Abstract: A machine-learning-based prognostic and health management system comprises a machine sensor, an instruction receiver, a processor, and an annunciator. The machine sensor is configured to dynamically receive data of a machine under test associated with operations of the machine under test. The instruction receiver is configured to dynamically receive a model-assigning command. The processor is configured to dynamically apply a damage alert machine-learning model corresponding to the model-assigning command for processing the data of the machine under test to predict an anomaly probability of an anomaly occurrence of the machine under test. The processor also dynamically generates, according to the anomaly probability, a damage possibility warning on the machine under test, and determine whether to keep the machine under test running or not.

Abstract: An active device array substrate is provided. The active device array substrate includes multiple pixel structures, a drive circuit, multiple signal lines and a control line. The pixel structures are disposed in a display area. The drive circuit is disposed outside the display area. The signal lines are electrically connected to the drive circuit and the pixel structures corresponded to the signal lines. The control lines are intersected with the signal lines. A method adapted for inspecting defects on the active device array substrate is also provided. First, a tested signal line is selected from the signal lines, and the control line and the tested-signal line are conducted. Second, a test signal is input from the control line to the tested-signal line to determine a location of a defect. Finally, the control line and the tested signal line are isolated.

Abstract: An active device array substrate is provided. The active device array substrate includes multiple pixel structures, a drive circuit, multiple signal lines and a control line. The pixel structures are disposed in a display area. The drive circuit is disposed outside the display area. The signal lines are electrically connected to the drive circuit and the pixel structures corresponded to the signal lines. The control lines are intersected with the signal lines. A method adapted for inspecting defects on the active device array substrate is also provided. First, a tested signal line is selected from the signal lines, and the control line and the tested-signal line are conducted. Second, a test signal is input from the control line to the tested-signal line to determine a location of a defect. Finally, the control line and the tested signal line are isolated.

Abstract: An active device array substrate is provided. The active device array substrate includes multiple pixel structures, a drive circuit, multiple signal lines and a control line. The pixel structures are disposed in a display area. The drive circuit is disposed outside the display area. The signal lines are electrically connected to the drive circuit and the pixel structures corresponded to the signal lines. The control lines are intersected with the signal lines. A method adapted for inspecting defects on the active device array substrate is also provided. First, a tested signal line is selected from the signal lines, and the control line and the tested-signal line are conducted. Second, a test signal is input from the control line to the tested-signal line to determine a location of a defect. Finally, the control line and the tested signal line are isolated.

Abstract: An active device array substrate is provided. The active device array substrate includes multiple pixel structures, a drive circuit, multiple signal lines and a control line. The pixel structures are disposed in a display area. The drive circuit is disposed outside the display area. The signal lines are electrically connected to the drive circuit and the pixel structures corresponded to the signal lines. The control lines are intersected with the signal lines. A method adapted for inspecting defects on the active device array substrate is also provided. First, a tested signal line is selected from the signal lines, and the control line and the tested-signal line are conducted. Second, a test signal is input from the control line to the tested-signal line to determine a location of a defect. Finally, the control line and the tested signal line are isolated.

Abstract: An LCD panel apparatus comprises a pixel array, a first common electrode terminal, a second common electrode terminal, a plurality of first current directional devices and a plurality of second current directional devices. The pixel array comprises a plurality of common lines. Each first current directional device is connected in series between a first side of each common line and the first common electrode terminal. Each second current directional device is connected in series between a second side of each common line and the first common electrode terminal. The second common electrode terminal is connected between the first side of each common line and each first current directional device. The current flows through each common line in a single direction so as to detect any defects in the common line.

Abstract: An LCD panel apparatus comprises a pixel array, a first common electrode terminal, a second common electrode terminal, a plurality of first current directional devices and a plurality of second current directional devices. The pixel array comprises a plurality of common lines. Each first current directional device is connected in series between a first side of each common line and the first common electrode terminal. Each second current directional device is connected in series between a second side of each common line and the first common electrode terminal. The second common electrode terminal is connected between the first side of each common line and each first current directional device. The current flows through each common line in a single direction so as to detect any defects in the common line.