Patents by Inventor Yeoil YUN

Yeoil YUN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190294748
    Abstract: A method of designing a semiconductor circuit using a circuit simulation tool executed by a computer includes calculating power consumptions of elements of the semiconductor circuit by use of the circuit simulation tool. A thermal netlist is created about the semiconductor circuit, based on the power consumptions and geometry information of each of the elements. A simulation of the semiconductor circuit is performed with the thermal netlist using the circuit simulation tool to detect a temperature of each of the elements. The thermal netlist includes thermal capacitance information of each of the elements.
    Type: Application
    Filed: February 20, 2019
    Publication date: September 26, 2019
    Inventors: JONGWOOK JEON, YEOIL YUN, SANGWOO PAE, UIHUI KWON, KEUNHO LEE
  • Publication number: 20190130059
    Abstract: A method of designing a semiconductor circuit using a circuit simulation tool executed by a computer includes calculating power consumptions of elements of the semiconductor circuit by use of the circuit simulation tool. A thermal netlist is created about the semiconductor circuit, based on the power consumptions and geometry information of each of the elements. A simulation of the semiconductor circuit is performed with the thermal netlist using the circuit simulation tool to detect a temperature of each of the elements. The thermal netlist includes thermal capacitance information of each of the elements.
    Type: Application
    Filed: December 27, 2018
    Publication date: May 2, 2019
    Inventors: JONGWOOK JEON, YEOIL YUN, SANGWOO PAE, UIHUI KWON, KEUNHO LEE
  • Patent number: 10216876
    Abstract: A method of designing a semiconductor circuit using a circuit simulation tool executed by a computer includes calculating power consumptions of elements of the semiconductor circuit by use of the circuit simulation tool. A thermal netlist is created about the semiconductor circuit, based on the power consumptions and geometry information of each of the elements. A simulation of the semiconductor circuit is performed with the thermal netlist using the circuit simulation tool to detect a temperature of each of the elements. The thermal netlist includes thermal capacitance information of each of the elements.
    Type: Grant
    Filed: August 18, 2015
    Date of Patent: February 26, 2019
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jongwook Jeon, Yeoil Yun, Sangwoo Pae, Uihui Kwon, Keunho Lee
  • Publication number: 20160048622
    Abstract: A method of designing a semiconductor circuit using a circuit simulation tool executed by a computer includes calculating power consumptions of elements of the semiconductor circuit by use of the circuit simulation tool. A thermal netlist is created about the semiconductor circuit, based on the power consumptions and geometry information of each of the elements. A simulation of the semiconductor circuit is performed with the thermal netlist using the circuit simulation tool to detect a temperature of each of the elements. The thermal netlist includes thermal capacitance information of each of the elements.
    Type: Application
    Filed: August 18, 2015
    Publication date: February 18, 2016
    Inventors: JONGWOOK JEON, YEOIL YUN, SANGWOO PAE, UIHUI KWON, KEUNHO LEE
  • Patent number: 8856719
    Abstract: A circuit simulation method for checking a circuit error is disclosed. The method may include generating a netlist with respect to a designed circuit, simulating an operation of the designed circuit using the generated netlist, and checking an error of the designed circuit using the generated netlist and using a waveform generated when performing the simulation.
    Type: Grant
    Filed: September 14, 2012
    Date of Patent: October 7, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Seonguk Min, Sangho Park, Yeoil Yun
  • Publication number: 20130086539
    Abstract: A circuit simulation method for checking a circuit error is disclosed. The method may include generating a netlist with respect to a designed circuit, simulating an operation of the designed circuit using the generated netlist, and checking an error of the designed circuit using the generated netlist and using a waveform generated when performing the simulation.
    Type: Application
    Filed: September 14, 2012
    Publication date: April 4, 2013
    Inventors: Seonguk MIN, Sangho PARK, Yeoil YUN