Abstract: Disclosed are a method for controlling a flat panel detector, and an upper computer, a flat panel detector and a medical system, so as to solve the problem that a device containing a flat panel detector in the related art has the risk of irradiating a patient with mistakenly used rays in the using process. The method includes: generating and sending a control command to a flat panel detector in response to an operation instruction of a user (101); receiving actual response identification information sent by the flat panel detector when the flat panel detector determines that the control command is a first type of control command (102); and verifying the consistency of the actual response identification information and pre-stored expected response identification information, and generating prompt information (103).

Abstract: Processes for synthesizing substrate-free twinned 2D tellurium crystals with co-existing opposite chirality, and twinned 2D tellurium crystals produced thereby. The substrate-free twinned 2D tellurium crystals include a first wing and a second wing, the first wing and second wing have opposite chirality, and the first wing and the second wing are joined together at an angle to form a V-shaped crystal.

Abstract: Processes for synthesizing substrate-free twinned 2D tellurium crystals with co-existing opposite chirality, and twinned 2D tellurium crystals produced thereby. The substrate-free twinned 2D tellurium crystals include a first wing and a second wing, the first wing and second wing have opposite chirality, and the first wing and the second wing are joined together at an angle to form a V-shaped crystal.

Abstract: The present disclosure generally relates to compositions comprising substrate-free 2D tellurene crystals, and the method of making and using the substrate-free 2D tellurene crystals. The 2D tellurene crystals of the present disclosure are characterized by an X-ray diffraction pattern (CuK? radiation, ?=1.54056 A) comprising a peak at 23.79 (2?±0.1°) and optionally one or more peaks selected from the group consisting of 41.26, 47.79, 50.41, and 64.43 (2?±0.1°).

Abstract: The present disclosure generally relates to compositions comprising substrate-free crystalline 2D bismuthene, and the method of making and using the substrate-free crystalline 2D bismuthene.

Abstract: The present disclosure generally relates to compositions comprising substrate-free 2D crystalline nanomaterials of binary compounds of formula (M)x(Te)y, and the method of making and using the substrate-free crystalline 2D crystalline nanomaterial.

Abstract: The present disclosure generally relates to compositions comprising substrate-free crystalline 2D bismuthene, and the method of making and using the substrate-free crystalline 2D bismuthene.

Abstract: Disclosed are a method for controlling a flat panel detector, and an upper computer, a flat panel detector and a medical system, so as to solve the problem that a device containing a flat panel detector in the related art has the risk of irradiating a patient with mistakenly used rays in the using process. The method includes: generating and sending a control command to a flat panel detector in response to an operation instruction of a user (101); receiving actual response identification information sent by the flat panel detector when the flat panel detector determines that the control command is a first type of control command (102); and verifying the consistency of the actual response identification information and pre-stored expected response identification information, and generating prompt information (103).

Abstract: The present disclosure generally relates to compositions comprising substrate-free 2D tellurene crystals, and the method of making and using the substrate-free 2D tellurene crystals. The 2D tellurene crystals of the present disclosure are characterized by an X-ray diffraction pattern (CuK? radiation, ?=1.54056 A) comprising a peak at 23.79 (2?±0.1°) and optionally one or more peaks selected from the group consisting of 41.26, 47.79, 50.41, and 64.43 (2?±0.1°).

Abstract: Processes for synthesizing substrate-free twinned 2D tellurium crystals with co-existing opposite chirality, and twinned 2D tellurium crystals produced thereby. The substrate-free twinned 2D tellurium crystals include a first wing and a second wing, the first wing and second wing have opposite chirality, and the first wing and the second wing are joined together at an angle to form a V-shaped crystal.

Abstract: The present disclosure generally relates to compositions comprising substrate-free 2D tellurene crystals, and the method of making and using the substrate-free 2D tellurene crystals. The 2D tellurene crystals of the present disclosure are characterized by an X-ray diffraction pattern (CuK? radiation, ?=1.54056 A) comprising a peak at 23.79 (2?±0.1°) and optionally one or more peaks selected from the group consisting of 41.26, 47.79, 50.41, and 64.43 (2?±0.1°).

Abstract: The present disclosure generally relates to compositions comprising substrate-free 2D tellurene crystals, and the method of making and using the substrate-free 2D tellurene crystals. The 2D tellurene crystals of the present disclosure are characterized by an X-ray diffraction pattern (CuK? radiation, ?=1.54056 A) comprising a peak at 23.79 (2?±0.1°) and optionally one or more peaks selected from the group consisting of 41.26, 47.79, 50.41, and 64.43 (2?±0.1°).

Abstract: The present disclosure generally relates to compositions comprising substrate-free 2D crystalline nanomaterials of binary compounds of formula (M)x(Te)y, and the method of making and using the substrate-free crystalline 2D crystalline nanomaterial.

Abstract: The present disclosure generally relates to compositions comprising substrate-free crystalline 2D bismuthene, and the method of making and using the substrate-free crystalline 2D bismuthene.

Abstract: The present disclosure generally relates to compositions comprising substrate-free 2D tellurene crystals, and the method of making and using the substrate-free 2D tellurene crystals. The 2D tellurene crystals of the present disclosure are characterized by an X-ray diffraction pattern (CuK? radiation, ?=1.54056 A) comprising a peak at 23.79 (2?±0.1°) and optionally one or more peaks selected from the group consisting of 41.26, 47.79, 50.41, and 64.43 (2?±0.1°).

Abstract: The disclosure provides a Computed Tomography (CT) image acquisition device and a CT scan imaging system. The CT scan imaging system includes: an image acquisition device, which specifically includes a first image acquisition device (1A, 1B) and a second image acquisition device (2A, 2B) that are perpendicular to each other, wherein the first image acquisition device (1A, 1B) or the second image acquisition device (2A, 2B) includes: an X-ray tube (1A, 2A), which is used for emitting X-rays, and a detector (1B, 2B), which is arranged opposite to the X-ray tube in the vertical direction and is used for receiving the X-rays and obtaining projection data according to the X-rays; and an image processing device (4), which is used for acquiring a three-dimensional image through reconstruction of the projection data, wherein the three-dimensional image includes one or more tomographic images.

Abstract: The disclosure provides a Computed Tomography (CT) image acquisition device and a CT scan imaging system. The CT scan imaging system includes: an image acquisition device, which specifically includes a first image acquisition device (1A, 1B) and a second image acquisition device (2A, 2B) that are perpendicular to each other, wherein the first image acquisition device (1A, 1B) or the second image acquisition device (2A, 2B) includes: an X-ray tube (1A, 2A), which is used for emitting X-rays, and a detector (1B, 2B), which is arranged opposite to the X-ray tube in the vertical direction and is used for receiving the X-rays and obtaining projection data according to the X-rays; and an image processing device (4), which is used for acquiring a three-dimensional image through reconstruction of the projection data, wherein the three-dimensional image includes one or more tomographic images.