Patents by Inventor Yi-Kai LIU

Yi-Kai LIU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12288136
    Abstract: A method for detecting a two-qubit correlated dephasing error includes accessing a signal of a quantum system, where the quantum system includes a plurality of qubits. Every qubit has a nonzero rate of dephasing and some qubits have a nonzero rate of correlated dephasing. The signal further includes information about a matrix that includes diagonal elements and off-diagonal elements. The off-diagonal elements of the matrix are 2s-sparse. The method further includes performing randomized measurements of the off-diagonal elements of the matrix and recovering the matrix based on a direct measurement of the diagonal elements of the matrix.
    Type: Grant
    Filed: May 3, 2024
    Date of Patent: April 29, 2025
    Assignees: University of Maryland, College Park, Government of the United States of America, as Represented by the Secretary of Commerce
    Inventors: Seyed Alireza Seif Tabrizi, Mohammad Hafezi, Yi-Kai Liu
  • Publication number: 20240296368
    Abstract: A method for detecting a two-qubit correlated dephasing error includes accessing a signal of a quantum system, where the quantum system includes a plurality of qubits. Every qubit has a nonzero rate of dephasing and some qubits have a nonzero rate of correlated dephasing. The signal further includes information about a matrix that includes diagonal elements and off-diagonal elements. The off-diagonal elements of the matrix are 2s-sparse. The method further includes performing randomized measurements of the off-diagonal elements of the matrix and recovering the matrix based on a direct measurement of the diagonal elements of the matrix.
    Type: Application
    Filed: May 3, 2024
    Publication date: September 5, 2024
    Inventors: Seyed Alireza SEIF TABRIZI, Mohammad HAFEZI, Yi-Kai LIU
  • Patent number: 12014247
    Abstract: A method for detecting a two-qubit correlated dephasing error includes accessing a signal of a quantum system, where the quantum system includes a plurality of qubits. Every qubit has a nonzero rate of dephasing and some qubits have a nonzero rate of correlated dephasing. The signal further includes information about a matrix that includes diagonal elements and off-diagonal elements. The off-diagonal elements of the matrix are 2s-sparse. The method further includes performing randomized measurements of the off-diagonal elements of the matrix and recovering the matrix based on a direct measurement of the diagonal elements of the matrix.
    Type: Grant
    Filed: May 13, 2022
    Date of Patent: June 18, 2024
    Assignees: University of Maryland, College Park, Government of the United States of America, As Represented by the Secretary of Commerce
    Inventors: Seyed Alireza Seif Tabrizi, Mohammad Hafezi, Yi-Kai Liu
  • Publication number: 20230058207
    Abstract: A method for detecting a two-qubit correlated dephasing error includes accessing a signal of a quantum system, where the quantum system includes a plurality of qubits. Every qubit has a nonzero rate of dephasing and some qubits have a nonzero rate of correlated dephasing. The signal further includes information about a matrix that includes diagonal elements and off-diagonal elements. The off-diagonal elements of the matrix are 2 s-sparse. The method further includes performing randomized measurements of the off-diagonal elements of the matrix and recovering the matrix based on a direct measurement of the diagonal elements of the matrix.
    Type: Application
    Filed: May 13, 2022
    Publication date: February 23, 2023
    Inventors: Seyed Alireza SEIF TABRIZI, Mohammad HAFEZI, Yi-Kai LIU