Abstract: Embodiments of addressing the programming disturb effect are shown. A medium voltage having a magnitude between the programming voltage and ground is applied to a metal bit line among the cells that are subject to the program disturb effect.

Abstract: A charge pump circuit comprises a first pump stage, including a first sub-pump coupled to a first pre-charge MOSFET transistor, wherein the first sub-pump is used to pump down a gate of the first pre-charge MOSFET transistor to thereby increase the pre-charge efficiency of the first pre-charge MOSFET transistor. The higher efficiency the pre-charge MOSFET is, the lower the gate level of a pass transistor is. Thus, the charge sharing efficiency becomes better, and the body effect will be eliminated. The following pump stage is the same as the first pump stage. In addition, this pre-charging is implemented by PMOSFET only; therefore, only a single well is needed and then a small layout area can be achieved. Consequently, a high efficiency negative pump can be obtained.

Abstract: Embodiments of addressing the programming disturb effect are shown. A medium voltage having a magnitude between the programming voltage and ground is applied to a metal bit line among the cells that are subject to the program disturb effect.

Abstract: In an embodiment, a charge pump circuit comprises a first pump stage, including a first sub-pump coupled to a first pre-charge MOSFET transistor, wherein the first sub-pump is used to pump down a gate of the first pre-charge MOSFET transistor to thereby increase the pre-charge efficiency of the first pre-charge MOSFET transistor. The higher efficiency the re-charge MOSFET is, the lower the gate level of pass transistor is. Thus, the charge sharing efficiency becomes better, and the body effect will be eliminated. The following pump stage is the same as the first pump stage. In addition, this embodiment is implemented by PMOSFET only; therefore, only single well is needed and then a small layout area can be achieved. Consequently, a high efficiency negative pump can be obtained.

Abstract: A charge pump for a flash memory. The charge pump includes: a current-guiding circuit having a first, a second, and a third output; and a first, a second, and a third charge unit. The current-guiding circuit has two diode-connected transistors respectively connected between the first and the second outputs, and the second and the third outputs. Each of the charge units, for storing charge, has two ends. The first, the second, and the third charge units respectively have one end connected to the first, the second, and the third outputs, and the other end of the third charge unit is connected to the first output.