Patents by Inventor Yi-Chen J. Li

Yi-Chen J. Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9083502
    Abstract: In the method of rate-matching, software is used to calculate at least one rate-matching parameter for data, and dedicated hardware is used to perform at least one of a puncturing and repetition process on data based on the calculated rate-matching parameter. In rate de-matching, software is again used to calculate at least one rate de-matching parameter for received data, and dedicated hardware is used to compensate for puncturing and repetition based on the calculated rate de-matching parameter.
    Type: Grant
    Filed: September 9, 2013
    Date of Patent: July 14, 2015
    Assignee: Alcatel Lucent
    Inventors: Mark P. Barry, Yi-Chen J. Li, Oliver J. Ridler
  • Publication number: 20140013189
    Abstract: In the method of rate-matching, software is used to calculate at least one rate-matching parameter for data, and dedicated hardware is used to perform at least one of a puncturing and repetition process on data based on the calculated rate-matching parameter. In rate de-matching, software is again used to calculate at least one rate de-matching parameter for received data, and dedicated hardware is used to compensate for puncturing and repetition based on the calculated rate de-matching parameter.
    Type: Application
    Filed: September 9, 2013
    Publication date: January 9, 2014
    Applicant: ALCATEL-LUCENT
    Inventors: Mark P. BARRY, Yi-Chen J. LI, Oliver J. RIDLER
  • Patent number: 8533574
    Abstract: In the method of rate-matching, software is used to calculate at least one rate-matching parameter for data, and dedicated hardware is used to perform at least one of a puncturing and repetition process on data based on the calculated rate-matching parameter. In rate de-matching, software is again used to calculate at least one rate de-matching parameter for received data, and dedicated hardware is used to compensate for puncturing and repetition based on the calculated rate de-matching parameter.
    Type: Grant
    Filed: May 20, 2008
    Date of Patent: September 10, 2013
    Assignee: Alcatel Lucent
    Inventors: Mark P. Barry, Yi-Chen J. Li, Oliver J. Ridler
  • Publication number: 20090024680
    Abstract: In the method of rate-matching, software is used to calculate at least one rate-matching parameter for data, and dedicated hardware is used to perform at least one of a puncturing and repetition process on data based on the calculated rate-matching parameter. In rate de-matching, software is again used to calculate at least one rate de-matching parameter for received data, and dedicated hardware is used to compensate for puncturing and repetition based on the calculated rate de-matching parameter.
    Type: Application
    Filed: May 20, 2008
    Publication date: January 22, 2009
    Inventors: Mark P. Barry, Yi-Chen J. Li, Oliver J. Ridler
  • Patent number: 7269783
    Abstract: In the method of rate-matching, software is used to calculate at least one rate-matching parameter for data, and dedicated hardware is used to perform at least one of a puncturing and repetition process on data based on the calculated rate-matching parameter. In rate de-matching, software is again used to calculate at least one rate de-matching parameter for received data, and dedicated hardware is used to compensate for puncturing and repetition based on the calculated rate de-matching parameter.
    Type: Grant
    Filed: April 30, 2003
    Date of Patent: September 11, 2007
    Assignee: Lucent Technologies Inc.
    Inventors: Mark P. Barry, Yi-Chen J. Li, Oliver J. Ridler
  • Publication number: 20040221222
    Abstract: In the method of rate-matching, software is used to calculate at least one rate-matching parameter for data, and dedicated hardware is used to perform at least one of a puncturing and repetition process on data based on the calculated rate-matching parameter. In rate de-matching, software is again used to calculate at least one rate de-matching parameter for received data, and dedicated hardware is used to compensate for puncturing and repetition based on the calculated rate de-matching parameter.
    Type: Application
    Filed: April 30, 2003
    Publication date: November 4, 2004
    Inventors: Mark P. Barry, Yi-Chen J. Li, Oliver J. Ridler