Patents by Inventor Yi Sha Kuo

Yi Sha Kuo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12007221
    Abstract: A heterogeneous integration detecting method and a heterogeneous integration detecting apparatus are provided. The heterogeneous integration detecting method includes the following. Under the condition of maintaining the same relative distance between an interference objective lens and a sample, the relative posture of the interference objective lens and the sample is continuously adjusted according to the change of an image of the sample in the field of view of the interference objective lens until a first optical axis of the interference objective lens is determined to be substantially perpendicular to the surface of the sample according to the image. The interference objective lens is replaced with an imaging objective lens and the geometric profile of at least one via of the sample is detected. A second optical axis of the imaging objective lens after replacement overlaps with the first optical axis of the interference objective lens before replacement.
    Type: Grant
    Filed: December 27, 2021
    Date of Patent: June 11, 2024
    Assignee: Industrial Technology Research Institute
    Inventors: Hsiang-Chun Wei, Chih-Hsiang Liu, Yi-Sha Ku, Chung-Lun Kuo, Chun-Wei Lo, Chieh-Yi Lo
  • Patent number: 7610170
    Abstract: A method for improving the measurement capability of multi-parameter inspection systems includes performing a measuring procedure to acquire a measured signature of a sample, calculating weighting factors representing a correlation between structural parameters of the sample by using a weighting algorithm, transforming the weighting factors into a sampling function by using a transforming rule, updating the measured signature to form an updated measured signature and generating a plurality of updated nominal signatures according to the sampling function, and comparing the updated measured signature and the updated nominal signatures to determine the structural parameters of the sample.
    Type: Grant
    Filed: September 20, 2007
    Date of Patent: October 27, 2009
    Assignee: Industrial Technology Research Institute
    Inventors: Chun Hung Ko, Yi Sha Kuo, Chung Chu Chang