Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Abstract: An optical element including a unitary, non-circularly-symmetrical, piece of optically-transmissive material, which has at least first and second surfaces for concentrating light from a light source onto a linear target region, such that at least one of the first and second surfaces is curved, and such that a first portion of the light is concentrated onto the linear target region by reflection from the first surface, while a second portion of the light is concentrated onto the linear target region by refraction at the second surface.

Abstract: Apparatus for transmitting information at a data rate, such as for recording an image on a photosensitive surface, including a pulsed light source that produces pulsed light having a pulsed repetition rate and a modulator that asynchronously modulates the pulsed light at the date rate, wherein the data rate is higher than pulse repetition rate.

Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Abstract: An optical element including a unitary, non-circularly-symmetrical, piece of optically-transmissive material, which has at least first and second surfaces for concentrating light from a light source onto a linear target region, such that at least one of the first and second surfaces is curved, and such that a first portion of the light is concentrated onto the linear target region by reflection from the first surface, while a second portion of the light is concentrated onto the linear target region by refraction at the second surface.

Abstract: Illuminating apparatus for illuminating a workpiece during visual inspection thereof, including a first light source emitting light over a continuous angle of illumination toward the workpiece, blocking element arranged to block light over a portion of the continuous angle such that two portions of the illumination, separated by a blocked angle, illuminate the workpiece from the source, and a second light source arranged to illuminate the workpiece over the blocked angle.

Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Abstract: Apparatus far transmitting information at a data rate, such as for recording an image on a photosensitive surface, including a pulsed light source that produces pulsed light having a pulsed repetition rate and a modulator that asynchronously modulates the pulsed light at the data rate, wherein the data rate is higher than pulse repetition rate.

Abstract: Illuminating apparatus for illuminating a workpiece during visual inspection thereof, including a first light source emitting light over a continuous angle of illumination toward the workpiece, blocking element arranged to block light over a portion of the continuous angle such that two portions of the illumination, separated by a blocked angle, illuminate the workpiece from the source, and a second light source arranged to illuminate the workpiece over the blocked angle.

Abstract: Apparatus for transmitting information at a data rate, such as for recording an image on a photosensitive surface, including a pulsed light source that produces pulsed light having a pulsed repetition rate and a modulator that asynchronously modulates the pulsed light at the date rate, wherein the data rate is higher than pulse repetition rate.

Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Abstract: A scanner system acquires images of articles using a sensor acquiring an image of a portion of an article and defining a field of view, a displacer operative to provide mutual relative displacement between the article and the sensor at a generally uniform rate of displacement, and a field of view freezer operative to provide a generally motionless image during image acquisition. The scanner system is particularly useful in the field of automated optical inspection.

Abstract: Illuminator apparatus for illuminating a workpiece during visual testing thereof, the illuminator comprising: a source of illumination that illuminates a portion of the workpiece with on-axis illumination centered at a first angular direction and having a first intensity and with off-axis illumination having a second intensity; and an optical viewing system, that views said portion of the workpiece and accepts light reflected from the workpiece over a range of angular directions, centered at a second angular direction, said range of angular directions defining said on-axis illumination, wherein said first intensity and second intensity art separately adjustable and wherein the first angular direction is different from the second angular direction.

Abstract: An inspection illuminates a generally specular surface of an electrical circuit with flashes of light. The flashed light comes form at least two spectrally different sources, and is temporally spaced. A camera forms an optical image of the circuit for each flash of light. Optical images are combined to provide a combined image. An analysis of the combined image can detect defects, and production related decisions may be based on this analysis.

Abstract: Apparatus for scanning a beam across a surface including a scanner scanning a pulsed laser beam across a surface and a position indicator receiving an input from the pulsed laser beam at a plurality of locations across the surface, and outputting position indications indicating a position of said pulsed laser beam along said surface. The position indications are used to modulate data in apparatus for exposing patterns on surfaces, for example electrical circuit patterns on photosensitized surfaces. One use of such apparatus is the manufacture of electrical circuits.

Abstract: An inspection illuminates a generally specular surface of an electrical circuit with flashes of light. The flashed light comes form at least two spectrally different sources, and is temporally spaced. A camera forms an optical image of the circuit for each flash of light. Optical images are combined to provide a combined image. An analysis of the combined image can detect defects, and production related decisions may be based on this analysis.