Patents by Inventor Yogesh M Pai
Yogesh M Pai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240353470Abstract: A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.Type: ApplicationFiled: April 19, 2024Publication date: October 24, 2024Inventors: Niranjan R. Hegde, Daniel G. Knierim, Vivek Shivaram, Krishna N H Sri, Joshua J. O'Brien, Shubha B, Yogesh M. Pai
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Patent number: 12092693Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.Type: GrantFiled: June 24, 2022Date of Patent: September 17, 2024Inventors: Parjanya Adiga, Niranjan R. Hegde, Krishna N H. Sri, Gary J. Waldo, Yogesh M. Pai
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Patent number: 12020855Abstract: A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.Type: GrantFiled: May 7, 2021Date of Patent: June 25, 2024Assignee: Tektronix, Inc.Inventors: Shubha B, Niranjan R Hegde, Yogesh M Pai, Gajendra Kumar Patro, Krishna N H Sri
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Publication number: 20240044968Abstract: A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.Type: ApplicationFiled: July 28, 2023Publication date: February 8, 2024Applicant: Tektronix, Inc.Inventors: Vivek Shivaram, Niranjan R. Hegde, Krishna N H Sri, Abhishek Naik, Shubha B, Yogesh M. Pai, Venkatraj Melinamane
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Publication number: 20240036143Abstract: A system for measuring characteristics of wide bandgap Devices Under Test (DUTs) includes a testing fixture including one or more wide bandgap DUTs, and a measurement instrument having one or more processors configured to apply a stimulus to provoke a response of one or more wide bandgap DUTs, measure the response, graph the response on one or more displays, each display having a vertical scale, and automatically adjusting the vertical scale of the one or more displays until no clipping occurs in the one or more displays. Methods of dynamically configuring a test and measurement instrument based on a particular testing setup are also described.Type: ApplicationFiled: July 26, 2023Publication date: February 1, 2024Applicant: Tektronix, Inc.Inventors: Shubha B, Krishna N H Sri, Sathish Kumar K, Yogesh M. Pai
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Publication number: 20240027513Abstract: A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.Type: ApplicationFiled: July 10, 2023Publication date: January 25, 2024Applicant: Tektronix, Inc.Inventors: Vivek Shivaram, Niranjan R. Hedge, Shubha B, Krishna N H Sri, Yogesh M. Pai, Venkatraj Melinamane
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Publication number: 20230251699Abstract: A test and measurement instrument includes components and methods for measuring noise at an output of a power supply, measuring jitter of a serial data signal produced by a data generating circuit coupled to the power supply and correlating the noise measured from the power supply to the jitter of the serial data signal. The correlation may be performed in the frequency domain. Spectral plots of the measured noise and the measured jitter may be generated and presented to the user.Type: ApplicationFiled: February 3, 2023Publication date: August 10, 2023Applicant: Tektronix, Inc.Inventors: Madhusudan Acharya, Yogesh M. Pai, Krishna N H Sri, Anthony B. Ambrose, Blair Battye, Dallas J. Mohler
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Publication number: 20230133743Abstract: A test and measurement instrument has a user interface, one or more probes to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the user interface, at least one of the user inputs to identify at least one analysis to be performed on the DUT, receive waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and second pulse or multiple pulses from a source instrument, perform the at least one analysis on the waveform data, and display the waveform data and analysis on the user interface.Type: ApplicationFiled: October 28, 2022Publication date: May 4, 2023Applicant: Tektronix, Inc.Inventors: Vivek Shivaram, Niranjan R Hegde, Parjanya Adiga, Krishna N H Sri, Tsuyoshi Miyazaki, Yogesh M. Pai, Venkatraj Melinamane
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Publication number: 20230133047Abstract: A test and measurement instrument has a user interface, one or more probes to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive waveform data from the DUT after activation of the DUT by application of power from a power supply, and application of at least a first and second pulse from a source instrument, locate one or more reverse recovery regions in the waveform data, determine a reverse recovery time for the DUT from the reverse recovery region, and display a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display one or more of the reverse recovery regions, and including at least one characteristic for the one or more reverser recovery regions annotated on the reverse recovery plot.Type: ApplicationFiled: October 28, 2022Publication date: May 4, 2023Applicant: Tektronix, Inc.Inventors: Vivek Shivaram, Niranjan R Hegde, Parjanya Adiga, Krishna N H Sri, Tsuyoshi Miyazaki, Yogesh M. Pai, Venkatraj Melinamane
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Publication number: 20220413051Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.Type: ApplicationFiled: June 24, 2022Publication date: December 29, 2022Applicant: Tektronix, Inc.Inventors: Parjanya Adiga, Niranjan R. Hegde, Krishna N H. Sri, Gary J. Waldo, Yogesh M. Pai
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Publication number: 20210358685Abstract: A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.Type: ApplicationFiled: May 7, 2021Publication date: November 18, 2021Applicant: Tektronix, Inc.Inventors: Shubha B, Niranjan R Hegde, Yogesh M Pai, Gajendra Kumar Patro, Krishna N H Sri