Patents by Inventor Yohei Kakefuda

Yohei Kakefuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Thermo-physical property measurement instrument and thermo-physical property measurement method
    Patent number: 11867567
    Abstract: In a thermo-physical property measurement instrument, a light shield that shields from light except for an aperture is provided facing the front surface of a sample thin film of a sample. Heating light of repeated pulse that is output from a heating laser irradiates the sample thin film through the light shield. Temperature measurement light of continuous light that is output from a temperature measurement laser is applied to a measurement position a predetermined distance away from a heating light irradiation position on the sample thin film. A photodetector detects reflected light of the temperature measurement light off the sample thin film, and a computer acquires a thermo-reflectance signal that was digitally converted by an AD converter. The computer calculates a thermo-physical property value in the in-plane direction of the sample thin film of the sample on the basis of the acquired thermo-reflectance signal.
    Type: Grant
    Filed: December 4, 2019
    Date of Patent: January 9, 2024
    Assignees: NETZSCH Japan K.K., NATIONAL INSTITUTE FOR MATERIALS SCIENCE
    Inventors: Yohei Kakefuda, Susumu Kawakami, Tetsuya Baba, Takao Mori
  • Thermophysical Property Value Measurement Device And Thermophysical Property Value Measurement Method
    Publication number: 20220316959
    Abstract: In a thermo-physical property measurement instrument, a light shield that shields from light except for an aperture is provided facing the front surface of a sample thin film of a sample. Heating light of repeated pulse that is output from a heating laser irradiates the sample thin film through the light shield. Temperature measurement light of continuous light that is output from a temperature measurement laser is applied to a measurement position a predetermined distance away from a heating light irradiation position on the sample thin film. A photodetector detects reflected light of the temperature measurement light off the sample thin film, and a computer acquires a thermo-reflectance signal that was digitally converted by an AD converter. The computer calculates a thermo-physical property value in the in-plane direction of the sample thin film of the sample on the basis of the acquired thermo-reflectance signal.
    Type: Application
    Filed: December 4, 2019
    Publication date: October 6, 2022
    Inventors: Yohei Kakefuda, Susumu Kawakami, Tetsuya Baba, Takao Mori