Patents by Inventor Yi-Bae Choi

Yi-Bae Choi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080266391
    Abstract: An image measuring apparatus for acquiring an image captured by an optical system and a method thereof are disclosed. The apparatus includes a CCD camera for capturing the object and outputting the captured image, a lamp for generating light to illuminate a capturing area of the object, an illumination controller for controlling the lamp to be turned on, a projection grating formed with gratings, a projection grating driving unit for adjusting a distance between the projection grating and the object, an image capturing device for acquiring the image captured by the CCD camera, a driving signal generator for outputting a driving signal to the illumination controller, the projection grating driving unit, and the image capturing unit simultaneously according to an enable signal generated from the CCD camera, and an image signal processor for estimating a three-dimensional image of the object from data transmitted from the image capturing unit.
    Type: Application
    Filed: October 16, 2006
    Publication date: October 30, 2008
    Inventors: Sang-yoon Lee, Yi-bae Choi, Min-gu Kang, Ssang-gun Lim
  • Patent number: 7092105
    Abstract: A method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object. The method and apparatus for measuring the three-dimensional surface shape of the object, in which a real-time measurement of the three-dimensional surface is performed by projecting a beam of light having color information onto the object and detecting color distribution information according to levels of the object, thereby obtaining level information of the object.
    Type: Grant
    Filed: October 31, 2001
    Date of Patent: August 15, 2006
    Assignee: Intek Plus Co., Ltd.
    Inventors: Ssang-Gun Lim, Gee-Hong Kim, Yi-Bae Choi, Sang-Yoon Lee
  • Patent number: 6873421
    Abstract: An apparatus and method for measuring a three-dimensional shape of an object using a projection moiré device. The method comprises the steps of obtaining a grid pattern image projected on a reference plane of a moving table and applying a buckets algorithm thereto, thereby achieving a reference phase, obtaining a grid pattern image projected on the object set on the moving table and applying a buckets algorithm thereto, thereby achieving an object phase, calculating a difference phase between the object phase and the reference phase, thereby achieving a moiré phase, and unwrapping the moiré phase, thereby achieving a level information of the object. The apparatus and method measure the three-dimensional shape using a projection grid without a reference grid, thereby achieving compactness of equipment, simplicity in usage and manufacturing cost reduction.
    Type: Grant
    Filed: October 31, 2001
    Date of Patent: March 29, 2005
    Assignee: Intek Plus Co., Ltd.
    Inventors: Ssang-Gun Lim, Seung-Woo Kim, Sang-Yoon Lee, Chang-Jin Chung, Yi-Bae Choi, Young-Sik Cho, Kyung-Keun Park
  • Publication number: 20040145753
    Abstract: A method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object. The method and apparatus for measuring the three-dimensional surface shape of the object, in which a real-time measurement of the three-dimensional surface is performed by projecting a beam of light having color information onto the object and detecting color distribution information according to levels of the object, thereby obtaining level information of the object.
    Type: Application
    Filed: April 1, 2004
    Publication date: July 29, 2004
    Inventors: Ssang-Gun Lim, Gee-Hong Kim, Yi-Bae Choi, Sang-Yoon Lee
  • Publication number: 20030043387
    Abstract: An apparatus and method for measuring a three-dimensional shape of an object using a projection moiré device. The method comprises the steps of obtaining a grid pattern image projected on a reference plane of a moving table and applying a buckets algorithm thereto, thereby achieving a reference phase, obtaining a grid pattern image projected on the object set on the moving table and applying a buckets algorithm thereto, thereby achieving an object phase, calculating a difference phase between the object phase and the reference phase, thereby achieving a moiré phase, and unwrapping the moiré phase, thereby achieving a level information of the object. The apparatus and method measure the three-dimensional shape using a projection grid without a reference grid, thereby achieving compactness of equipment, simplicity in usage and manufacturing cost reduction.
    Type: Application
    Filed: July 18, 2002
    Publication date: March 6, 2003
    Inventors: Ssang-Gun Lim, Seung-Woo Kim, Sang-Yoon Lee, Chang-Jin Chung, Yi-Bae Choi, Young-Sik Cho, Kyung-Keun Park