Patents by Inventor Yo Yamamoto
Yo Yamamoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20240309229Abstract: A coating composition includes an inorganic compound particle, a binder component, a solvent, and an antibacterial/antiviral agent. The content of the binder component is 1 part by mass or more and 25 parts by mass or less based on 100 parts by mass of the inorganic compound particle.Type: ApplicationFiled: May 28, 2024Publication date: September 19, 2024Inventors: SHUHEI YAMAMOTO, TOMONARI NAKAYAMA, YO WATANABE
-
Patent number: 12073597Abstract: A degree of freedom in image production regarding tracking of a subject is improved. Designation of a placement position in a display area of a tracking target is received on a first screen in which a predetermined image is displayed in the display area. For example, a user is allowed to designate a position (a position within the display area) in which a tracking target subject is disposed in a state in which image content can be recognized on a display screen.Type: GrantFiled: December 26, 2019Date of Patent: August 27, 2024Assignee: SONY GROUP CORPORATIONInventors: Takayoshi Ozone, Ryuichi Tadano, Hiroshi Yamamoto, Naoko Hirashima, Yo Nonoyama
-
Patent number: 11835438Abstract: An automatic sample preparation apparatus that automatically prepares a sample piece from a sample and includes a focused ion beam irradiation optical system, an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam, a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample, a detector configured to detect secondary charged particles emitted from an irradiation object, and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the sample piece transfer device, wherein the image data includes a reference mark.Type: GrantFiled: July 13, 2021Date of Patent: December 5, 2023Assignee: Hitachi High-Tech Science CorporationInventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
-
Publication number: 20230291057Abstract: A battery case includes L-shaped plates. One L-shaped plate is composed of a bottom part and a wall part. The bottom part is located between base ends of support pillar members and a bottom plate and joined to the bottom plate. The wall part is placed against outer lateral surfaces of the support pillar members and mechanically joined to these outer lateral surfaces. Another L-shaped plate is composed of a bottom part and a wall part. The bottom part is located between base ends of support pillar members and the bottom plate and joined to the bottom plate. The wall part is placed against outer lateral surfaces of the support pillar members and mechanically joined to these outer lateral surfaces.Type: ApplicationFiled: December 30, 2022Publication date: September 14, 2023Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Toshio UCHIYAMA, Kazuo EBATA, Takashi MURATA, Yo YAMAMOTO, Masahiro MISU
-
Publication number: 20210341362Abstract: An automatic sample preparation apparatus that automatically prepares a sample piece from a sample and includes a focused ion beam irradiation optical system, an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam, a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample, a detector configured to detect secondary charged particles emitted from an irradiation object, and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the sample piece transfer device, wherein the image data includes a reference mark.Type: ApplicationFiled: July 13, 2021Publication date: November 4, 2021Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
-
Patent number: 11073453Abstract: An automatic sample preparation apparatus that automatically prepares a sample piece from a sample includes: a focused ion beam irradiation optical system configured to irradiate a focused ion beam; an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam; a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample; a detector configured to detect secondary charged particles emitted from an irradiation object by irradiating the irradiation object with the focused ion beam and/or the electron beam; and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the transfer device.Type: GrantFiled: July 22, 2020Date of Patent: July 27, 2021Assignee: Hitachi High-Tech Science CorporationInventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
-
Publication number: 20200355589Abstract: An automatic sample preparation apparatus that automatically prepares a sample piece from a sample includes: a focused ion beam irradiation optical system configured to irradiate a focused ion beam; an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam; a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample; a detector configured to detect secondary charged particles emitted from an irradiation object by irradiating the irradiation object with the focused ion beam and/or the electron beam; and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the transfer device.Type: ApplicationFiled: July 22, 2020Publication date: November 12, 2020Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
-
Publication number: 20200278281Abstract: A charged particle beam device (10a) includes a computer (21) which controls multiple charged particle beam irradiation optical systems, the needle (18), and a gas supply portion (17) to transfer a sample piece Q to a predetermined position of the sample piece holder P, based on at least images of a sample piece holder (P), a needle (18), and the sample piece (Q) previously acquired by multiple charged particle beams.Type: ApplicationFiled: May 19, 2020Publication date: September 3, 2020Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
-
Patent number: 10677697Abstract: According to one embodiment, an automatic sample preparation apparatus includes: a charged particle beam irradiation optical system configured to perform irradiation with a charged particle beam; a sample stage configured to move with the sample placed thereon; a sample piece transfer device for holding and transferring the sample piece separated and extracted from the sample; a sample piece holder-fixing bed configured to hold a sample piece holder to which the sample piece is transferred; a gas supply portion configured to irradiate gas forming a deposition film with the charged particle beam; and a computer configured to control the charged particle beam irradiation optical system, the sample piece transfer device, and the gas supply portion to transfer and stop the sample piece held by the sample piece transfer device with a gap between the sample piece holder and the sample piece, and connect the sample piece to the sample piece holder.Type: GrantFiled: September 24, 2018Date of Patent: June 9, 2020Assignee: Hitachi High-Tech Science CorporationInventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
-
Patent number: 10622187Abstract: Disclosed are a charged particle beam apparatus wherein the charged particle beam apparatus can efficiently performs finish processing of a sample and acquisition of a high-precision SEM image of a processing surface of the sample in a short time, and a sample processing observation method using the same. The charged particle beam apparatus includes: a gallium ion beam column radiating a gallium ion beam toward a sample to form a cross-section of the sample; an electron beam column having a semi-in-lens type objective lens and radiating an electron beam toward the sample; a gas ion beam column radiating a gas ion beam toward the sample to perform finish processing of the cross-section of the sample, wherein the gas ion beam has a beam diameter larger than a maximum diameter of the cross-section of the sample.Type: GrantFiled: February 19, 2019Date of Patent: April 14, 2020Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Yo Yamamoto, Shota Torikawa, Hidekazu Suzuki, Hiroyuki Suzuki, Mamoru Okabe, Tatsuya Asahata
-
Publication number: 20190259574Abstract: Disclosed are a charged particle beam apparatus wherein the charged particle beam apparatus can efficiently performs finish processing of a sample and acquisition of a high-precision SEM image of a processing surface of the sample in a short time, and a sample processing observation method using the same. The charged particle beam apparatus includes: a gallium ion beam column radiating a gallium ion beam toward a sample to form a cross-section of the sample; an electron beam column having a semi-in-lens type objective lens and radiating an electron beam toward the sample; a gas ion beam column radiating a gas ion beam toward the sample to perform finish processing of the cross-section of the sample, wherein the gas ion beam has a beam diameter larger than a maximum diameter of the cross-section of the sample.Type: ApplicationFiled: February 19, 2019Publication date: August 22, 2019Inventors: Yo YAMAMOTO, Shota TORIKAWA, Hidekazu SUZUKI, Hiroyuki SUZUKI, Mamoru OKABE, Tatsuya ASAHATA
-
Patent number: 10236159Abstract: A charged particle beam includes: a computer that controls a needle actuating mechanism so as to approach a needle to a sample piece using a template formed from an absorbed current image obtained by irradiating the needle with a charged particle beam and a tip coordinate of the needle acquired from a secondary electron image obtained by irradiating the needle with the charged particle beam.Type: GrantFiled: March 2, 2017Date of Patent: March 19, 2019Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Satoshi Tomimatsu, Makoto Sato, Atsushi Uemoto, Tatsuya Asahata, Yo Yamamoto
-
Publication number: 20190025167Abstract: According to one embodiment, an automatic sample preparation apparatus includes: a charged particle beam irradiation optical system configured to perform irradiation with a charged particle beam; a sample stage configured to move with the sample placed thereon; a sample piece transfer device for holding and transferring the sample piece separated and extracted from the sample; a sample piece holder-fixing bed configured to hold a sample piece holder to which the sample piece is transferred; a gas supply portion configured to irradiate gas forming a deposition film with the charged particle beam; and a computer configured to control the charged particle beam irradiation optical system, the sample piece transfer device, and the gas supply portion to transfer and stop the sample piece held by the sample piece transfer device with a gap between the sample piece holder and the sample piece, and connect the sample piece to the sample piece holder.Type: ApplicationFiled: September 24, 2018Publication date: January 24, 2019Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
-
Patent number: 10088401Abstract: A charged particle beam device (10a) includes a computer (21) which controls multiple charged particle beam irradiation optical systems, the needle (18), and a gas supply portion (17) to transfer a sample piece Q to a predetermined position of the sample piece holder P, based on at least images of a sample piece holder (P), a needle (18), and the sample piece (Q) previously acquired by multiple charged particle beams.Type: GrantFiled: June 29, 2015Date of Patent: October 2, 2018Assignee: Hitachi High-Tech Science CorporationInventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
-
Publication number: 20170178858Abstract: A charged particle beam includes: a computer that controls a needle actuating mechanism so as to approach a needle to a sample piece using a template formed from an absorbed current image obtained by irradiating the needle with a charged particle beam and a tip coordinate of the needle acquired from a secondary electron image obtained by irradiating the needle with the charged particle beam.Type: ApplicationFiled: March 2, 2017Publication date: June 22, 2017Inventors: Satoshi TOMIMATSU, Makoto SATO, Atsushi UEMOTO, Tatsuya ASAHATA, Yo YAMAMOTO
-
Publication number: 20170122852Abstract: A charged particle beam device (10a) includes a computer (21) which controls multiple charged particle beam irradiation optical systems, the needle (18), and a gas supply portion (17) to transfer a sample piece Q to a predetermined position of the sample piece holder P, based on at least images of a sample piece holder (P), a needle (18), and the sample piece (Q) previously acquired by multiple charged particle beams.Type: ApplicationFiled: June 29, 2015Publication date: May 4, 2017Inventors: Atsushi Uemoto, Tatsuya Asahata, Makoto Sato, Yo Yamamoto
-
Patent number: 9620333Abstract: A charged particle beam apparatus automatically prepares a sample piece from a sample and includes a charged particle beam irradiation optical system that irradiates a charged particle beam to a sample placed on a movable sample stage. A sample piece transferring unit holds and transfers a sample piece separated and extracted from the sample, and a holder support holds a sample piece holder to which the sample piece is transferred. A computer controls a position of an object based on a template prepared from an image of the object acquired by irradition with the charged particle beam and position information acquired from the image of the object. The sample piece transferring unit includes a needle that transfers the sample piece separated and extrated from the sample, and a needle actuting mechanism that actuates the needle.Type: GrantFiled: August 24, 2015Date of Patent: April 11, 2017Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Satoshi Tomimatsu, Makoto Sato, Atsushi Uemoto, Tatsuya Asahata, Yo Yamamoto
-
Publication number: 20160064187Abstract: Problem To automatically repeat an operation of extracting and transferring a sample piece, which is formed by processing a sample using an ion beam, to a sample piece holder. Solution A charged particle beam includes: a computer that controls a needle actuating mechanism so as to approach a needle to a sample piece using a template formed from an absorbed current image obtained by irradiating the needle with a charged particle beam and a tip coordinate of the needle acquired from a secondary electron image obtained by irradiating the needle with the charged particle beam.Type: ApplicationFiled: August 24, 2015Publication date: March 3, 2016Inventors: Satoshi TOMIMATSU, Makoto SATO, Atsushi UEMOTO, Tatsuya ASAHATA, Yo YAMAMOTO
-
Patent number: 9275827Abstract: A charged particle beam apparatus includes: a charged particle beam column; a detector configured to detect secondary charged particles; an image processor; a display device; a needle arranged in an irradiation area of charged particle beam; a needle actuator; a user interface; and a controller configured to control the needle actuator to actuate the needle in accordance with a target position that is set by the user interface. The controller controls the needle actuator to move the needle to track a change of the target position that is set by the user interface.Type: GrantFiled: February 9, 2015Date of Patent: March 1, 2016Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Atsushi Uemoto, Tatsuya Asahata, Hidekazu Suzuki, Yo Yamamoto
-
Patent number: 9218937Abstract: A charged particle beam apparatus includes: a charged particle beam column configured to irradiate an irradiation target with a charged particle beam; a detector configured to detect secondary charged particles emitted from the irradiation target by the irradiation of the charged particle beam; a needle arranged in an irradiation area of the charged particle beam; a needle actuator configured to actuate the needle; and a controller configured to control the needle actuator to actuate the needle along a movement route that is configured by a preset target position and preset way points. The controller controls the needle actuator to set an actuating direction of the needle for each of the way points.Type: GrantFiled: February 9, 2015Date of Patent: December 22, 2015Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Atsushi Uemoto, Tatsuya Asahata, Hidekazu Suzuki, Yo Yamamoto