Patents by Inventor Yi DIAO

Yi DIAO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12664343
    Abstract: The present application discloses a system and a method for performing a scan chain ECO, the method includes: receiving an original netlist input by a user as first input information, the original netlist contains original scan chain information; receiving a register modification list and a scan DEF file input by the user as second input information, wherein the register modification list is configured to indicate register information to be up-chained and/or register information to be down-chained; modifying the original netlist based on the first input information and the second input information, to complete up-chaining and/or down-chaining of a list of registers in the second input information to obtain a modified scan chain netlist; and receiving the modified scan chain netlist and returning the modified scan chain netlist to the user.
    Type: Grant
    Filed: August 19, 2024
    Date of Patent: June 23, 2026
    Inventors: Yu Ye, Feng Yuan, Xing Wei, Yi Diao, Xiaoqing Yang, Linhan Zheng, Yibo Wang, Xiaoqiang Li
  • Publication number: 20260023907
    Abstract: The present application discloses a system and a method for performing a scan chain ECO, the method includes: receiving an original netlist input by a user as first input information, the original netlist contains original scan chain information; receiving a register modification list and a scan DEF file input by the user as second input information, wherein the register modification list is configured to indicate register information to be up-chained and/or register information to be down-chained; modifying the original netlist based on the first input information and the second input information, to complete up-chaining and/or down-chaining of a list of registers in the second input information to obtain a modified scan chain netlist; and receiving the modified scan chain netlist and returning the modified scan chain netlist to the user.
    Type: Application
    Filed: August 19, 2024
    Publication date: January 22, 2026
    Inventors: Yu YE, Feng YUAN, Xing WEI, Yi DIAO, Xiaoqing YANG, Linhan ZHENG, Yibo WANG, Xiaoqiang LI
  • Publication number: 20250390653
    Abstract: The present invention provides an ECO method based on adaptive learning applied to ECO operations of netlists in different stages in a chip design process. The method comprises acquiring a first netlist subjected to an ECO in a previous stage and a second netlist to be subjected to an ECO in a current stage; determining a position where the ECO of the previous stage involves netlist modification based on a structural similarity between the first netlist and the second netlist, and delineating an input boundary and an output boundary in the first netlist; searching for, in the second netlist, matching signals matching the input boundary and output boundary delineated in the first netlist; delineating a boundary range of the second netlist to be subjected to the ECO based on the matching signals; and performing the ECO in the delineated boundary range. The method improves efficiency and accuracy of the ECO.
    Type: Application
    Filed: July 22, 2024
    Publication date: December 25, 2025
    Inventors: Xiao ZHANG, Yi DIAO, Xing WEI, Feng YUAN, Xiaoqing YANG, Linhan ZHENG, Lin DING
  • Publication number: 20250328713
    Abstract: The present application provides a method for obtaining an engineering change order (ECO) point based on a comparison of design files, for finding difference ECO points between a revision design and an original design in a chip design, the method includes finding an old GTECH file corresponding to the original design and a new GTECH file corresponding to the revision design; comparing the old GTECH file and the new GTECH file to find key point information; and based on the key point information, analyzing a component composition and connection of a circuit, to find the difference ECO points.
    Type: Application
    Filed: May 9, 2024
    Publication date: October 23, 2025
    Inventors: Xiao ZHANG, Xing WEI, Feng YUAN, Yi DIAO, Tak-Kei LAM, Xiaoqing YANG
  • Publication number: 20230153499
    Abstract: A register-transfer level signal mapping construction method and device, wherein the register-transfer level signal mapping construction method comprises: acquiring register-transfer level codes and netlist level codes corresponding to the register-transfer level codes; constructing a circuit according to the register-transfer level codes and the netlist level codes; separating the circuit into a plurality of modules according to syntax of the circuit in a hardware description language; determining a correspondence relationship between the plurality of modules with logic verification methods; acquiring register-transfer level signals of a mapping relationship to be established; and determining netlist level signals corresponding to the register-transfer level codes according to the correspondence relationship between the plurality of modules.
    Type: Application
    Filed: September 29, 2022
    Publication date: May 18, 2023
    Inventors: Xing WEI, Yi DIAO, Tak Kei LAM
  • Patent number: 11409916
    Abstract: A method to transform the function of a programmable circuit (e.g. FPGA) for removing functional bugs or Hardware Trojans is provided.
    Type: Grant
    Filed: August 28, 2020
    Date of Patent: August 9, 2022
    Assignee: EASY-LOGIC TECHNOLOGY LTD.
    Inventors: Yu-Liang Wu, Xing Wei, Tak-Kei Lam, Yi Diao
  • Publication number: 20200394340
    Abstract: A method to transform the function of a programmable circuit (e.g. FPGA) for removing functional bugs or Hardware Trojans is provided.
    Type: Application
    Filed: August 28, 2020
    Publication date: December 17, 2020
    Inventors: Yu-Liang WU, Xing WEI, Tak-Kei LAM, Yi DIAO
  • Publication number: 20170212968
    Abstract: A method enables arithmetic circuit verification with improved runtime complexity by coupling reverse engineering and a SAT solver together. The method provides a netlist f of a first arithmetic circuit and a netlist g of a second arithmetic circuit; and improves the runtime complexity by conducting equivalence checking between the netlist f and the netlist g such that structural difference between the netlist f and the netlist g is minimized by reverse engineering before generating a conjunctive normal form (CNF) encoding that is solved by a satisfiability (SAT) solver such that the arithmetic circuit verification is completed in polynomial time rather than in exponential time.
    Type: Application
    Filed: January 13, 2017
    Publication date: July 27, 2017
    Inventors: Yi DIAO, Xing WEI, Yu-Liang WU