Abstract: An IC module including: an insulating substrate; antenna connection terminals provided on one surface of the insulating substrate; and a laminated body in which an IC chip and a mica capacitor are laminated, wherein the laminated body and the antenna connection terminals are mounted on the same surface side of the insulating substrate, and the IC chip and the mica capacitor are electrically connected with the antenna connection terminals via a wire, the IC module capable of producing an IC mounted body that has highly accurate resonance frequency and is highly reliable in non-contact communications, and also capable of producing an IC mounted body having a small area since the mounting thereof on a small area is possible, and which can be produced by a general purpose apparatus for producing IC modules, as well as an IC inlet and an IC mounted body using the IC module are provided.

Abstract: An aluminum oxide based sintered body and a method for manufacturing the same are disclosed. The aluminum oxide based sintered body is composed of silicon compounds in particulate form of from about 5 to about 40 mole %, calculated as a carbide, which is present along grain boundaries as a silicon-containing glass, at least one metal or metal compound of from 0.5 to about 20 mole %, calculated as metals, selected from Ti, Nb, Ta, Cr and Mo, and the remainder of Al.sub.2 O.sub.3, and the molar ratio of the metals with respect to the silicon compounds, calculated as a carbide, is about 4 or less.

Abstract: An aluminum oxide based sintered body and a method for manufacturing the same are disclosed. The aluminum oxide based sintered body is composed of silicon compounds of from about 5 to about 40 mole %, calculated as a carbide, at least one metal or metal compound of from 0.5 to about 25 mole %, calculated as metals, selected from Ti, Nb, Ta, Cr and Mo, and the remainder of Al.sub.2 O.sub.3, and a molar ratio of the metals with respect to the silicon compounds, calculated as a carbide is about 4 or less.

Abstract: In order to efficiently obtain data for calculating retardation values at a plurality of wavelengths, a sample having birefringence is placed between a polarizer and an analyzer, which are maintained in a parallel nicol relation to each other and rotated about an optical axis of measuring light. White measuring light is applied through the polarizer so that the light being passed through the sample and transmitted through the analyzer is received by a polychromator. A one-dimensional optical sensor is arranged on an outgoing imaging surface of the polychromator, to simultaneously detect transmitted light intensity values of a plurality of wavelengths. Since transmitted light intensity values of a plurality of wavelengths are obtained every polarization rotation angle of the polarizer and the analyzer, it is possible to obtain dispersion of retardation values with respect to wavelengths and the like by processing the data.

Abstract: A silicon nitride sintered product for use in cutting tools and the like which has silicon nitride as a predominant phase, and comprises 0.1 to 1% by weight of Al as calculated on the basis of Al.sub.2 O.sub.3, the total amount of sintering aid constituents other than Al being 6% by weight or less on the oxide basis, the content of the grain boundary glassy phase being 8% by volume or less. The silicon nitride sintered product preferably has a relative density of 99% or more.

Abstract: An aluminum oxide-based sintered object having excellent abrasion resistance includes .alpha.-aluminum oxide, a silicon compound and a tungsten compound, wherein the silicon compound and the tungsten compound are present in amounts based on starting amounts of SiC and W metal of from 5 to 40 mole % and from 0.5 to 25 mole %, respectively, based on the sintered object overall, with a W/SiC molar ratio of 4 or less, and in which particles of at least one of tungsten carbide and tungsten silicide having an average particle diameter of 0.5 .mu.m or less are dispersed as a crystalline phase.

Abstract: Silicon nitride base sintered body consists of: 1 to 20 wt % (as oxides) of at least one of rare earth elements; 0.5 to 8 wt % of V (as V.sub.2 O.sub.5); 0.5 to 8 wt % (as oxides) of at least one of Nb, Ta, Cr, Mo and W; sum of the Va and VIa group elements according to the Periodic Table of the International Version (as oxides) being 1 to 10 wt %; and balance silicon nitride. It has high strength of 690-880 MPa (70-90 kgf/mm.sup.2) and high oxidation resistance both at 1350.degree. C. It is produced by 2 stage gas-pressure sintering in pressurized N.sub.2 atmosphere, primarily at 1700.degree.-1900.degree. C. at 1 MPa (10 atm) or less and secondarily at 1600.degree.-1900 C. at 10 MPa (100 atm) or above.

Abstract: A sintered body of silicon nitride having high strength, toughness and oxidation resistance consists essentially of, by weight percentages, 0.5 to 7.0% of a Mg component calculated as MgO, 0.5 to 7.0% of a Zr component calculated as ZrO.sub.2, 0.5 to 10.0% of a Ce component calculated as CeO.sub.2, and the balance being Si.sub.3 N.sub.4. The sum of Mg, Zr and Ce components calculated as oxides is 3 to 20% by weight. This product is suitable for engine parts or cutting tools.

Abstract: A sintered silicon nitride product comprises from 72 to 98% by weight of silicon nitride, from 1 to 8% by weight of vanadium pentoxide, and from 1 to 20% by weight of one or more oxides of rare earth elements. The vanadium pentoxide and the oxide of rare earth elements accelerate the densification of the sintered product, and provide high strength at high temperature as well as excellent oxidation resistance to the sintered product.

Abstract: An automatic focus adjusting system for a surface inspection microscope including a sheet setting stage, a microscope for observing a sheet surface set on the stage, a television camera for picking up an image observed by the microscope and a focus adjusting system. The system irradiates the back or front of an optically transparent sheet set on the stage creating an image on the front surface of the sheet. The image's contrast varies depending on the inner physical structure of the sheet. The television camera's video signals are processed by a focus evaluation circuit. The image contrast of the sheet's front surface image generates a contrast frequency allowing the focus evaluation circuit to calculate the focus evaluation degree. The system automatically adjusts the stage and compares the present focus evaluation degree with the prior focus evaluation degree.

Abstract: A silicon nitride sintered product comprises, in % by weight, 1 to 10% Mg, calculated as MgO, 1 to 10% Zr, calculated as ZrO.sub.2, 0.1 to 2.0% of at least one of Al, calculated as Al.sub.2 O.sub.3, Li, calculated as Li.sub.2 O, and Na, calculated as Na.sub.2 O, and the remainder being Si.sub.3 N.sub.4 and unavoidable impurities.

Abstract: A surface inspection apparatus having a microscope and a television camera is disclosed. The inspection apparatus samples a signal portion from a horizontal scanning portions of the video signal produced by the television camera, compares the instantaneous voltages of a filtered signal of said sampled portion removing low-frequency components with a reference voltage, counts the number of pulses constituted from the high level portions of said filtered signal higher than said reference voltage sequentially moves the focal point of the microscope step by step relative to the object surface, compares the present pulse count with the previous pulse count thereof at just prior step of the moving of the focal point, and decides the focal point in the position corresponding to the maximum number of pulses to control the moving of the focal point for correctly setting the focal point in said corresponding position.