Patents by Inventor Yi-Han Wu
Yi-Han Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250079678Abstract: A substrate integrated waveguide having multiple substrate comprises a first substrate and a second substrate stacked with the first substrate, wherein metal layers are formed on opposite sides of the first substrate and opposite sides of the second substrate, a plurality of metal holes are formed between two metal layers of the same substrate to limit transmission paths of electromagnetic waves transmitted in the substrate, and areas having no metal therein are formed between the first and second substrates so that the electromagnetic waves could be transmitted between the first and second substrates thereby.Type: ApplicationFiled: May 10, 2024Publication date: March 6, 2025Inventors: YI-JU LEE, DING-BING LIN, YI-HAN WU
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Publication number: 20240022068Abstract: An ESD circuit includes a first P-type transistor, a second P-type transistor, a third P-type transistor, a first ESD current path, a second ESD current path, a biasing circuit and a control circuit. The control circuit is connected between the pad and a first node. The first P-type transistor is connected with the pad, the control circuit and a second node. The first ESD current path is connected between the second node and the first node. The second ESD current path is connected between the second node and the first node. The second P-type transistor is connected with the pad, the control circuit and a third node. The biasing circuit is connected between the third node and the first node. The third P-type transistor is connected with the pad, the third node, and a fourth node. The internal circuit is connected between the fourth node and the first node.Type: ApplicationFiled: May 9, 2023Publication date: January 18, 2024Inventors: Yun-Jen Ting, Chih-Wei LAI, Yi-Han WU, Kun-Hsin LIN, Hsin-Kun HSU
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Patent number: 11616360Abstract: An integrated circuit is provided. An ESD inhibition circuit of the integrated circuit is connected with a first pad, a first node and a second node. The ESD inhibition circuit includes a capacitor bank, a resistor, a voltage selector and a switching transistor. The capacitor bank is connected between the first pad and a third node. The resistor is connected between the third node and the first node. The two input terminals of the voltage selector are connected with the third node and a fourth node, respectively. An output terminal of the voltage selector is connected with a fifth node. A first terminal of the switching transistor is connected with the first pad. A second terminal of the switching transistor is connected with the second node. A gate terminal of the switching transistor is connected with the fifth node.Type: GrantFiled: September 22, 2021Date of Patent: March 28, 2023Assignee: EMEMORY TECHNOLOGY INC.Inventors: Chih-Wei Lai, Yun-Jen Ting, Yi-Han Wu, Kun-Hsin Lin, Hsin-Kun Hsu
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Patent number: 11508719Abstract: An ESD circuit is connected between an I/O pad and a first node. The ESD circuit includes a bi-directional buck circuit, a triggering circuit and a discharging circuit. The bi-directional buck circuit includes a forward path and a reverse path. The forward path and the reverse path are connected between the I/O pad and a second node. The triggering circuit is connected between the second node and the first node. The discharging circuit is connected between the second node and the first node, and connected with the triggering circuit. When the I/O pad receives negative ESD zap, the ESD current flows from the first node to the I/O pad through the discharging circuit and the reverse path. When the I/O pad receives positive ESD zap, the ESD current flows from the I/O pad to the first node through the forward path and the discharging circuit.Type: GrantFiled: March 4, 2020Date of Patent: November 22, 2022Assignee: EMEMORY TECHNOLOGY INC.Inventors: Yun-Jen Ting, Chih-Wei Lai, Yi-Han Wu, Kun-Hsin Lin, Hsin-Kun Hsu
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Patent number: 11462903Abstract: An ESD circuit includes a voltage division circuit, a RC control circuit and a voltage selection circuit. The voltage division circuit is connected between a first power pad and a first node, and generates a first voltage. The RC control circuit is connected between the first power pad and a second power pad, and generates a second voltage and a third voltage. The voltage selection circuit receives the first voltage and the second voltage, and outputs a fourth voltage. The first transistor and the second transistor are serially connected between the first power pad and the second power pad. A gate terminal of the first transistor receives the first voltage. A gate terminal of the second transistor receives the third voltage. The third transistor is connected with the first power pad and an internal circuit. A gate terminal of the third transistor receives the fourth voltage.Type: GrantFiled: June 10, 2020Date of Patent: October 4, 2022Assignee: EMEMORY TECHNOLOGY INC.Inventors: Chih-Wei Lai, Yun-Jen Ting, Yi-Han Wu, Kun-Hsin Lin, Hsin-Kun Hsu
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Publication number: 20220158446Abstract: An integrated circuit is provided. An ESD inhibition circuit of the integrated circuit is connected with a first pad, a first node and a second node. The ESD inhibition circuit includes a capacitor bank, a resistor, a voltage selector and a switching transistor. The capacitor bank is connected between the first pad and a third node. The resistor is connected between the third node and the first node. The two input terminals of the voltage selector are connected with the third node and a fourth node, respectively. An output terminal of the voltage selector is connected with a fifth node. A first terminal of the switching transistor is connected with the first pad. A second terminal of the switching transistor is connected with the second node. A gate terminal of the switching transistor is connected with the fifth node.Type: ApplicationFiled: September 22, 2021Publication date: May 19, 2022Inventors: Chih-Wei LAI, Yun-Jen TING, Yi-Han WU, Kun-Hsin LIN, Hsin-Kun HSU
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Patent number: 11088541Abstract: An electrostatic discharge protection circuit is provided. The electrostatic discharge protection circuit includes an electrostatic discharge detection circuit, a discharge circuit, and a switch. The electrostatic discharge detection circuit detects whether an electrostatic discharge event occurs at the bounding pad to generate a first detection circuit. The discharge circuit receives the first detection signal. When the electrostatic discharge event occurs at the bounding pad, the discharge circuit provides a discharge path between the bounding pad and a ground terminal according to the first detection signal. The switch is coupled between the core circuit and the ground terminal and controlled by the first detection signal. When the electrostatic discharge event occurs at the bounding pad, the switch is turned off according to the first detection signal.Type: GrantFiled: September 7, 2018Date of Patent: August 10, 2021Assignee: Vanguard International Semiconductor CorporationInventors: Shao-Chang Huang, Jia-Rong Yeh, Yeh-Ning Jou, Hsien-Feng Liao, Yi-Han Wu, Chih-Cherng Liao, Chieh-Yao Chuang, Wei-Shung Chen, Ching-Wen Chen, Pang-Chuan Chen
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Patent number: 11025054Abstract: An electrostatic discharge protection device is provided. A voltage selection circuit selects a voltage having a higher voltage value among a reference voltage and a voltage on a conductive path and supply the selected voltage to a RC latch self-feedback circuit, so that the RC latch self-feedback circuit ties a voltage of an input end of a RC control circuit when the electrostatic discharge does not occur, and disconnect a switch that conducts an electrostatic current.Type: GrantFiled: March 25, 2019Date of Patent: June 1, 2021Assignee: eMemory Technology Inc.Inventors: Yun-Jen Ting, Chih-Wei Lai, Yi-Han Wu, Kun-Hsin Lin, Hsin-Kun Hsu
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Patent number: 10944258Abstract: An ESD circuit is connected to a power pad and a first node. The ESD circuit includes a RC circuit and a first ESD current path. The RC circuit is connected between the power pad and the first node. The RC circuit is capable of providing a first control voltage and a second control voltage. The first ESD current path is connected between the power pad and the first node. When the power pad receives a positive ESD zap, the first ESD current path is turned on in response to the first control voltage and the second control voltages provided by the RC circuit, so that an ESD current flows from the power pad to the first node through the first ESD current path.Type: GrantFiled: February 21, 2019Date of Patent: March 9, 2021Assignee: EMEMORY TECHNOLOGY INC.Inventors: Chih-Wei Lai, Yun-Jen Ting, Yi-Han Wu, Kun-Hsin Lin, Hsin-Kun Hsu
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Publication number: 20200395752Abstract: An ESD circuit includes a voltage division circuit, a RC control circuit and a voltage selection circuit. The voltage division circuit is connected between a first power pad and a first node, and generates a first voltage. The RC control circuit is connected between the first power pad and a second power pad, and generates a second voltage and a third voltage. The voltage selection circuit receives the first voltage and the second voltage, and outputs a fourth voltage. The first transistor and the second transistor are serially connected between the first power pad and the second power pad. A gate terminal of the first transistor receives the first voltage. A gate terminal of the second transistor receives the third voltage. The third transistor is connected with the first power pad and an internal circuit. A gate terminal of the third transistor receives the fourth voltage.Type: ApplicationFiled: June 10, 2020Publication date: December 17, 2020Inventors: Chih-Wei LAI, Yun-Jen TING, Yi-Han WU, Kun-Hsin LIN, Hsin-Kun HSU
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Publication number: 20200365578Abstract: An ESD circuit is connected between an I/O pad and a first node. The ESD circuit includes a bi-directional buck circuit, a triggering circuit and a discharging circuit. The bi-directional buck circuit includes a forward path and a reverse path. The forward path and the reverse path are connected between the I/O pad and a second node. The triggering circuit is connected between the second node and the first node. The discharging circuit is connected between the second node and the first node, and connected with the triggering circuit. When the I/O pad receives negative ESD zap, the ESD current flows from the first node to the I/O pad through the discharging circuit and the reverse path. When the I/O pad receives positive ESD zap, the ESD current flows from the I/O pad to the first node through the forward path and the discharging circuit.Type: ApplicationFiled: March 4, 2020Publication date: November 19, 2020Inventors: Yun-Jen TING, Chih-Wei LAI, Yi-Han WU, Kun-Hsin LIN, Hsin-Kun HSU
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Publication number: 20200083704Abstract: An electrostatic discharge protection circuit is provided. The electrostatic discharge protection circuit includes an electrostatic discharge detection circuit, a discharge circuit, and a switch. The electrostatic discharge detection circuit detects whether an electrostatic discharge event occurs at the bounding pad to generate a first detection circuit. The discharge circuit receives the first detection signal. When the electrostatic discharge event occurs at the bounding pad, the discharge circuit provides a discharge path between the bounding pad and a ground terminal according to the first detection signal. The switch is coupled between the core circuit and the ground terminal and controlled by the first detection signal. When the electrostatic discharge event occurs at the bounding pad, the switch is turned off according to the first detection signal.Type: ApplicationFiled: September 7, 2018Publication date: March 12, 2020Applicant: Vanguard International Semiconductor CorporationInventors: Shao-Chang HUANG, Jia-Rong YEH, Yeh-Ning JOU, Hsien-Feng LIAO, Yi-Han WU, Chih-Cherng LIAO, Chieh-Yao CHUANG, Wei-Shung CHEN, Ching-Wen CHEN, Pang-Chuan CHEN
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Publication number: 20190326750Abstract: An electrostatic discharge protection device is provided. A voltage selection circuit selects a voltage having a higher voltage value among a reference voltage and a voltage on a conductive path and supply the selected voltage to a RC latch self-feedback circuit, so that the RC latch self-feedback circuit ties a voltage of an input end of a RC control circuit when the electrostatic discharge does not occur, and disconnect a switch that conducts an electrostatic current.Type: ApplicationFiled: March 25, 2019Publication date: October 24, 2019Applicant: eMemory Technology Inc.Inventors: Yun-Jen Ting, Chih-Wei Lai, Yi-Han Wu, Kun-Hsin Lin, Hsin-Kun Hsu
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Publication number: 20190326749Abstract: An ESD circuit is connected to a power pad and a first node. The ESD circuit includes a RC circuit and a first ESD current path. The RC circuit is connected between the power pad and the first node. The RC circuit is capable of providing a first control voltage and a second control voltage. The first ESD current path is connected between the power pad and the first node. When the power pad receives a positive ESD zap, the first ESD current path is turned on in response to the first control voltage and the second control voltages provided by the RC circuit, so that an ESD current flows from the power pad to the first node through the first ESD current path.Type: ApplicationFiled: February 21, 2019Publication date: October 24, 2019Inventors: Chih-Wei LAI, Yun-Jen TING, Yi-Han WU, Kun-Hsin LIN, Hsin-Kun HSU
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Publication number: 20190165572Abstract: An electrostatic discharge (ESD) protection circuit includes an ESD release transistor, at least one stress release transistor, a control circuit, and a voltage division circuit. The ESD release transistor is coupled to a reference voltage terminal of a circuit to be protected. The at least one stress release transistor is coupled between a voltage input terminal of the circuit to be protected and the ESD release transistor. The control circuit turns off the ESD release transistor during a normal operation, and turns on the ESD release transistor during a positive ESD zapping. The voltage division circuit provides at least one divisional voltage for turning on the at least one stress release transistor during the normal operation and the positive ESD zapping.Type: ApplicationFiled: July 12, 2018Publication date: May 30, 2019Inventors: Chih-Wei Lai, Yun-Jen Ting, Yi-Han Wu, Hsin-Kun Hsu
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Publication number: 20120215561Abstract: An online integrating system for anamnesis includes a server and a database. The server hosts a website thereon, and the database stores a plurality of anamnesis data for at least one patient therein. The online integrating system integrates the plurality of anamnesis data stored in the database and generate correlations between each of the plurality of the anamnesis data for each patient. A user can login to the website via networking system by using an external computer, and selects a specific one of the plurality of anamnesis data from the website and the online integrating system will retrieve the related anamnesis data then display the relevant anamnesis data through a presenting page on the website.Type: ApplicationFiled: January 29, 2012Publication date: August 23, 2012Inventors: Jiunn-Rong CHEN, Shiu-Min Liao, Chun-Lin Juan, Yi-Han Wu