Patents by Inventor Yen-Ting Yu

Yen-Ting Yu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11403564
    Abstract: A hotspot detection system that classifies a set of hotspot training data into a plurality of hotspot clusters according to their topologies, where the hotspot clusters are associated with different hotspot topologies, and classifies a set of non-hotspot training data into a plurality of non-hotspot clusters according to their topologies, where the non-hotspot clusters are associated with different topologies. The system extracts topological and non-topological critical features from the hotspot clusters and centroids of the non-hotspot clusters. The system also creates a plurality of kernels configured to identify hotspots, where each kernel is constructed using the extracted critical features of the non-hotspot clusters and the extracted critical features from one of the hotspot clusters, and each kernel is configured to identify hotspot topologies different from hotspot topologies that the other kernels are configured to identify.
    Type: Grant
    Filed: June 5, 2019
    Date of Patent: August 2, 2022
    Assignee: Synopsys, Inc.
    Inventors: Charles C. Chiang, Yen-Ting Yu, Geng-He Lin, Hui-Ru Jiang
  • Publication number: 20190287021
    Abstract: A hotspot detection system that classifies a set of hotspot training data into a plurality of hotspot clusters according to their topologies, where the hotspot clusters are associated with different hotspot topologies, and classifies a set of non-hotspot training data into a plurality of non-hotspot clusters according to their topologies, where the non-hotspot clusters are associated with different topologies. The system extracts topological and non-topological critical features from the hotspot clusters and centroids of the non-hotspot clusters. The system also creates a plurality of kernels configured to identify hotspots, where each kernel is constructed using the extracted critical features of the non-hotspot clusters and the extracted critical features from one of the hotspot clusters, and each kernel is configured to identify hotspot topologies different from hotspot topologies that the other kernels are configured to identify.
    Type: Application
    Filed: June 5, 2019
    Publication date: September 19, 2019
    Inventors: Charles C. Chiang, Yen-Ting Yu, Geng-He Lin, Hui-Ru Jiang
  • Patent number: 9594867
    Abstract: A range-pattern-matching-type DRC-based process hotspot detection is provided that considers edge tolerances and incomplete specification (“don't care”) regions in foundry-provided hotspot patterns. First, all possible topological patterns are enumerated for the foundry-provided hotspot pattern. Next, critical topological features are extracted from each pattern topology and converted to critical design rules using Modified Transitive Closure Graphs (MTCGs). Third, the extracted critical design rules are arranged in an order that facilitates searching space reduction techniques, and then the DRC process is sequentially repeated on a user's entire layout pattern for each critical design rule in a first group, then searching space reduction is performed to generate a reduced layout pattern, and then DRC process is performed for all remaining critical design rules using the reduced layout pattern.
    Type: Grant
    Filed: October 30, 2014
    Date of Patent: March 14, 2017
    Assignee: Synopsys, Inc.
    Inventors: Yen Ting Yu, Hui-Ru Jiang, Yumin Zhang, Charles C. Chiang
  • Publication number: 20160125120
    Abstract: A range-pattern-matching-type DRC-based process hotspot detection is provided that considers edge tolerances and incomplete specification (“don't care”) regions in foundry-provided hotspot patterns. First, all possible topological patterns are enumerated for the foundry-provided hotspot pattern. Next, critical topological features are extracted from each pattern topology and converted to critical design rules using Modified Transitive Closure Graphs (MTCGs). Third, the extracted critical design rules are arranged in an order that facilitates searching space reduction techniques, and then the DRC process is sequentially repeated on a user's entire layout pattern for each critical design rule in a first group, then searching space reduction is performed to generate a reduced layout pattern, and then DRC process is performed for all remaining critical design rules using the reduced layout pattern.
    Type: Application
    Filed: October 30, 2014
    Publication date: May 5, 2016
    Inventors: Yen Ting Yu, Hui-Ru Jiang, Yumin Zhang, Charles C. Chiang
  • Publication number: 20140358830
    Abstract: A hotspot detection system that classifies a set of hotspot training data into a plurality of hotspot clusters according to their topologies, where the hotspot clusters are associated with different hotspot topologies, and classifies a set of non-hotspot training data into a plurality of non-hotspot clusters according to their topologies, where the non-hotspot clusters are associated with different topologies. The system extracts topological and non-topological critical features from the hotspot clusters and centroids of the non-hotspot clusters. The system also creates a plurality of kernels configured to identify hotspots, where each kernel is constructed using the extracted critical features of the non-hotspot clusters and the extracted critical features from one of the hotspot clusters, and each kernel is configured to identify hotspot topologies different from hotspot topologies that the other kernels are configured to identify.
    Type: Application
    Filed: May 27, 2014
    Publication date: December 4, 2014
    Applicant: Synopsys, Inc.
    Inventors: Charles C. Chiang, Yen-Ting Yu, Geng-He Lin, Hui-Ru Jiang
  • Patent number: 8601419
    Abstract: An accurate process hotspot detection technique based on DRC is provided. In this technique, critical DRC rules can be extracted from a pattern. This extraction can include generating horizontal tiles and vertical tiles in the pattern, and adding directed edges to indicate relations between adjacent tiles in the pattern. Rule rectangles, which can also be generated during the critical DRC rule extraction, describe polygon placement in the pattern with a minimal number of critical DRC rules. The extracted DRC rules can be included in a DRC runset file. DRC can be performed with the DRC runset file on a layout. The DRC results can be filtered using the rule rectangles to identify potential hotspots and to verify actual hotspots.
    Type: Grant
    Filed: November 5, 2012
    Date of Patent: December 3, 2013
    Assignee: Synopsys, Inc.
    Inventors: Charles C. Chiang, Yen-Ting Yu, Hui-Ru Jiang, Subarnarekha Sinha, Ya-Chung Chan