Abstract: An illumination system including a light source and a magneto-optical device is provided. The light source is adapted to emit a beam, and at least a part of the beam is polarized. The magneto-optical device is disposed in a transmission path of the beam and includes a plurality of magneto-optical material units. The magneto-optical material units are adapted to be disposed in the transmission path of the beam, and at least a part of the magneto-optical material units has different optical rotation. The magneto-optical device is adapted to move so as to make the magneto-optical material units move with respect to the beam.

Abstract: A reflectance measuring apparatus is provided in the present invention. In addition to measuring the intensity of light directly reflected from a sample, the apparatus is further capable of collecting large-angle reflected light scattered from the sample through a reflecting cover disposed over the sample and measuring the intensity thereof. In one embodiment, the reflecting cover has a parabolic surface for modulating the large-angle reflected light to become parallel light projecting onto a photo-detector. In another embodiment, the reflecting cover has an elliptic surface for modulating the large-angle scattered light to focus on the photo-detector.

Abstract: A reflectance measuring apparatus is provided in the present invention. In addition to measuring the intensity of light directly reflected from a sample, the apparatus is further capable of collecting large-angle reflected light scattered from the sample through a reflecting cover disposed over the sample and measuring the intensity thereof. In one embodiment, the reflecting cover has a parabolic surface for modulating the large-angle reflected light to become parallel light projecting onto a photo-detector. In another embodiment, the reflecting cover has an elliptic surface for modulating the large-angle scattered light to focus on the photo-detector.