Patents by Inventor Yoichi Toida

Yoichi Toida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10505336
    Abstract: A laser adjustment method includes a first adjustment step and a second adjustment step. In the first adjustment step, using a light detector detecting a second harmonic light, optical intensity and wavelength of the second harmonic light is detected and a first temperature adjuster is adjusted to adjust temperatures of a Nd:YVO4 crystal and a KTP crystal such that the detected wavelength of the second harmonic light approaches a desired wavelength and such that the optical intensity of the second harmonic light reaches at least a predetermined value. In the second adjustment step, after the first adjustment step, a temperature of an etalon is adjusted by a second temperature adjuster such that the detected wavelength of the second harmonic light approaches the desired wavelength and such that the optical intensity of the second harmonic light reaches at least a predetermined value.
    Type: Grant
    Filed: June 8, 2017
    Date of Patent: December 10, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Tatsuya Narumi, Yoichi Toida
  • Publication number: 20170373463
    Abstract: A laser adjustment method includes a first adjustment step and a second adjustment step. In the first adjustment step, using a light detector detecting a second harmonic light, optical intensity and wavelength of the second harmonic light is detected and a first temperature adjuster is adjusted to adjust temperatures of a Nd:YVO4 crystal and a KTP crystal such that the detected wavelength of the second harmonic light approaches a desired wavelength and such that the optical intensity of the second harmonic light reaches at least a predetermined value. In the second adjustment step, after the first adjustment step, a temperature of an etalon is adjusted by a second temperature adjuster such that the detected wavelength of the second harmonic light approaches the desired wavelength and such that the optical intensity of the second harmonic light reaches at least a predetermined value.
    Type: Application
    Filed: June 8, 2017
    Publication date: December 28, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Tatsuya NARUMI, Yoichi TOIDA
  • Patent number: 6510725
    Abstract: A gage inspecting apparatus includes a jog dial 56A for controlling an amount of displacement of a measuring spindle 22 at a time when the position of the measuring spindle 22 is finely adjusted, and a shuttle ring 56B for controlling the driving direction and driving speed of the measuring spindle 22 at a time when the position of the measuring spindle 22 is roughly adjusted. The relationship between the amount of rotation of the jog dial 56A and the amount of displacement of the measuring spindle 22 can be set in correspondence with a scale interval of the gage.
    Type: Grant
    Filed: October 10, 2001
    Date of Patent: January 28, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Yuwu Zhang, Masaoki Yamagata, Yoichi Toida, Shiro Igasaki, Eiichi Tsunoda
  • Publication number: 20020046005
    Abstract: A gage inspecting apparatus includes a jog dial 56A for controlling an amount of displacement of a measuring spindle 22 at a time when the position of the measuring spindle 22 is finely adjusted, and a shuttle ring 56B for controlling the driving direction and driving speed of the measuring spindle 22 at a time when the position of the measuring spindle 22 is roughly adjusted. The relationship between the amount of rotation of the jog dial 56A and the amount of displacement of the measuring spindle 22 can be set in correspondence with a scale interval of the gage.
    Type: Application
    Filed: October 10, 2001
    Publication date: April 18, 2002
    Applicant: Mitutoyo Corporation
    Inventors: Yuwu Zhang, Masaoki Yamagata, Yoichi Toida, Shiro Igasaki, Eiichi Tsunoda
  • Patent number: 6357134
    Abstract: A height gauge capable of being moved while confining a positional relationship between a probe and a workpiece with an easy posture is provided. A handle (21) is provided on a side of a column (12) having a probe (13) adjacent to a base (11). An air-floatation control switch (31) for controlling supply and cut-off of air to an air-floatation mechanism (19), a repeat switch (32), a cancel switch (33) are provided to the handle (21).
    Type: Grant
    Filed: January 18, 2000
    Date of Patent: March 19, 2002
    Assignee: Mitutoyo Corporation
    Inventors: Nobuyuki Hama, Yoichi Toida, Yuwu Zhang
  • Patent number: 6062062
    Abstract: The object of present invention is to provide a sensitivity calibrating method for a detector of a comparator, which enables easy and highly accurate sensitivity calibration for a first and a second detector for measuring opposing position of an object. Heights of two pairs of reference gauge blocks, a first reference gauge block W1 and a second reference gauge block W2, and the second reference gauge block W2 and a third reference gauge block W3 is first measured, and thereafter, sensitivity coefficients for calibrating the sensitivity of an upper detector 10 and a lower detector 20 are calculated by applying the measured value to a predetermined formula. The calculation is repeated three times, and each value is renewed for the upper and the lower detector 10 and 20 respectively.
    Type: Grant
    Filed: June 22, 1998
    Date of Patent: May 16, 2000
    Assignee: Mitutoyo Corporation
    Inventors: Yoichi Toida, Toshiro Horikawa
  • Patent number: 5048326
    Abstract: A surface roughness measuring instrument is provided with a rotary drive mechanism configured such that two rollers support a sphere at three points, yet the driving torque applied to the sphere at those three points all give an equal tangential velocity. A detector arm is provided between the mounting section for mounting to the surface roughness measuring instrument itself and a tip section which holds skids which make contact with the object to be measured, so that these two sections are able to rock relative to each other about an axis in the direction in which the detector arm extends. Surface roughness in the circumferential direction of a body of rotation can be measured accurately and stably.
    Type: Grant
    Filed: November 7, 1989
    Date of Patent: September 17, 1991
    Assignee: Mitutoyo Corporation
    Inventors: Yoichi Toida, Chihiro Marumo
  • Patent number: 4888984
    Abstract: The present invention is concerned with a levelling device of a roughness measuring machine and includes a device for searching a tilt angle of the center locus of a measured value of the roughness to a base line, a device for setting a tolerable tilt angle of the center locus, a comparator for determining whether the tilt angle is included in the tolerable tilt angle or not, and a device for changing the position of an object to be measured in accordance with the result of comparison by this comparator. When the tilt angle is determined to be not included in the tolerable tilt angle, a position change device is operated to change the position of the object, so that scale-out can be avoided.
    Type: Grant
    Filed: April 5, 1988
    Date of Patent: December 26, 1989
    Assignee: Mitutoyo Corporation
    Inventors: Chihiro Marumo, Yoichi Toida, Masatsugu Nemoto, Junichi Iida, Kenji Sakuma