Patents by Inventor Yoichi Toida
Yoichi Toida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10505336Abstract: A laser adjustment method includes a first adjustment step and a second adjustment step. In the first adjustment step, using a light detector detecting a second harmonic light, optical intensity and wavelength of the second harmonic light is detected and a first temperature adjuster is adjusted to adjust temperatures of a Nd:YVO4 crystal and a KTP crystal such that the detected wavelength of the second harmonic light approaches a desired wavelength and such that the optical intensity of the second harmonic light reaches at least a predetermined value. In the second adjustment step, after the first adjustment step, a temperature of an etalon is adjusted by a second temperature adjuster such that the detected wavelength of the second harmonic light approaches the desired wavelength and such that the optical intensity of the second harmonic light reaches at least a predetermined value.Type: GrantFiled: June 8, 2017Date of Patent: December 10, 2019Assignee: MITUTOYO CORPORATIONInventors: Tatsuya Narumi, Yoichi Toida
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Publication number: 20170373463Abstract: A laser adjustment method includes a first adjustment step and a second adjustment step. In the first adjustment step, using a light detector detecting a second harmonic light, optical intensity and wavelength of the second harmonic light is detected and a first temperature adjuster is adjusted to adjust temperatures of a Nd:YVO4 crystal and a KTP crystal such that the detected wavelength of the second harmonic light approaches a desired wavelength and such that the optical intensity of the second harmonic light reaches at least a predetermined value. In the second adjustment step, after the first adjustment step, a temperature of an etalon is adjusted by a second temperature adjuster such that the detected wavelength of the second harmonic light approaches the desired wavelength and such that the optical intensity of the second harmonic light reaches at least a predetermined value.Type: ApplicationFiled: June 8, 2017Publication date: December 28, 2017Applicant: MITUTOYO CORPORATIONInventors: Tatsuya NARUMI, Yoichi TOIDA
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Patent number: 6510725Abstract: A gage inspecting apparatus includes a jog dial 56A for controlling an amount of displacement of a measuring spindle 22 at a time when the position of the measuring spindle 22 is finely adjusted, and a shuttle ring 56B for controlling the driving direction and driving speed of the measuring spindle 22 at a time when the position of the measuring spindle 22 is roughly adjusted. The relationship between the amount of rotation of the jog dial 56A and the amount of displacement of the measuring spindle 22 can be set in correspondence with a scale interval of the gage.Type: GrantFiled: October 10, 2001Date of Patent: January 28, 2003Assignee: Mitutoyo CorporationInventors: Yuwu Zhang, Masaoki Yamagata, Yoichi Toida, Shiro Igasaki, Eiichi Tsunoda
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Publication number: 20020046005Abstract: A gage inspecting apparatus includes a jog dial 56A for controlling an amount of displacement of a measuring spindle 22 at a time when the position of the measuring spindle 22 is finely adjusted, and a shuttle ring 56B for controlling the driving direction and driving speed of the measuring spindle 22 at a time when the position of the measuring spindle 22 is roughly adjusted. The relationship between the amount of rotation of the jog dial 56A and the amount of displacement of the measuring spindle 22 can be set in correspondence with a scale interval of the gage.Type: ApplicationFiled: October 10, 2001Publication date: April 18, 2002Applicant: Mitutoyo CorporationInventors: Yuwu Zhang, Masaoki Yamagata, Yoichi Toida, Shiro Igasaki, Eiichi Tsunoda
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Patent number: 6357134Abstract: A height gauge capable of being moved while confining a positional relationship between a probe and a workpiece with an easy posture is provided. A handle (21) is provided on a side of a column (12) having a probe (13) adjacent to a base (11). An air-floatation control switch (31) for controlling supply and cut-off of air to an air-floatation mechanism (19), a repeat switch (32), a cancel switch (33) are provided to the handle (21).Type: GrantFiled: January 18, 2000Date of Patent: March 19, 2002Assignee: Mitutoyo CorporationInventors: Nobuyuki Hama, Yoichi Toida, Yuwu Zhang
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Patent number: 6062062Abstract: The object of present invention is to provide a sensitivity calibrating method for a detector of a comparator, which enables easy and highly accurate sensitivity calibration for a first and a second detector for measuring opposing position of an object. Heights of two pairs of reference gauge blocks, a first reference gauge block W1 and a second reference gauge block W2, and the second reference gauge block W2 and a third reference gauge block W3 is first measured, and thereafter, sensitivity coefficients for calibrating the sensitivity of an upper detector 10 and a lower detector 20 are calculated by applying the measured value to a predetermined formula. The calculation is repeated three times, and each value is renewed for the upper and the lower detector 10 and 20 respectively.Type: GrantFiled: June 22, 1998Date of Patent: May 16, 2000Assignee: Mitutoyo CorporationInventors: Yoichi Toida, Toshiro Horikawa
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Patent number: 5048326Abstract: A surface roughness measuring instrument is provided with a rotary drive mechanism configured such that two rollers support a sphere at three points, yet the driving torque applied to the sphere at those three points all give an equal tangential velocity. A detector arm is provided between the mounting section for mounting to the surface roughness measuring instrument itself and a tip section which holds skids which make contact with the object to be measured, so that these two sections are able to rock relative to each other about an axis in the direction in which the detector arm extends. Surface roughness in the circumferential direction of a body of rotation can be measured accurately and stably.Type: GrantFiled: November 7, 1989Date of Patent: September 17, 1991Assignee: Mitutoyo CorporationInventors: Yoichi Toida, Chihiro Marumo
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Patent number: 4888984Abstract: The present invention is concerned with a levelling device of a roughness measuring machine and includes a device for searching a tilt angle of the center locus of a measured value of the roughness to a base line, a device for setting a tolerable tilt angle of the center locus, a comparator for determining whether the tilt angle is included in the tolerable tilt angle or not, and a device for changing the position of an object to be measured in accordance with the result of comparison by this comparator. When the tilt angle is determined to be not included in the tolerable tilt angle, a position change device is operated to change the position of the object, so that scale-out can be avoided.Type: GrantFiled: April 5, 1988Date of Patent: December 26, 1989Assignee: Mitutoyo CorporationInventors: Chihiro Marumo, Yoichi Toida, Masatsugu Nemoto, Junichi Iida, Kenji Sakuma