Abstract: The present invention provides a contactor assembly (100,200,300) for testing of semiconductor devices (DUT). The contactor assembly (100,200,300) includes a plurality of probes (20,22,24), a contactor holder (150,350) and a cover (180,280) shaped and dimensioned to fit on the contactor holder (150,350). The contactor holder (150,350) is a stack of laminates. A top laminate (156,256) of the contactor holder (150,350) has apertures (158,258). A contact probe (22) is seen through one aperture (158,258). On a rear face of the cover (180,280), there is at least one conductive pad (186) in register with an aperture (158,258). Each aperture (158,258) is operable to house a surface-mount electric component (160), such as a resistor, capacitor or inductor, and a conductive compressive element (162). In another embodiment, a front side of a cover (280) has a connector (285) in electrical communication with a conductive pad (186).

Abstract: A device for providing electrical contact comprises a first reciprocating conductive body having a first abutting body at one end, a second reciprocating conductive body having a second abutting body at one end and a resilient means biasing the first reciprocating conductive body and the second reciprocating conductive body in opposing directions axially away from each other. The first abutting body is slidably abutting the second abutting body, thereby providing electrical conductivity between the first reciprocating conductive body and the second reciprocating body. In another embodiment, the first reciprocating conductive body, the second reciprocating body and at least one securing means are disposed within one of plurality of through holes of an elastic non-conductive housing body. The elastic non-conductive housing body biases the first reciprocating conductive body and the second reciprocating conductive body in opposing directions axially from each other.

Abstract: A device for providing electrical contact comprises a first reciprocating conductive body having a first abutting body at one end, a second reciprocating conductive body having a second abutting body at one end and a resilient means biasing the first reciprocating conductive body and the second reciprocating conductive body in opposing directions axially away from each other. The first abutting body is slidably abutting the second abutting body, thereby providing electrical conductivity between the first reciprocating conductive body and the second reciprocating body. In another embodiment, the first reciprocating conductive body, the second reciprocating body and at least one securing means are disposed within one of plurality of through holes of an elastic non-conductive housing body. The elastic non-conductive housing body biases the first reciprocating conductive body and the second reciprocating conductive body in opposing directions axially from each other.

Abstract: The present invention provides a contactor assembly (100,200,300) for testing of semiconductor devices (DUT). The contactor assembly (100,200,300) includes a plurality of probes (20,22,24), a contactor holder (150,350) and a cover (180,280) shaped and dimensioned to fit on the contactor holder (150,350). The contactor holder (150,350) is a stack of laminates. A top laminate (156,256) of the contactor holder (150,350) has apertures (158,258). A contact probe (22) is seen through one aperture (158,258). On a rear face of the cover (180,280), there is at least one conductive pad (186) in register with an aperture (158,258). Each aperture (158,258) is operable to house a surface-mount electric component (160), such as a resistor, capacitor or inductor, and a conductive compressive element (162). In another embodiment, a front side of a cover (280) has a connector (285) in electrical communication with a conductive pad (186).

Abstract: A socket contact with Kelvin contact for the testing of IC devices comprising a plurality of conducting strip sets embedded across a non-conducting base. Each strip set includes two pairs of electrodes. Two pairs of electrodes are designed such that each pair functions to contact one of the two corresponding leads of an IC device. Within the pair, one electrode forms a connection between the IC lead and the tester, and the other electrode provides a Kelvin contact.

Abstract: An electrical contact for IC device (31) testing which provides good electrical contact without involving wiping action. This electrical contact comprises a first and second arm (40, 44) formed into a generally C-shaped segment and a hook segment (46) which protrudes from the C-shaped segment in a direction generally opposite the second arm (44). The first and the second is connected via a resilient neck (42). This contact can be adapted for use with an apparatus for electrically interconnecting a lead (33) of a test device to a terminal spaced at a distance from the lead.

Abstract: An apparatus for facilitating zero-insertion of a burn-in test probe having a probe head. The zero-insertion apparatus includes a triggering mechanism, a pressing mechanism, and a sensor which are disposed within the burn-in test probe to facilitate a damage-free insertion of the probe head into an IC socket having a zero-insertion rim. As the probe head is inserted into the socket, the pressing mechanism, being in its locked position, compresses the zero-insertion rim which retracts the socket contacts to allow the probe head to enter the socket unencumbered. When the head is completely in the socket, the sensor becomes actuated. The actuated sensor allows a user to then unlock the pressing mechanism which causes the zero-insertion rim to spring back to its original, undepressed position. The socket contacts revert back to their undepressed position and solid contact is made between the probe head and the contacts.