Patents by Inventor Yibin Xia

Yibin Xia has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9355211
    Abstract: Systems, methods, and other embodiments associated with providing a unified tool for performing design constraints generation and verification for circuit designs are described. In one embodiment, the unified tool reads design data and design intent information for a circuit design. The unified tool generates physical flow elements and verification flow elements of the circuit design, together and in dependence on each other, based, at least in part, on the design data and the design intent information.
    Type: Grant
    Filed: October 10, 2014
    Date of Patent: May 31, 2016
    Assignee: ORACLE INTERNATIONAL CORPORATION
    Inventors: Yibin Xia, Dinesh Rajasavari Amirtharaj, Ali Vahidsafa, Alan Smith, Senthilkumar Diraviam, Mohd Jamil Mohd
  • Publication number: 20160103943
    Abstract: Systems, methods, and other embodiments associated with providing a unified tool for performing design constraints generation and verification for circuit designs are described. In one embodiment, the unified tool reads design data and design intent information for a circuit design. The unified tool generates physical flow elements and verification flow elements of the circuit design, together and in dependence on each other, based, at least in part, on the design data and the design intent information.
    Type: Application
    Filed: October 10, 2014
    Publication date: April 14, 2016
    Inventors: Yibin XIA, Dinesh Rajasavari AMIRTHARAJ, Ali VAHIDSAFA, Alan SMITH, Senthilkumar DIRAVIAM, Mohd Jamil MOHD
  • Patent number: 8751983
    Abstract: A design partitioning method and apparatus includes an RTL reader module configured to receive, process, and parse hardware descriptive language of a circuit design; an expression graph module configured to trace identified signal dependencies to determine dependent elements along selected paths within the circuit design; a hierarchy flattener module configured to remove existing circuit design hierarchies based on the identified signal dependencies and determined dependent elements; a partition specification reader module that defines selected paths within the circuit design into a partition specification; a design partitioner module configured to separate the flattened circuit design hierarchy according to the partition specification; a re-partitioner module configured to create a second hierarchical circuit design structure based on the separated, flattened circuit design hierarchy that is behaviorally identical to the circuit design; and an RTL design write-out module configured to output the second hiera
    Type: Grant
    Filed: March 7, 2013
    Date of Patent: June 10, 2014
    Assignee: Oracle International Corporation
    Inventors: Thomas Mitchell, Krishnan Sundaresan, Quan Tran, Yibin Xia
  • Patent number: 7861200
    Abstract: A method of characterizing a device under test (DUT) includes determining a goal function associated with a setup and hold time for the DUT. A minimum value for the goal function is determined by iteratively adjusting setup and hold times for input data to the DUT, and determining whether the DUT performs according to specifications. The minimum goal function value will reflect minimum setup and hold time values based on weights associated with the goal function. This allows the minimum setup and hold times for the DUT to be characterized with a small number of binary searches, improving the speed of the characterization process.
    Type: Grant
    Filed: March 24, 2008
    Date of Patent: December 28, 2010
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Yifeng Yang, Yun Zhang, Yibin Xia, David J. Chapman
  • Publication number: 20090241080
    Abstract: A method of characterizing a device under test (DUT) includes determining a goal function associated with a setup and hold time for the DUT. A minimum value for the goal function is determined by iteratively adjusting setup and hold times for input data to the DUT, and determining whether the DUT performs according to specifications. The minimum goal function value will reflect minimum setup and hold time values based on weights associated with the goal function. This allows the minimum setup and hold times for the DUT to be characterized with a small number of binary searches, improving the speed of the characterization process.
    Type: Application
    Filed: March 24, 2008
    Publication date: September 24, 2009
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Yifeng Yang, Yun Zhang, Yibin Xia, David J. Chapman