Abstract: An associative memory circuit including a first memristor, a second memristor, a fixed value resistor R, and an operational comparator. One terminal of the first memristor is a first input terminal of the associative memory circuit, and the other terminal of the first memristor is connected to a first input terminal of the operational comparator. One terminal of the second memristor is a second input terminal of the associative memory circuit, and the other terminal of the second memristor is connected to the first input terminal of the operational comparator. One terminal of the fixed value resistor is connected to the first input terminal of the operational comparator, and the other terminal of the fixed value resistor is connected to the ground. A second input terminal of the operational comparator is connected to a reference voltage.

Abstract: A non-volatile logic device, including: a substrate, a magnetic head, a base electrode, an insulating layer, a phase-change magnetic film, and a top electrode. The substrate includes a silicon substrate and an active layer attached to the silicon substrate. The base electrode includes an N-type silicon layer, a P-type silicon layer and a heating layer, the N-type silicon layer and the P-type silicon layer constitute a PN diode structure, and the size of the heating layer is smaller than that of the P-type silicon layer. The phase-change magnetic film is deposited on the insulating layer and is electrically contacted with the heating layer. The top electrode and the base electrode are connected to an external electrical pulse signal, and an external magnetic field parallel to a two dimensional plane of the phase-change magnetic film is applied to the non-volatile logic device.

Abstract: A joint short-time and long-time storage device, including a first electrode layer, a functional material layer connected to the first electrode layer, and a second electrode layer connected to the functional material layer. The first electrode layer is made of inert conductive metal, the second electrode layer is made of active conductive metal, and the functional material layer is made of chalcogenide.

Abstract: A nonvolatile logic gate circuit based on phase change memories, including a first phase change memory, a second phase change memory, a first controllable switch element and a first resistor, wherein a first end of the first phase change memory serves as a first input end of an AND gate circuit, a first end of the second phase change memory serves as a second input end of the AND gate circuit, a first end of the first controllable switch element is connected to a second end of the first phase change memory, a second end of the first controllable switch element is grounded; one end of the first resistor is connected to the first end of the second phase change memory, the other end of the first resistor is grounded; and the first end of the second phase change memory serves as an output end of the AND gate circuit.

Abstract: A non-volatile logic device, including: a substrate, a magnetic head, a base electrode, an insulating layer, a phase-change magnetic film, and a top electrode. The substrate includes a silicon substrate and an active layer attached to the silicon substrate. The base electrode includes an N-type silicon layer, a P-type silicon layer and a heating layer, the N-type silicon layer and the P-type silicon layer constitute a PN diode structure, and the size of the heating layer is smaller than that of the P-type silicon layer. The phase-change magnetic film is deposited on the insulating layer and is electrically contacted with the heating layer. The top electrode and the base electrode are connected to an external electrical pulse signal, and an external magnetic field parallel to a two dimensional plane of the phase-change magnetic film is applied to the non-volatile logic device.

Abstract: A joint short-time and long-time storage device, including a first electrode layer, a functional material layer connected to the first electrode layer, and a second electrode layer connected to the functional material layer. The first electrode layer is made of inert conductive metal, the second electrode layer is made of active conductive metal, and the functional material layer is made of chalcogenide.

Abstract: A nonvolatile logic gate circuit based on phase change memories, including a first phase change memory, a second phase change memory, a first controllable switch element and a first resistor, wherein a first end of the first phase change memory serves as a first input end of an AND gate circuit, a first end of the second phase change memory serves as a second input end of the AND gate circuit, a first end of the first controllable switch element is connected to a second end of the first phase change memory, a second end of the first controllable switch element is grounded; one end of the first resistor is connected to the first end of the second phase change memory, the other end of the first resistor is grounded; and the first end of the second phase change memory serves as an output end of the AND gate circuit.

Abstract: An associative memory circuit including a first memristor, a second memristor, a fixed value resistor R, and an operational comparator. One terminal of the first memristor is a first input terminal of the associative memory circuit, and the other terminal of the first memristor is connected to a first input terminal of the operational comparator. One terminal of the second memristor is a second input terminal of the associative memory circuit, and the other terminal of the second memristor is connected to the first input terminal of the operational comparator. One terminal of the fixed value resistor is connected to the first input terminal of the operational comparator, and the other terminal of the fixed value resistor is connected to the ground. A second input terminal of the operational comparator is connected to a reference voltage.