Abstract: A partition member has two surfaces in a thickness direction, and separates single cells that make up an assembled battery. When the average temperature of one of the two surfaces exceeds 180° C., a thermal resistance per unit area (?1) in the thickness direction satisfies Expression 1 below, and when the average temperatures of both of the two surfaces do not exceed 80° C., a thermal resistance per unit area (?2) in the thickness direction satisfies Expression 2 below. ?1?5.0×10?3(m2·K/W)??(Expression 1), and ?2?4.0×10?3(m2·K/W)??(Expression 2).

Abstract: A depth acquisition device includes memory and processor performing: acquiring, from the memory, intensities of infrared light emitted from a light source and measured by imaging with the infrared light reflected on a subject by pixels in an imaging element; generating a depth image by calculating a distance to the subject as a depth for each pixel based on an intensity received by the pixel; acquiring, from the memory, a visible light image generated by imaging, with visible light, a substantially same scene with a substantially same viewpoint and at a substantially same timing as those of imaging the infrared light image; detecting, from the visible light image, an edge region including an edge along a direction perpendicular to a direction of movement of the visible light image; and correcting, in the depth image, a depth of a target region corresponding to the edge region in the depth image.

Abstract: A depth acquisition device includes memory and processor performing: acquiring, from the memory, intensities of infrared light emitted from a light source and measured by imaging with the infrared light reflected on a subject by pixels in an imaging element; generating a depth image by calculating a distance to the subject as a depth for each pixel based on an intensity received by the pixel; acquiring, from the memory, a visible light image generated by imaging, with visible light, a substantially same scene with a substantially same viewpoint and at a substantially same timing as those of imaging the infrared light image; detecting, from the visible light image, an edge region including an edge along a direction perpendicular to a direction of movement of the visible light image; and correcting, in the depth image, a depth of a target region corresponding to the edge region in the depth image.

Abstract: A depth acquisition device includes a memory and a processor. The processor performs: acquiring timing information indicating a timing at which a light source irradiates a subject with infrared light; acquiring, from the memory, an infrared light image generated by imaging a scene including the subject with the infrared light according to the timing indicated by the timing information; acquiring, from the memory, a visible light image generated by imaging a substantially same scene as the scene of the infrared light image, with visible light from a substantially same viewpoint as a viewpoint of imaging the infrared light image at a substantially same time as a time of imaging the infrared light image; detecting a flare region from the infrared light image; and estimating a depth of the flare region based on the infrared light image, the visible light image, and the flare region.

Abstract: A depth acquisition device includes a memory and a processor. The processor performs: acquiring timing information indicating a timing at which a light source irradiates a subject with infrared light; acquiring, from the memory, an infrared light image generated by imaging a scene including the subject with the infrared light according to the timing indicated by the timing information; acquiring, from the memory, a visible light image generated by imaging a substantially same scene as the scene of the infrared light image, with visible light from a substantially same viewpoint as a viewpoint of imaging the infrared light image at a substantially same time as a time of imaging the infrared light image; detecting a flare region from the infrared light image; and estimating a depth of the flare region based on the infrared light image, the visible light image, and the flare region.

Abstract: A depth acquisition device includes a memory and a processor. The processor performs; acquiring timing information indicating a timing at which a light source irradiates a subject with infrared light; acquiring an infrared light image stored in the memory, the infrared light image being generated by imaging a scene including the subject with the infrared light according to the timing indicated by the timing information; acquiring a visible light image stored in the memory, the visible light image being generated by imaging a substantially same scene as that of the infrared light image, with visible light from a substantially same viewpoint and at a substantially same imaging time of those of the infrared light image; detecting a dust region showing dust from the infrared light image; and estimating a depth of the dust region based on the infrared light image, the visible light image, and the dust region.

Abstract: A depth acquisition device includes a memory and a processor performing: acquiring, from the memory, intensities of infrared light measured by imaging with infrared light emitted from a light source and reflected on a subject by pixels in an imaging element; generating a depth image by calculating the distance for each pixel based on the intensities; acquiring, from the memory, a visible light image generated by imaging, with visible light, the substantially same scene from the substantially same viewpoint at the substantially same timing as those of the infrared light image; detecting a lower reflection region showing an object having a lower reflectivity from the infrared light image in accordance with the infrared light image and the visible light image; correcting a corresponding lower reflection region in the depth image in accordance with the visible light image; and outputting the depth image with the corrected lower reflection region.

Abstract: A depth acquisition device includes a memory and a processor. The processor performs: acquiring timing information indicating a timing at which a light source irradiates a subject with infrared light; acquiring, from the memory, an infrared light image generated by imaging a scene including the subject with the infrared light according to the timing indicated by the timing information; acquiring, from the memory, a visible light image generated by imaging a substantially same scene as the scene of the infrared light image, with visible light from a substantially same viewpoint as a viewpoint of imaging the infrared light image at a substantially same time as a time of imaging the infrared light image; detecting a flare region from the infrared light image; and estimating a depth of the flare region based on the infrared light image, the visible light image, and the flare region.

Abstract: A depth acquisition device includes a memory and a processor performing: acquiring, from the memory, intensities of infrared light measured by imaging with infrared light emitted from a light source and reflected on a subject by pixels in an imaging element; generating a depth image by calculating the distance for each pixel based on the intensities; acquiring, from the memory, a visible light image generated by imaging, with visible light, the substantially same scene from the substantially same viewpoint at the substantially same timing as those of the infrared light image; detecting a lower reflection region showing an object having a lower reflectivity from the infrared light image in accordance with the infrared light image and the visible light image; correcting a corresponding lower reflection region in the depth image in accordance with the visible light image; and outputting the depth image with the corrected lower reflection region.

Abstract: A depth acquisition device includes memory and processor performing: acquiring, from the memory, intensities of infrared light emitted from a light source and measured by imaging with the infrared light reflected on a subject by pixels in an imaging element; generating a depth image by calculating a distance to the subject as a depth for each pixel based on an intensity received by the pixel; acquiring, from the memory, a visible light image generated by imaging, with visible light, a substantially same scene with a substantially same viewpoint and at a substantially same timing as those of imaging the infrared light image; detecting, from the visible light image, an edge region including an edge along a direction perpendicular to a direction of movement of the visible light image; and correcting, in the depth image, a depth of a target region corresponding to the edge region in the depth image.

Abstract: A depth acquisition device includes a memory and a processor. The processor performs; acquiring timing information indicating a timing at which a light source irradiates a subject with infrared light; acquiring an infrared light image stored in the memory, the infrared light image being generated by imaging a scene including the subject with the infrared light according to the timing indicated by the timing information; acquiring a visible light image stored in the memory, the visible light image being generated by imaging a substantially same scene as that of the infrared light image, with visible light from a substantially same viewpoint and at a substantially same imaging time of those of the infrared light image; detecting a dust region showing dust from the infrared light image; and estimating a depth of the dust region based on the infrared light image, the visible light image, and the dust region.

Abstract: A plasma-based processing system and a corresponding operation method are proposed. One or more absorbers are positioned between a plasma generation volume inside the plasma chamber and a support structure configured to support the workpiece, and then a portion of plasma delivered from the plasma generation volume to the support structure (or the workpiece) is absorbed by the absorber(s). Further, the absorber(s) are made of electrical conductive material(s), and the structure of at least one absorber and/or the relative geometric relation between at least two absorbers is adjustable. Hence, the position(s) of the electric conductor(s) overlap(s) with the delivered plasma may be adjusted, and then the ion current distribution on the cross section of the delivered plasma may be modified correspondingly.

Abstract: A loaded blumlein structure is described. At one end, the blumlein can be used to generate an electromagnetic pulse. At the other end, the top and bottom conductive connected by a resistive (or more generally a lossy) connection. This allows for subsequent pulses after the initial pulse to be dampened, maintaining the amplitude of the primary pulse, while reducing the stress on the system from the later ringing of the pulse. A number of geometries are described. In other examples, a pulse dampening section connected between the top and bottom conductive strips to provide the dampening effect.