Abstract: A switchable backlight module is disclosed. The switchable backlight module includes two light source modules arranged parallelly with respect to a plane. Each of the light source modules includes a turning film and a LGP. The LGP is of an edge-lit type arranged parallelly under the turning film. A light ray enters the LGP from a light incident side of the LGP, exits the LGP from a light emergent surface of the LGP, enters the turning film, and exits the turning film from a surface of the turning film away from the LGP. The light incident side of the LGP of one of the light source modules is perpendicular to the light incident side of the LGP of the other light source module. The switchable backlight module is in an anti-peeping mode having a narrow viewing angle when only an upper one of the light source modules emits light.

Abstract: A light sensor structure and the manufacturing method thereof are disclosed. The light sensor structure includes a substrate with a first surface and a second surface opposite to each other. A light sensing element including a light sensing area is disposed on the first surface. A reflection layer is disposed on the second surface. The reflection layer covers a portion of the second surface aligning with the light sensing area.

Abstract: A light sensor structure and the manufacturing method thereof are disclosed. The light sensor structure includes a substrate with a first surface and a second surface opposite to each other. A light sensing element including a light sensing area is disposed on the first surface. A reflection layer is disposed on the second surface. The reflection layer covers a portion of the second surface aligning with the light sensing area.

Abstract: A testing system includes a base, a frame installed on the base, a platform, a first driving mechanism, a second driving mechanism, a locating component, a third driving mechanism and a control unit. Two guiding tracks and a sliding component which slides along the two guiding tracks are disposed under two sides of the platform. The second driving mechanism is connected to the sliding component, and the third driving mechanism is disposed on the sliding component and connected to the locating component. The control unit is for controlling the first driving mechanism to drive the platform to move in a first direction, so that the locating component presses a portable electronic device disposed on the base. The control unit is further for controlling the second driving mechanism and the third driving mechanism to drive the locating component to move in a second direction and a third direction.

Abstract: A testing system includes a base, a frame installed on the base, a platform, a first driving mechanism, a second driving mechanism, a locating component, a third driving mechanism and a control unit. Two guiding tracks and a sliding component which slides along the two guiding tracks are disposed under two sides of the platform. The second driving mechanism is connected to the sliding component, and the third driving mechanism is disposed on the sliding component and connected to the locating component. The control unit is for controlling the first driving mechanism to drive the platform to move in a first direction, so that the locating component presses a portable electronic device disposed on the base. The control unit is further for controlling the second driving mechanism and the third driving mechanism to drive the locating component to move in a second direction and a third direction.

Abstract: An electrostatic discharge (ESD) protection circuit includes a polysilicon diode, a switch element, and a load element. The poly silicon diode has a first terminal and a second terminal. The switch element has a control terminal coupled to the first terminal of the polysilicon diode, a first terminal coupled to the second terminal of the polysilicon diode, and a second terminal. The load element is coupled to the control terminal of the switch element and the second terminal of the switch element.

Abstract: A metal-oxide-semiconductor device includes a substrate, a gate on the substrate, a source in the substrate and adjacent to one side of the gate, a drain in the substrate and adjacent to another side of the gate, a gate channel in the substrate and under the gate, and a gate insulator between the source and the drain and the gate and the gate channel, wherein the gate insulator has a substantially uneven thickness for use in electrostatic discharge (ESD) protection.

Abstract: An ESD protection device includes a substrate with a doped well of a first conductive type, a first and a second doping region of the first conductive type and a third and a fourth doping region of a second conductive type respectively disposed in the doped well, a first gate disposed on the substrate and between the first and the second doping region, and a second gate disposed on the substrate and between the second and the third doping region to determine the distance between the second and the third doping region in order to precisely adjust the breakdown voltage of the ESD protection device of the present invention.