is disclosed, the container being reconfigurable between a first configuration in which the container defines a receptacle for receiving an item, and a second configuration in which the container comprises a collapsed configuration for storage. The container comprises: a base and a wall which is arranged to extend around the base, the wall comprising at least two hingedly coupled wall portions, the base being hingedly coupled to a lower region of at least one wall portion, the wall further comprising a ledge disposed along a lower region thereof which is arranged to extend inwardly of the container, for supporting the base when the container is configured in the first configuration.

Abstract: A flow cell apparatus including a channel plate having a channel recessed into a surface of the channel plate, and a groove recessed into the surface of the channel plate, the groove configured to surround the channel and preferably along a boundary of the channel. The flow cell apparatus further includes a seal shaped and receivable in the groove, a substrate, a backing plate, and a fastening element configured to removably attach the channel plate to the backing plate with the substrate sandwiched between the channel plate and the backing plate to bear the seal against the channel plate with the substrate.

Abstract: A system including an interface for receiving inspection image data of an inspection image of an inspection object. The inspection image data includes information of an analyzed pixel of the inspected image and of reference pixels of the inspected image. The system further includes a memory and a processor device operatively coupled to the interface and the memory to obtain an inspected value representative of the analyzed pixel of the inspected image, and a reference value for each of the reference pixels of the inspected image. For each reference pixel, the processor devices calculates a difference between the reference value of a respective reference pixel and the inspected value of the analyzed pixel, computes a representative difference value based on the differences and determines a presence of a defect in the analyzed pixel based on the representative difference value.

Abstract: A system includes a memory and a processor device operatively coupled to the memory to obtain an inspected noise-indicative value representative of an analyzed pixel of an inspected image of an inspected object, and a reference noise-indicative value representative for each of multiple reference pixels of the inspected image. The processor device computes a representative noise-indicative value based on the inspected noise-indicative value and multiple reference noise-indicative values, calculates a defect-indicative value based on an inspected value representative of the analyzed pixel and determines a presence of a defect in the analyzed pixel based on the representative noise-indicative value and the defect-indicative value.

Abstract: Provided is a method of manufacturing a device for supporting biological material growth, including forming a first platform layer through a molding process, the first base layer including a central chamber; and a plurality of elongate channels coupling the central chamber to the periphery of the first platform layer; forming a second platform layer through a molding process; and coupling the first platform layer to the second platform layer. Accordingly, a device for supporting biological material growth is also provided.

Abstract: A system includes a memory and a processor device operatively coupled to the memory to obtain an inspected noise-indicative value representative of an analyzed pixel of an inspected image of an inspected object, and a reference noise-indicative value representative for each of multiple reference pixels of the inspected image. The processor device computes a representative noise-indicative value based on the inspected noise-indicative value and multiple reference noise-indicative values, calculates a defect-indicative value based on an inspected value representative of the analyzed pixel and determines a presence of a defect in the analyzed pixel based on the representative noise-indicative value and the defect-indicative value.

Abstract: A system including an interface for receiving inspection image data of an inspection image of an inspection object. The inspection image data includes information of an analyzed pixel of the inspected image and of reference pixels of the inspected image. The system further includes a memory and a processor device operatively coupled to the interface and the memory to obtain an inspected value representative of the analyzed pixel of the inspected image, and a reference value for each of the reference pixels of the inspected image. For each reference pixel, the processor devices calculates a difference between the reference value of a respective reference pixel and the inspected value of the analyzed pixel, computes a representative difference value based on the differences and determines a presence of a defect in the analyzed pixel based on the representative difference value.