Patents by Inventor Yoichi Miyahara

Yoichi Miyahara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200054999
    Abstract: The apparatus for making a nanopore in a membrane generally has an electrode configured to connect to one of two opposing surfaces of the membrane; a conductive tip configured to contact a location of the other one of the two opposing surfaces of the membrane; and a voltage source electrically connected between the electrode and the conductive tip and operable to generate an electric potential across the membrane, the electric potential locally removing material of the membrane at the location to make the nanopore.
    Type: Application
    Filed: May 17, 2018
    Publication date: February 20, 2020
    Inventors: Peter GRUTTER, Yuning ZHANG, Yoichi MIYAHARA, Walter REISNER
  • Patent number: 9671424
    Abstract: Energy dissipation measurements in Frequency Modulation-Atomic Force Microscopy (FM-AFM) should provide additional information for dynamic force measurements as well as energy dissipation maps for robust material properties imaging as they should not be dependent directly upon the cantilever surface interaction regime. However, unexplained variabilities in experimental data have prevented progress in utilizing such energy dissipation studies. The inventors have demonstrated that the frequency response of the piezoacoustic cantilever excitation system, traditionally assumed flat, can actually lead to surprisingly large apparent damping by the coupling of the frequency shift to the drive-amplitude signal. Accordingly, means for correcting this source of apparent damping are presented allowing dissipation measurements to be reliably obtained and quantitatively compared to theoretical models.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: June 6, 2017
    Assignee: The Royal Institution of the Advancement of Learning/McGill University
    Inventors: Aleksander Labuda, Peter Grutter, Yoichi Miyahara, William Paul, Antoine Roy-Gobeil
  • Patent number: 9157486
    Abstract: A pipe-shaped fixture (100) to be attached to a housing (120) of a work machine includes a fixture body (102) having a front-end projection (110) and a rear-end projection (112) that make front and rear limits of a rubber cushion (104) that encloses the fixture body (102) closely and circumferentially. The front- and rear-end projections (110, 112) are connected to each other by a plurality of longitudinally extending ridges (114) formed at circumferential intervals. The ridges (114), front- and rear-end projections (110, 112) define a plurality of concavities (116) surrounded thereby on the outer circumference of the fixture body (102). The front- and rear-end projections (110, 112) cause longitudinal vibration of an operation rod (130) relative to the housing (120) to act as a compression force on the rubber cushion (104), and thereby suppress longitudinal vibration of the operation rod (130) while maintaining effects of suppressing horizontal and vertical vibrations.
    Type: Grant
    Filed: November 14, 2012
    Date of Patent: October 13, 2015
    Assignee: Yamabiko Corporation
    Inventors: Yoichi Miyahara, Tomoki Ito, Masanori Ohtani, Shunsuke Nakadate
  • Publication number: 20150276795
    Abstract: A method of Atomic Force Microscopy (AFM). A first drive signal is generated for causing a periodic motion of a probe tip in a direction normal to a sample surface. The first drive signal has a known amplitude and frequency. A bias signal is generated for applying an electric potential to the probe tip relative to a potential the sample surface. At least one component of the bias signal is oscillatory and correlated with the periodic motion of the probe tip. A response of the probe tip is detected, and analyzed by a processor to infer information about a composition of the sample surface.
    Type: Application
    Filed: April 1, 2014
    Publication date: October 1, 2015
    Applicant: CHIPWORKS INCORPORATED
    Inventors: Jessica Maude TOPPLE, Yoichi MIYAHARA, Peter Heinz GRUTTER, Zeno Schumacher
  • Publication number: 20150020245
    Abstract: Energy dissipation measurements in Frequency Modulation-Atomic Force Microscopy (FM-AFM) should provide additional information for dynamic force measurements as well as energy dissipation maps for robust material properties imaging as they should not be dependent directly upon the cantilever surface interaction regime. However, unexplained variabilities in experimental data have prevented progress in utilizing such energy dissipation studies. The inventors have demonstrated that the frequency response of the piezoacoustic cantilever excitation system, traditionally assumed flat, can actually lead to surprisingly large apparent damping by the coupling of the frequency shift to the drive-amplitude signal. Accordingly, means for correcting this source of apparent damping are presented allowing dissipation measurements to be reliably obtained and quantitatively compared to theoretical models.
    Type: Application
    Filed: March 13, 2013
    Publication date: January 15, 2015
    Inventors: Aleksander Labuda, Peter Grutter, Yoichi Miyahara, William Paul, Antoine Roy-Gobeil