Abstract: A memory device comprises first memory block having first boundary cell and second memory block having second boundary cell. Data of the first and the second boundary cells are outputted simultaneously corresponding to a plurality of column selection signals.

Abstract: A data sensing method for sensing storage data stored in a memory cell includes the steps of: biasing a sensing node and a reference node to a first voltage in response to a first control signal; discharging the sensing node and the reference node via the memory cell and a reference memory cell, respectively; enabling a latch circuit to amplify a voltage difference between the sensing node and the reference node.

Abstract: A data sensing method for sensing data stored in first and second memory cells includes the steps of: setting a first voltage according to a bit-line voltage corresponding to the first memory cell in response to an enabled level of a first clock signal; providing the first voltage as a sensing voltage in response to a disabled level of the first clock signal; comparing the sensing voltage with a reference voltage to generate a first output voltage; setting a second voltage according to a bit-line voltage corresponding to the second memory cell in response to an enabled level of a second clock signal, a phase difference between the first and second clock signals being 180 degrees; providing the second voltage as the sensing voltage in response to a disabled level of the second clock signal; and comparing the sensing voltage with the reference voltage to generate a second output voltage.

Abstract: A memory comprises a memory array, a sense unit, and a biasing and shielding circuit. The biasing and shielding circuit is coupled to the memory array and the sense unit, wherein the biasing and shielding circuit comprises a first transistor, a second transistor, and a capacitor. The first transistor has a gate coupled to a biasing voltage and a first terminal coupled to the sense unit. The second transistor has a gate coupled to the biasing voltage and a first terminal coupled to a first potential. The capacitor is coupled to the sense unit and the first transistor.

Abstract: A multiple-stage charge pump circuit comprises first and second pump capacitors, first and second transfer circuits, first and second driving circuits, and a charge recycle circuit. The first pump capacitor, the first transfer circuit, and the first driving circuit form a first stage circuit, and the second pump capacitor, the second transfer circuit and the second driving circuit form a second stage circuit. The first and the second stage circuits operate 180 degree out of phase with each other. The charge recycle circuit transfers the charge at the second end of the first pump capacitor to the second end of the second pump capacitor in a first time interval, and transferring the charge at the second end of the second pump capacitor to the second end of the first pump capacitor in a second time interval.

Abstract: A circuit including a first data selection circuit and a second data selection circuit for transmitting a data stream is provided. The first data selection circuit having first controllable channels turns on a first operating channel being one of the first controllable channels in an odd-numbered period and turns off the first controllable channels in an even-numbered period adjacent to the odd-numbered period for transmitting a first bit datum of the data stream. The second data selection circuit having second controllable channels turns off the second controllable channels in the odd-numbered period and turns on a second operating channel being one of the second controllable channels in the even-numbered period for transmitting a second bit datum of the data stream.

Abstract: A memory device comprises first memory block having first boundary cell and second memory block having second boundary cell. Data of the first and the second boundary cells are outputted simultaneously corresponding to a plurality of column selection signals.

Abstract: A data sensing method for sensing storage data stored in a memory cell includes the steps of: biasing a sensing node and a reference node to a first voltage in response to a first control signal; discharging the sensing node and the reference node via the memory cell and a reference memory cell, respectively; enabling a latch circuit to amplify a voltage difference between the sensing node and the reference node.

Abstract: A control circuit applied in a memory that comprises a first memory block and a second memory block, and each of the first and the second memory blocks includes a boundary cell. The control circuit comprises an address decoder, a first Y-multiplexer, and a second Y-multiplexer. The address decoder provides a plurality of column selection signals capable of being a boundary value. The first Y-multiplexer corresponds to the first memory block and provides a first boundary data channel for a boundary cell of the first memory block. The second Y-multiplexer corresponds to the second memory block and provides a second boundary data channel for a boundary cell of the second memory block. The first and the second boundary data channels are enabled simultaneously in response to the boundary value for outputting boundary data stored in the boundary cell of the first memory block and that of the second memory block.

Abstract: A multiple-stage charge pump circuit includes first and second pump capacitors, a charge recycle circuit, and first and second transfer circuits. The charge recycle circuit includes first and second driving circuits and a switch circuit turning off to make a node floating and to couple first terminals of the first and second pump capacitors to the node in a first time period. The switch circuit and first and second driving circuits provide a specific voltage to the node and control voltages at the first terminals of the first and second pump capacitors in second and third time periods, respectively. The first and second transfer circuits provide a high voltage to a second terminal of the first pump capacitor in the second time period, and provide the voltage of the second terminal of the first pump capacitor to a second terminal of the second pump capacitor in the third time period.

Abstract: A multiple-stage charge pump circuit comprises first and second pump capacitors, first and second transfer circuits, first and second driving circuits, and a charge recycle circuit. The first pump capacitor, the first transfer circuit, and the first driving circuit form a first stage circuit, and the second pump capacitor, the second transfer circuit and the second driving circuit form a second stage circuit. The first and the second stage circuits operate 180 degree out of phase with each other. The charge recycle circuit transfers the charge at the second end of the first pump capacitor to the second end of the second pump capacitor in a first time interval, and transferring the charge at the second end of the second pump capacitor to the second end of the first pump capacitor in a second time interval.

Abstract: A controlling method of a voltage regulator is provided. The voltage regulator at least includes a differential circuit and a pump high-voltage circuit which has a bias path, an output transistor and an output terminal. The controlling method includes steps of: providing at least a pre-charge path to the pump high-voltage circuit, closing the bias path and charging the output terminal with the pre-charge path when the output terminal is transient, detecting an output level of the output terminal, and closing the pre-charge path and open the bias path to bias the output transistor when the output level reaches a predetermined value.

Abstract: A memory device comprises a memory cell and a sense amplifier which has a sensing interval. An output circuit is coupled to the sense amplifier and responsive to a clock signal to accept the signal from the sense amplifier. A first source of timing signals generates a first timing signal in response to an enable signal which is asynchronous relative to the clock signal. A second source of timing signals generates a second timing signal based on the clock signal. A switch selects one of the first and second timing signals at the timing signals for use to define pre-charge and sensing intervals for the sense amplifier. The first source of timing signals is selected during an interval of time corresponding to a clock latency, so that the timing signals define a sensing interval where transitions in the clock signal are outside of the sensing interval.

Abstract: A data sensing method for sensing data stored in first and second memory cells includes the steps of: setting a first voltage according to a bit-line voltage corresponding to the first memory cell in response to an enabled level of a first clock signal; providing the first voltage as a sensing voltage in response to a disabled level of the first clock signal; comparing the sensing voltage with a reference voltage to generate a first output voltage; setting a second voltage according to a bit-line voltage corresponding to the second memory cell in response to an enabled level of a second clock signal, a phase difference between the first and second clock signals being 180 degrees; providing the second voltage as the sensing voltage in response to a disabled level of the second clock signal; and comparing the sensing voltage with the reference voltage to generate a second output voltage.

Abstract: A data sensing method for sensing data stored in first and second memory cells includes the steps of: setting a first voltage according to a bit-line voltage corresponding to the first memory cell in response to an enabled level of a first clock signal; providing the first voltage as a sensing voltage in response to a disabled level of the first clock signal; comparing the sensing voltage with a reference voltage to generate a first output voltage; setting a second voltage according to a bit-line voltage corresponding to the second memory cell in response to an enabled level of a second clock signal, a phase difference between the first and second clock signals being 180 degrees; providing the second voltage as the sensing voltage in response to a disabled level of the second clock signal; and comparing the sensing voltage with the reference voltage to generate a second output voltage.

Abstract: A data sensing method for sensing storage data stored in a memory cell includes the steps of: biasing a sensing node and a reference node to a first voltage in response to a first control signal; discharging the sensing node and the reference node via the memory cell and a reference memory cell, respectively; enabling a latch circuit to amplify a voltage difference between the sensing node and the reference node.

Abstract: A data sensing method for sensing data stored in first and second memory cells includes the steps of: setting a first voltage according to a bit-line voltage corresponding to the first memory cell in response to an enabled level of a first clock signal; providing the first voltage as a sensing voltage in response to a disabled level of the first clock signal; comparing the sensing voltage with a reference voltage to generate a first output voltage; setting a second voltage according to a bit-line voltage corresponding to the second memory cell in response to an enabled level of a second clock signal, a phase difference between the first and second clock signals being 180 degrees; providing the second voltage as the sensing voltage in response to a disabled level of the second clock signal; and comparing the sensing voltage with the reference voltage to generate a second output voltage.

Abstract: A control circuit applied in a memory that comprises a first memory block and a second memory block, and each of the first and the second memory blocks includes a boundary cell. The control circuit comprises an address decoder, a first Y-multiplexer, and a second Y-multiplexer. The address decoder provides a plurality of column selection signals capable of being a boundary value. The first Y-multiplexer corresponds to the first memory block and provides a first boundary data channel for a boundary cell of the first memory block. The second Y-multiplexer corresponds to the second memory block and provides a second boundary data channel for a boundary cell of the second memory block. The first and the second boundary data channels are enabled simultaneously in response to the boundary value for outputting boundary data stored in the boundary cell of the first memory block and that of the second memory block.

Abstract: Embodiments of addressing the programming disturb effect are shown. A medium voltage having a magnitude between the programming voltage and ground is applied to a metal bit line among the cells that are subject to the program disturb effect.

Abstract: A memory comprises a memory array, a sense unit, and a biasing and shielding circuit. The biasing and shielding circuit is coupled to the memory array and the sense unit, wherein the biasing and shielding circuit comprises a first transistor, a second transistor, and a capacitor. The first transistor has a gate coupled to a biasing voltage and a first terminal coupled to the sense unit. The second transistor has a gate coupled to the biasing voltage and a first terminal coupled to a first potential. The capacitor is coupled to the sense unit and the first transistor.