Patents by Inventor Yi Ku

Yi Ku has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070014015
    Abstract: A method for correlating a structural parameter of a plurality of gratings acquires images from a plurality of gratings, which have different structural parameters. A focus metrics algorithm is then performed to find the off-focus offset of the orders of each grating from the intensity variation of these images, and the variation ratio of the off-focus offset to the order for each grating is calculated later. Consequently, the structural parameters of these gratings can be correlated based on the variation ratio of the off-focus offset to the order. The present method acquires images from an unknown grating at different off-focus offsets, and performs a focus metrics algorithm to find the off-focus offset of the orders of the unknown grating. The variation ratio is calculated and the structural parameter of the unknown grating is determined based on the variation ratio.
    Type: Application
    Filed: June 19, 2006
    Publication date: January 18, 2007
    Inventors: An Liu, Yi Ku