Patents by Inventor Yoichi Hamashima

Yoichi Hamashima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5999244
    Abstract: Positional discrepancies of images of segmental areas, which are caused by stretching of a substrate in the Y direction, are corrected by changing magnifications of respective projection optical systems and inclinations of parallel plane glass pieces with respect optical axes. After that, positional discrepancies of the images after the correction are accurately detected by using a calibration system for the projection optical systems. Thus it is possible to confirm whether or not the positional discrepancies are accurately corrected. If the correction is insufficient as a result of the confirmation, at least one of correction of the magnifications of the respective projection optical systems and shift of the images projected through the respective projection optical systems onto the substrate is executed again so that amounts of the positional discrepancies are sufficiently small.
    Type: Grant
    Filed: November 4, 1996
    Date of Patent: December 7, 1999
    Assignee: Nikon Corporation
    Inventors: Masamitsu Yanagihara, Kei Hara, Seiji Miyazaki, Hideki Koitabashi, Yoichi Hamashima, Hiroshi Kitano, Yoshiyuki Katamata
  • Patent number: 4685805
    Abstract: An apparatus for optically measuring the very small gap between a reference plane and a substrate parallel to the reference plane. A beam of energy converging on the reference plane is reflected by the substrate and a spot of reflected beam is formed on a detecting plane at a different position. An array of detecting elements for detecting the size of the spot on the detecting plane is adjusted in position in such a manner that the center of the spot coincides with the center of any one of the detecting elements, thereby preventing any error of the in-focus detecting position due to the deviation between the center of the spot and the center of the detecting element.
    Type: Grant
    Filed: March 1, 1985
    Date of Patent: August 11, 1987
    Assignee: Nippon Kogaku K.K.
    Inventors: Kenichi Kodama, Akikazu Tanimoto, Hisao Izawa, Yoichi Hamashima, Junji Hazama