Patents by Inventor Yi-Chen CHU

Yi-Chen CHU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220155888
    Abstract: A stacking structure preparation method includes the steps of providing a substrate; printing a silver nanowire layer on the substrate using a flexographic printing process; and printing a meal layer on the substrate and the silver nanowire layer also using the flexographic printing process. The metal layer includes a metal mesh that covers at least a part of the substrate and the silver nanowire layer, and a plurality of metal traces that is connected to the metal mesh. A stacking structure formed through the above preparation method is also disclosed. The stacking structure includes, from bottom to top, a substrate, a flexo printed silver nanowire layer, and a flexo printed metal layer partially covering the substrate and the silver nanowire layer. The above preparation method and stacking structure can be applied to the manufacturing of a touch sensor.
    Type: Application
    Filed: November 16, 2020
    Publication date: May 19, 2022
    Inventors: Yi-Chen Tsai, Wei-Chia Fang, Chun-Hung Chu, Chung-Chin Hsiao, Meng-Yun Wu, Tsu-Hsuan Lai
  • Patent number: 11175354
    Abstract: A method for scanning artificial structure, wherein a scanning artificial structure apparatus comprises four magnetic-field sensors, the four magnetic-field sensors are non-coplanar configured, the method comprises following steps of: moving the scanning artificial structure apparatus along a scanning path within a to-be-tested area, in the meantime, measuring magnetic field by the four magnetic-field sensors, and recording a position sequence when measuring magnetic field, wherein four magnetic-field measurement sequences are measured by the four magnetic-field sensors; and calculating a magnetic-field variation distribution from the four magnetic-field measurement sequences and the position sequence, wherein the magnetic-field variation distribution is corresponding to at least one artificial structure distribution.
    Type: Grant
    Filed: October 4, 2019
    Date of Patent: November 16, 2021
    Assignee: NATIONAL CENTRAL UNIVERSITY
    Inventors: Chien-Chih Chen, Yi-Chen Chu, Yung-Chieh Chuang
  • Publication number: 20200110139
    Abstract: A method for scanning artificial structure, wherein a scanning artificial structure apparatus comprises four magnetic-field sensors, the four magnetic-field sensors are non-coplanar configured, the method comprises following steps of: moving the scanning artificial structure apparatus along a scanning path within a to-be-tested area, in the meantime, measuring magnetic field by the four magnetic-field sensors, and recording a position sequence when measuring magnetic field, wherein four magnetic-field measurement sequences are measured by the four magnetic-field sensors; and calculating a magnetic-field variation distribution from the four magnetic-field measurement sequences and the position sequence, wherein the magnetic-field variation distribution is corresponding to at least one artificial structure distribution.
    Type: Application
    Filed: October 4, 2019
    Publication date: April 9, 2020
    Inventors: Chien-Chih CHEN, Yi-Chen CHU, Yung-Chieh CHUANG