Abstract: A computing system includes a target device to be cooled, a fan unit, a storage device storing a first portion and a second portion of firmware, and a baseboard management controller (BMC). In the firmware, only the first portion is related to heat-dissipation control. The BMC executes the firmware for monitoring the target device, generating a monitoring report for the target device, and controlling the rotational speed of the fan unit based on the monitoring report thus generated and on cooling parameters and cooling algorithms stored in the first portion of the firmware.

Abstract: A method of collecting error logs according to the disclosure includes generating, during procedure of BIOS of a server, at least one BIOS error log based on detection of an error condition of one or more of hardware devices and a CPU, transmitting the at least one BIOS error log to a BMC, storing the at least one BIOS error log received from the CPU, packaging the at least one BIOS error log and at least one log that is generated by the BMC and that is related to BMC sensors to generate an error log file, and storing the error log file.

Abstract: A remote error detection method is provided. A service computer stores error log collection (ELC) data that are related to the service computer device, and generates and transmits an alert signal to a remote computer device when a baseboard management controller (BMC) thereof determines that a predetermined trigger event has occurred. The remote computer device receives the error log collection data after the service computer device sends the alert signal to the remote computer device.

Abstract: A computing system includes a target device to be cooled, a fan unit, a storage device storing a first portion and a second portion of firmware, and a baseboard management controller (BMC). In the firmware, only the first portion is related to heat-dissipation control. The BMC executes the firmware for monitoring the target device, generating a monitoring report for the target device, and controlling the rotational speed of the fan unit based on the monitoring report thus generated and on cooling parameters and cooling algorithms stored in the first portion of the firmware.

Abstract: A method of collecting error logs according to the disclosure includes generating, during procedure of BIOS of a server, at least one BIOS error log based on detection of an error condition of one or more of hardware devices and a CPU, transmitting the at least one BIOS error log to a BMC, storing the at least one BIOS error log received from the CPU, packaging the at least one BIOS error log and at least one log that is generated by the BMC and that is related to BMC sensors to generate an error log file, and storing the error log file.

Abstract: Embodiments of the present disclosure provide a method and a device for processing a picture and an electronic device. The method includes scaling a raw picture to obtain N scaled pictures with different resolutions, where N is a natural number greater than or equal to 2; mapping the N scaled pictures respectively into N content picture each with a same predetermined style feature through a neural algorithm network; scaling the N content pictures to have the same resolution; and encoding and combining the N content images of the same resolution into a dynamic video.

Abstract: Embodiments of the present disclosure provide a method and a device for processing a picture and an electronic device. The method includes scaling a raw picture to obtain N scaled pictures with different resolutions, where N is a natural number greater than or equal to 2; mapping the N scaled pictures respectively into N content picture each with a same predetermined style feature through a neural algorithm network; scaling the N content pictures to have the same resolution; and encoding and combining the N content images of the same resolution into a dynamic video.

Abstract: A method of forming a semiconductor device includes following steps. First of all, a first work function layer is formed on a substrate. Next, a first patterned photoresist layer is formed on the first work function layer. Then, the first work function layer is partially removed by using the first patterned photoresist layer as a mask to form a patterned first work function layer. Subsequently, the first patterned photoresist layer is removed by providing radical oxygen.

Abstract: A method of forming a semiconductor device includes following steps. First of all, a first work function layer is formed on a substrate. Next, a first patterned photoresist layer is formed on the first work function layer. Then, the first work function layer is partially removed by using the first patterned photoresist layer as a mask to form a patterned first work function layer. Subsequently, the first patterned photoresist layer is removed by providing radical oxygen.