Abstract: A method and device for testing the thermal conductivity of a nanoscale material 1. The method comprises the following steps: preparing or placing a nanoscale material 1 to be tested on a substrate and plating an electrode 2 at both ends thereof; determining a resistance temperature coefficient R? of the nanoscale material 1 to be tested and a resistance R0 at the ambient temperature T0; generating a small signal voltage V3? with a frequency being 3? on the nanoscale material 1 to be tested; and measuring the small signal voltage V3?, and in conjunction with each piece of test data, calculating, according to a formula, the thermal conductivity ? of the nanoscale material to be tested 1 at the ambient temperature T0.

Abstract: The disclosure provides a method for measuring the transverse thermal conductivity of a thin film. The method comprises the steps of measuring the longitudinal thermal conductivity of a thin film to be measured by using a 3? method and by taking a second metal strip deposited on the surface of the thin film to be measured as a heating source at first; measuring the temperature rise of the thin film to be measured in the longitudinal direction by using the 3? method, and deducing the thermal power of the thin film to be measured in the longitudinal direction; and finally, calculating the transverse thermal conductivity of the thin film to be measured. By adopting a ‘substrate/thin film to be measured/metal strip’ sample structure, the process difficulty of preparing a suspension structure sample can be effectively avoided.

Abstract: The disclosure provides a method for measuring the transverse thermal conductivity of a thin film. The method comprises the steps of measuring the longitudinal thermal conductivity of a thin film to be measured by using a 3? method and by taking a second metal strip deposited on the surface of the thin film to be measured as a heating source at first; measuring the temperature rise of the thin film to be measured in the longitudinal direction by using the 3? method, and deducing the thermal power of the thin film to be measured in the longitudinal direction; and finally, calculating the transverse thermal conductivity of the thin film to be measured. By adopting a ‘substrate/thin film to be measured/metal strip’ sample structure, the process difficulty of preparing a suspension structure sample can be effectively avoided.

Abstract: A method and device for testing the thermal conductivity of a nanoscale material 1. The method comprises the following steps: preparing or placing a nanoscale material 1 to be tested on a substrate and plating an electrode 2 at both ends thereof; determining a resistance temperature coefficient R? of the nanoscale material 1 to be tested and a resistance R0 at the ambient temperature T0; generating a small signal voltage V3? with a frequency being 3? on the nanoscale material 1 to be tested; and measuring the small signal voltage V3?, and in conjunction with each piece of test data, calculating, according to a formula, the thermal conductivity ? of the nanoscale material to be tested 1 at the ambient temperature T0.