Patents by Inventor Yin M. Wang

Yin M. Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System for detecting defects in articles using a scanning width which is less than width of portion of the article scanned
    Patent number: 5559341
    Abstract: An apparatus for sensing the deflection of a beam directed at an article detects slight deflection of the beam when the beam is directed at a large angle of incidence. The large angle of incidence increases the apparatus sensitivity to detect certain characteristics within an article which cause slight deflection, and allows the use of smaller optical elements. The apparatus can detect defects such as coating voids, streaks, and caliper variations when transparent materials are coated onto transparent substrates.
    Type: Grant
    Filed: January 31, 1995
    Date of Patent: September 24, 1996
    Assignee: Minnesota Mining and Manufacturing Company
    Inventors: Jerzy S. Krasinski, Yin M. Wang