Patents by Inventor Yiqiang Ni

Yiqiang Ni has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method And Apparatus For Fault Isolation, Computer Device, Medium And Program Product
    Publication number: 20240037727
    Abstract: A method for fault isolation includes: acquiring a thermal imaging picture of a surface of a to-be-tested chip, the thermal imaging picture being obtained by scanning the to-be-tested chip to which a test signal is applied through an infrared thermal imaging device, and analyzing the thermal imaging picture to obtain a phase angle of each point on the surface of the to-be-tested chip; acquiring a three-dimensional image of the surface of the to-be-tested chip, the three-dimensional image being obtained by scanning the to-be-tested chip to which the test signal is applied through an image scanning device, and analyzing the three-dimensional image to obtain a three-dimensional coordinate of each point on the surface of the to-be-tested chip; calculating a three-dimensional coordinate of the fault in the to-be-tested chip according to the phase angle and the three-dimensional coordinate of each point on the surface of the to-be-tested chip.
    Type: Application
    Filed: December 5, 2022
    Publication date: February 1, 2024
    Applicant: China Electronics Reliability And Environmental Testing Institute
    Inventors: Chao Pang, Yiqiang Ni, Liang He, Shizheng Yang, Yinle Li