Patents by Inventor Yijiang Lu

Yijiang Lu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9297907
    Abstract: System and method for monitoring receipt and estimating flux value, in real time, of incident radiation, using two or more nanostructures (NSs) and associated terminals to provide closed electrical paths and to measure one or more electrical property change values ?EPV, associated with irradiated NSs, during a sequence of irradiation time intervals. Effects of irradiation, without healing and with healing, of the NSs, are separately modeled for first order and second order healing. Change values ?EPV are related to flux, to cumulative dose received by NSs, and to radiation and healing effectivity parameters and/or ?, associated with the NS material and to the flux. Flux and/or dose are estimated in real time, based on EPV change values, using measured ?EPV values. Threshold dose for specified changes of biological origin (usually undesired) can be estimated. Effects of time-dependent radiation flux are analyzed in pre-healing and healing regimes.
    Type: Grant
    Filed: March 11, 2014
    Date of Patent: March 29, 2016
    Assignee: The United States of America as Represented by the Administrator of the National Aeronautics & Space Administration (NASA)
    Inventors: Jing Li, Richard T. Wilkins, James J. Hanratty, Yijiang Lu
  • Patent number: 7623972
    Abstract: Methods and systems for determining if one or more target molecules are present in a gas, by exposing a functionalized carbon nanostructure (CNS) to the gas and measuring an electrical parameter value EPV(n) associated with each of N CNS sub-arrays. In a first embodiment, a most-probable concentration value C(opt) is estimated, and an error value, depending upon differences between the measured values EPV(n) and corresponding values EPV(n;C(opt)) is computed. If the error value is less than a first error threshold value, the system interprets this as indicating that the target molecule is present in a concentration C?C(opt). A second embodiment uses extensive statistical and vector space analysis to estimate target molecule concentration.
    Type: Grant
    Filed: October 31, 2006
    Date of Patent: November 24, 2009
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Jing Li, Meyya Meyyappan, Yijiang Lu