Patents by Inventor Yo Yamamoto

Yo Yamamoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240309229
    Abstract: A coating composition includes an inorganic compound particle, a binder component, a solvent, and an antibacterial/antiviral agent. The content of the binder component is 1 part by mass or more and 25 parts by mass or less based on 100 parts by mass of the inorganic compound particle.
    Type: Application
    Filed: May 28, 2024
    Publication date: September 19, 2024
    Inventors: SHUHEI YAMAMOTO, TOMONARI NAKAYAMA, YO WATANABE
  • Patent number: 12073597
    Abstract: A degree of freedom in image production regarding tracking of a subject is improved. Designation of a placement position in a display area of a tracking target is received on a first screen in which a predetermined image is displayed in the display area. For example, a user is allowed to designate a position (a position within the display area) in which a tracking target subject is disposed in a state in which image content can be recognized on a display screen.
    Type: Grant
    Filed: December 26, 2019
    Date of Patent: August 27, 2024
    Assignee: SONY GROUP CORPORATION
    Inventors: Takayoshi Ozone, Ryuichi Tadano, Hiroshi Yamamoto, Naoko Hirashima, Yo Nonoyama
  • Patent number: 11835438
    Abstract: An automatic sample preparation apparatus that automatically prepares a sample piece from a sample and includes a focused ion beam irradiation optical system, an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam, a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample, a detector configured to detect secondary charged particles emitted from an irradiation object, and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the sample piece transfer device, wherein the image data includes a reference mark.
    Type: Grant
    Filed: July 13, 2021
    Date of Patent: December 5, 2023
    Assignee: Hitachi High-Tech Science Corporation
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
  • Publication number: 20230291057
    Abstract: A battery case includes L-shaped plates. One L-shaped plate is composed of a bottom part and a wall part. The bottom part is located between base ends of support pillar members and a bottom plate and joined to the bottom plate. The wall part is placed against outer lateral surfaces of the support pillar members and mechanically joined to these outer lateral surfaces. Another L-shaped plate is composed of a bottom part and a wall part. The bottom part is located between base ends of support pillar members and the bottom plate and joined to the bottom plate. The wall part is placed against outer lateral surfaces of the support pillar members and mechanically joined to these outer lateral surfaces.
    Type: Application
    Filed: December 30, 2022
    Publication date: September 14, 2023
    Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Toshio UCHIYAMA, Kazuo EBATA, Takashi MURATA, Yo YAMAMOTO, Masahiro MISU
  • Publication number: 20210341362
    Abstract: An automatic sample preparation apparatus that automatically prepares a sample piece from a sample and includes a focused ion beam irradiation optical system, an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam, a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample, a detector configured to detect secondary charged particles emitted from an irradiation object, and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the sample piece transfer device, wherein the image data includes a reference mark.
    Type: Application
    Filed: July 13, 2021
    Publication date: November 4, 2021
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
  • Patent number: 11073453
    Abstract: An automatic sample preparation apparatus that automatically prepares a sample piece from a sample includes: a focused ion beam irradiation optical system configured to irradiate a focused ion beam; an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam; a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample; a detector configured to detect secondary charged particles emitted from an irradiation object by irradiating the irradiation object with the focused ion beam and/or the electron beam; and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the transfer device.
    Type: Grant
    Filed: July 22, 2020
    Date of Patent: July 27, 2021
    Assignee: Hitachi High-Tech Science Corporation
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
  • Publication number: 20200355589
    Abstract: An automatic sample preparation apparatus that automatically prepares a sample piece from a sample includes: a focused ion beam irradiation optical system configured to irradiate a focused ion beam; an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam; a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample; a detector configured to detect secondary charged particles emitted from an irradiation object by irradiating the irradiation object with the focused ion beam and/or the electron beam; and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the transfer device.
    Type: Application
    Filed: July 22, 2020
    Publication date: November 12, 2020
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
  • Publication number: 20200278281
    Abstract: A charged particle beam device (10a) includes a computer (21) which controls multiple charged particle beam irradiation optical systems, the needle (18), and a gas supply portion (17) to transfer a sample piece Q to a predetermined position of the sample piece holder P, based on at least images of a sample piece holder (P), a needle (18), and the sample piece (Q) previously acquired by multiple charged particle beams.
    Type: Application
    Filed: May 19, 2020
    Publication date: September 3, 2020
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
  • Patent number: 10677697
    Abstract: According to one embodiment, an automatic sample preparation apparatus includes: a charged particle beam irradiation optical system configured to perform irradiation with a charged particle beam; a sample stage configured to move with the sample placed thereon; a sample piece transfer device for holding and transferring the sample piece separated and extracted from the sample; a sample piece holder-fixing bed configured to hold a sample piece holder to which the sample piece is transferred; a gas supply portion configured to irradiate gas forming a deposition film with the charged particle beam; and a computer configured to control the charged particle beam irradiation optical system, the sample piece transfer device, and the gas supply portion to transfer and stop the sample piece held by the sample piece transfer device with a gap between the sample piece holder and the sample piece, and connect the sample piece to the sample piece holder.
    Type: Grant
    Filed: September 24, 2018
    Date of Patent: June 9, 2020
    Assignee: Hitachi High-Tech Science Corporation
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
  • Patent number: 10622187
    Abstract: Disclosed are a charged particle beam apparatus wherein the charged particle beam apparatus can efficiently performs finish processing of a sample and acquisition of a high-precision SEM image of a processing surface of the sample in a short time, and a sample processing observation method using the same. The charged particle beam apparatus includes: a gallium ion beam column radiating a gallium ion beam toward a sample to form a cross-section of the sample; an electron beam column having a semi-in-lens type objective lens and radiating an electron beam toward the sample; a gas ion beam column radiating a gas ion beam toward the sample to perform finish processing of the cross-section of the sample, wherein the gas ion beam has a beam diameter larger than a maximum diameter of the cross-section of the sample.
    Type: Grant
    Filed: February 19, 2019
    Date of Patent: April 14, 2020
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Yo Yamamoto, Shota Torikawa, Hidekazu Suzuki, Hiroyuki Suzuki, Mamoru Okabe, Tatsuya Asahata
  • Publication number: 20190259574
    Abstract: Disclosed are a charged particle beam apparatus wherein the charged particle beam apparatus can efficiently performs finish processing of a sample and acquisition of a high-precision SEM image of a processing surface of the sample in a short time, and a sample processing observation method using the same. The charged particle beam apparatus includes: a gallium ion beam column radiating a gallium ion beam toward a sample to form a cross-section of the sample; an electron beam column having a semi-in-lens type objective lens and radiating an electron beam toward the sample; a gas ion beam column radiating a gas ion beam toward the sample to perform finish processing of the cross-section of the sample, wherein the gas ion beam has a beam diameter larger than a maximum diameter of the cross-section of the sample.
    Type: Application
    Filed: February 19, 2019
    Publication date: August 22, 2019
    Inventors: Yo YAMAMOTO, Shota TORIKAWA, Hidekazu SUZUKI, Hiroyuki SUZUKI, Mamoru OKABE, Tatsuya ASAHATA
  • Patent number: 10236159
    Abstract: A charged particle beam includes: a computer that controls a needle actuating mechanism so as to approach a needle to a sample piece using a template formed from an absorbed current image obtained by irradiating the needle with a charged particle beam and a tip coordinate of the needle acquired from a secondary electron image obtained by irradiating the needle with the charged particle beam.
    Type: Grant
    Filed: March 2, 2017
    Date of Patent: March 19, 2019
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Satoshi Tomimatsu, Makoto Sato, Atsushi Uemoto, Tatsuya Asahata, Yo Yamamoto
  • Publication number: 20190025167
    Abstract: According to one embodiment, an automatic sample preparation apparatus includes: a charged particle beam irradiation optical system configured to perform irradiation with a charged particle beam; a sample stage configured to move with the sample placed thereon; a sample piece transfer device for holding and transferring the sample piece separated and extracted from the sample; a sample piece holder-fixing bed configured to hold a sample piece holder to which the sample piece is transferred; a gas supply portion configured to irradiate gas forming a deposition film with the charged particle beam; and a computer configured to control the charged particle beam irradiation optical system, the sample piece transfer device, and the gas supply portion to transfer and stop the sample piece held by the sample piece transfer device with a gap between the sample piece holder and the sample piece, and connect the sample piece to the sample piece holder.
    Type: Application
    Filed: September 24, 2018
    Publication date: January 24, 2019
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
  • Patent number: 10088401
    Abstract: A charged particle beam device (10a) includes a computer (21) which controls multiple charged particle beam irradiation optical systems, the needle (18), and a gas supply portion (17) to transfer a sample piece Q to a predetermined position of the sample piece holder P, based on at least images of a sample piece holder (P), a needle (18), and the sample piece (Q) previously acquired by multiple charged particle beams.
    Type: Grant
    Filed: June 29, 2015
    Date of Patent: October 2, 2018
    Assignee: Hitachi High-Tech Science Corporation
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
  • Publication number: 20170178858
    Abstract: A charged particle beam includes: a computer that controls a needle actuating mechanism so as to approach a needle to a sample piece using a template formed from an absorbed current image obtained by irradiating the needle with a charged particle beam and a tip coordinate of the needle acquired from a secondary electron image obtained by irradiating the needle with the charged particle beam.
    Type: Application
    Filed: March 2, 2017
    Publication date: June 22, 2017
    Inventors: Satoshi TOMIMATSU, Makoto SATO, Atsushi UEMOTO, Tatsuya ASAHATA, Yo YAMAMOTO
  • Publication number: 20170122852
    Abstract: A charged particle beam device (10a) includes a computer (21) which controls multiple charged particle beam irradiation optical systems, the needle (18), and a gas supply portion (17) to transfer a sample piece Q to a predetermined position of the sample piece holder P, based on at least images of a sample piece holder (P), a needle (18), and the sample piece (Q) previously acquired by multiple charged particle beams.
    Type: Application
    Filed: June 29, 2015
    Publication date: May 4, 2017
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
  • Patent number: 9620333
    Abstract: A charged particle beam apparatus automatically prepares a sample piece from a sample and includes a charged particle beam irradiation optical system that irradiates a charged particle beam to a sample placed on a movable sample stage. A sample piece transferring unit holds and transfers a sample piece separated and extracted from the sample, and a holder support holds a sample piece holder to which the sample piece is transferred. A computer controls a position of an object based on a template prepared from an image of the object acquired by irradition with the charged particle beam and position information acquired from the image of the object. The sample piece transferring unit includes a needle that transfers the sample piece separated and extrated from the sample, and a needle actuting mechanism that actuates the needle.
    Type: Grant
    Filed: August 24, 2015
    Date of Patent: April 11, 2017
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Satoshi Tomimatsu, Makoto Sato, Atsushi Uemoto, Tatsuya Asahata, Yo Yamamoto
  • Publication number: 20160064187
    Abstract: Problem To automatically repeat an operation of extracting and transferring a sample piece, which is formed by processing a sample using an ion beam, to a sample piece holder. Solution A charged particle beam includes: a computer that controls a needle actuating mechanism so as to approach a needle to a sample piece using a template formed from an absorbed current image obtained by irradiating the needle with a charged particle beam and a tip coordinate of the needle acquired from a secondary electron image obtained by irradiating the needle with the charged particle beam.
    Type: Application
    Filed: August 24, 2015
    Publication date: March 3, 2016
    Inventors: Satoshi TOMIMATSU, Makoto SATO, Atsushi UEMOTO, Tatsuya ASAHATA, Yo YAMAMOTO
  • Patent number: 9275827
    Abstract: A charged particle beam apparatus includes: a charged particle beam column; a detector configured to detect secondary charged particles; an image processor; a display device; a needle arranged in an irradiation area of charged particle beam; a needle actuator; a user interface; and a controller configured to control the needle actuator to actuate the needle in accordance with a target position that is set by the user interface. The controller controls the needle actuator to move the needle to track a change of the target position that is set by the user interface.
    Type: Grant
    Filed: February 9, 2015
    Date of Patent: March 1, 2016
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Hidekazu Suzuki, Yo Yamamoto
  • Patent number: 9218937
    Abstract: A charged particle beam apparatus includes: a charged particle beam column configured to irradiate an irradiation target with a charged particle beam; a detector configured to detect secondary charged particles emitted from the irradiation target by the irradiation of the charged particle beam; a needle arranged in an irradiation area of the charged particle beam; a needle actuator configured to actuate the needle; and a controller configured to control the needle actuator to actuate the needle along a movement route that is configured by a preset target position and preset way points. The controller controls the needle actuator to set an actuating direction of the needle for each of the way points.
    Type: Grant
    Filed: February 9, 2015
    Date of Patent: December 22, 2015
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Atsushi Uemoto, Tatsuya Asahata, Hidekazu Suzuki, Yo Yamamoto