Patents by Inventor Yoicho Otsuka

Yoicho Otsuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure
    Patent number: 7088120
    Abstract: A probe device including a cantilever. A probe is attached to the cantilever and is allocated to be opposed to a surface of a sample attached thereto. An apparatus is provided with the probe device, which is capable of carrying out measurement of the sample while switching at a predetermined period two operating modes, a tapping mode for measuring a surface structure of the sample while vibrating the cantilever and a point contact mode for measuring an electrical characteristic of the sample while bringing the probe into contact with the sample.
    Type: Grant
    Filed: February 25, 2005
    Date of Patent: August 8, 2006
    Assignee: Osaka University
    Inventors: Takuya Matsumoto, Yoicho Otsuka, Yasuhisa Naitoh, Tomoji Kawai