Abstract: A method of making a ROM structure includes the operations of forming an active area having a channel, a source region, and a drain region; depositing a gate electrode over the channel; depositing a conductive line over at least one of the source region and the drain region; adding dopants to the source region and the drain region of the active area; forming contacts to the gate electrode, the source region, and the drain; depositing a power rail, a bit line, and at least one word line of the integrated circuit against the contacts; and dividing the active area with a trench isolation structure to electrically isolate the gate electrode from the source region and the drain region.

Abstract: A method capable of detecting a status of a basic input/output system (BIOS) for setting a clock is applied to a clock generating device of a computer motherboard and sets the clock according to a signal status of the BIOS or a trigger signal. A device capable of detecting the BIOS status for setting the clock is also proposed. The device has a crystal oscillator, a frequency control unit, a phase-lock-loop (PLL) spread-spectrum unit electrically connected with the crystal oscillator and the frequency control unit, a memory unit having a clock setting value stored therein, a detection control unit electrically connected with the memory unit and used to detect a signal status, and a logic control unit electrically connected with the PLL spread-spectrum unit, the frequency control unit and the detection control unit.

Abstract: A method for semiconductor defect detection, applied to a wafer test in a semiconductor process. A defect test is implemented for generating redundant information. an abnormal test implemented for generating a first FBM. The redundant information is converted to a second FBM. The first and second FBMs are compared, thereby generating a third FBM according to comparison results.

Abstract: A method for semiconductor defect detection, applied to a wafer test in a semiconductor process. A defect test is implemented for generating redundant information. an abnormal test implemented for generating a first FBM. The redundant information is converted to a second FBM. The first and second FBMs are compared, thereby generating a third FBM according to comparison results.