Abstract: A connector connecting a main circuit board and a sub circuit board has two bases, two electrical contacting sets, two resilient bar sets and two mounting brackets. The bases are mounted on the main circuit board. The electrical contacting sets are mounted respectively in the bases and each electrical contacting set has multiple electrical contacting elements. The resilient bar sets are mounted respectively on the bases. The mounting brackets are mounted respectively on the bases and cover the electrical contacting sets and the resilient bar sets. Circuit-board-receiving channels are defined between the bases and the mounting brackets for receiving the sub circuit board such that combination of the main circuit board and the sub circuit board are parallel and flat.

Abstract: A connector connecting a main circuit board and a sub circuit board has two bases, two electrical contacting sets, two resilient bar sets and two mounting brackets. The bases are mounted on the main circuit board. The electrical contacting sets are mounted respectively in the bases and each electrical contacting set has multiple electrical contacting elements. The resilient bar sets are mounted respectively on the bases. The mounting brackets are mounted respectively on the bases and cover the electrical contacting sets and the resilient bar sets. Circuit-board-receiving channels are defined between the bases and the mounting brackets for receiving the sub circuit board such that combination of the main circuit board and the sub circuit board are parallel and flat.

Abstract: A connection base assembly for an IC testing apparatus has a base, a top cap and a conductive assembly. The base has a bottom board and an outer frame provided with multiple grooves. The grooves are defined in the top of and extend to the bottom of the outer frame to form multiple through holes in the bottom of the outer frame. The conductive assembly is mounted between the base and the top cap and has multiple conductive elements, multiple top resilient elements and multiple bottom resilient elements. The conductive elements are mounted respectively in the grooves in the outer frame of the base, and each conductive element has a contacting segment and a connecting segment. The top resilient elements and the bottom resilient elements are respectively mounted on and abut with the tops and the bottoms of the conductive elements.

Abstract: A connection base assembly for an IC testing apparatus has a base, a top cap and a conductive assembly. The base has a bottom board and an outer frame provided with multiple grooves. The grooves are defined in the top of and extend to the bottom of the outer frame to form multiple through holes in the bottom of the outer frame. The conductive assembly is mounted between the base and the top cap and has multiple conductive elements, multiple top resilient elements and multiple bottom resilient elements. The conductive elements are mounted respectively in the grooves in the outer frame of the base, and each conductive element has a contacting segment and a connecting segment. The top resilient elements and the bottom resilient elements are respectively mounted on and abut with the tops and the bottoms of the resilient elements.