Patents by Inventor Yinlin DENG

Yinlin DENG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240160646
    Abstract: A method may include obtaining a dataset that may include at least a first column and a second column, with a first title and a first value and a second title and a second value, respectively. The operations may further include determining a total similarity value between the first and second columns based on a metadata similarity value, a semantic similarity value, and/or a unit of measurement similarity value; adding the first and second columns to a cluster if the total similarity value is less than a threshold value; generating a new column to add to the cluster using a feature engineering function, where the new column may include a new title and a new value, the new value determined using the feature engineering function by acting on the first value and/or the second value. Further, the operations may include adding the new column to the dataset.
    Type: Application
    Filed: November 16, 2022
    Publication date: May 16, 2024
    Applicant: Fujitsu Limited
    Inventors: Lei LIU, Yinlin DENG, Mehdi BAHRAMI, Mukul R. PRASAD
  • Publication number: 20240160999
    Abstract: A method may include obtaining a dataset that may include one or more columns, wherein each of the one or more columns may include a title and at least one value. The operations may further include extracting, for each of the one or more columns, the title and a sample value from the at least one value. The operations may additionally include, synthesizing a question based on the title and the sample value for each of the one or more columns. Further, the operations may include sending the question to a language model to obtain an answer. The operations may additionally include generating from the answer to the question, a predicted unit of measurement for the at least one value in each of the one or more columns. Systems and devices for performing the method are also disclosed.
    Type: Application
    Filed: November 15, 2022
    Publication date: May 16, 2024
    Applicant: Fujitsu Limited
    Inventors: Mehdi BAHRAMI, Yinlin DENG, Mukul R. PRASAD