Patents by Inventor Yonatan Lehman

Yonatan Lehman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8677429
    Abstract: A system for managing resource-usage conflict among a plurality of viewers associated with a plurality of TVs, including a plurality of resources for shared usage among the viewers, the resources including at least one input device adapted to receive a program broadcast and to transmit the program broadcast onward for display, a resolution arrangement operationally connected to the at least one input device, the resolution arrangement being adapted to identify a usage conflict of at least one of the resources, and send an on-screen display having a resource usage action-choice to at least two of the TVs. Related apparatus and methods are also described.
    Type: Grant
    Filed: May 4, 2005
    Date of Patent: March 18, 2014
    Assignee: Cisco Technology Inc.
    Inventors: Yonatan Lehman, Ezra Darshan
  • Patent number: 8554051
    Abstract: A device for recording at least part of a data stream including a recording module to record records divided among a plurality of segments, the records including a record for each instance of an event type of the data stream, each segment covering a range of the positions in the data stream such that different segments cover different ranges of positions in the stream, record the value of each instance, create a refresh region in each segment, the refresh region including data from the most recently recorded instance of each event type, create a plurality of links between the records to enable traversing the records in position order, and create an indexing table including an entry for each segment, the entry for each segment including the range of the positions covered by the records of the one segment. Related apparatus and method claims are also included.
    Type: Grant
    Filed: January 3, 2010
    Date of Patent: October 8, 2013
    Assignee: Cisco Technology, Inc.
    Inventors: Yonatan Lehman, Ronni Libson, Yoav Reshef, Netanel Lipschuetz, Rivka Vizen
  • Publication number: 20120099838
    Abstract: A device for recording at least part of a data stream including a recording module to record records divided among a plurality of segments, the records including a record for each instance of an event type of the data stream, each segment covering a range of the positions in the data stream such that different segments cover different ranges of positions in the stream, record the value of each instance, create a refresh region in each segment, the refresh region including data from the most recently recorded instance of each event type, create a plurality of links between the records to enable traversing the records in position order, and create an indexing table including an entry for each segment, the entry for each segment including the range of the positions covered by the records of the one segment. Related apparatus and method claims are also included.
    Type: Application
    Filed: January 3, 2010
    Publication date: April 26, 2012
    Inventors: Yonatan Lehman, Ronni Libson, Yoav Reshef, Netanel Lipschuetz, Rivka Vizen
  • Patent number: 7842935
    Abstract: A method for writing a master image on a substrate includes dividing the master image into a matrix of frames, each frame including an array of pixels defining a respective frame image in a respective frame position within the master image. An electron beam is scanned in a raster pattern over the substrate, while shaping the electron beam responsively to the respective frame image of each of the frames as the electron beam is scanned over the respective frame position, so that in each frame, the electron beam simultaneously writes a multiplicity of the pixels onto the substrate.
    Type: Grant
    Filed: July 17, 2006
    Date of Patent: November 30, 2010
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman, Doron Meshulach, Ehud Tirosh
  • Patent number: 7521700
    Abstract: A method for writing a master image on a substrate includes dividing the master image into a matrix of frames, each frame including an array of pixels defining a respective frame image in a respective frame position within the master image. An electron beam is scanned in a raster pattern over the substrate, while shaping the electron beam responsively to the respective frame image of each of the frames as the electron beam is scanned over the respective frame position, so that in each frame, the electron beam simultaneously writes a multiplicity of the pixels onto the substrate.
    Type: Grant
    Filed: July 17, 2006
    Date of Patent: April 21, 2009
    Assignee: Applied Materials, Israel, Ltd.
    Inventors: Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman, Doron Meshulach, Ehud Tirosh
  • Publication number: 20080034391
    Abstract: A system for managing resource-usage conflict among a plurality of viewers associated with a plurality of TVs, including a plurality of resources for shared usage among the viewers, the resources including at least one input device adapted to receive a program broadcast and to transmit the program broadcast onward for display, a resolution arrangement operationally connected to the at least one input device, the resolution arrangement being adapted to identify a usage conflict of at least one of the resources, and send an on-screen display having a resource usage action-choice to at least two of the TVs. Related apparatus and methods are also described.
    Type: Application
    Filed: May 4, 2005
    Publication date: February 7, 2008
    Inventors: Yonatan Lehman, Ezra Darshan
  • Publication number: 20060243918
    Abstract: A method for writing a master image on a substrate includes dividing the master image into a matrix of frames, each frame including an array of pixels defining a respective frame image in a respective frame position within the master image. An electron beam is scanned in a raster pattern over the substrate, while shaping the electron beam responsively to the respective frame image of each of the frames as the electron beam is scanned over the respective frame position, so that in each frame, the electron beam simultaneously writes a multiplicity of the pixels onto the substrate.
    Type: Application
    Filed: July 17, 2006
    Publication date: November 2, 2006
    Inventors: Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman, Doron Meshulach, Ehud Tirosh
  • Publication number: 20060243922
    Abstract: A method for writing a master image on a substrate includes dividing the master image into a matrix of frames, each frame including an array of pixels defining a respective frame image in a respective frame position within the master image. An electron beam is scanned in a raster pattern over the substrate, while shaping the electron beam responsively to the respective frame image of each of the frames as the electron beam is scanned over the respective frame position, so that in each frame, the electron beam simultaneously writes a multiplicity of the pixels onto the substrate.
    Type: Application
    Filed: July 17, 2006
    Publication date: November 2, 2006
    Inventors: Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Alon Litman, Yonatan Lehman, Doron Meshulach, Ehud Tirosh
  • Patent number: 7079235
    Abstract: A method of reticle inspection, comprising generating a test reticle comprising a plurality of test pattern-features thereon; manufacturing a wafer using the reticle; and determining a transfer of at least one of said plurality of pattern features from said reticle to said wafer. Preferably, a neural network is trained using the determination. Preferably, a reticle is inspected by running detected defects through the neural network to determine if the detected defect has a consequence.
    Type: Grant
    Filed: May 6, 2002
    Date of Patent: July 18, 2006
    Assignee: Applied Materials, Inc.
    Inventor: Yonatan Lehman
  • Publication number: 20030086081
    Abstract: A method of reticle inspection, comprising generating a test reticle comprising a plurality of test pattern-features thereon; manufacturing a wafer using the reticle; and determining a transfer of at least one of said plurality of pattern features from said reticle to said wafer. Preferably, a neural network is trained using the determination. Preferably, a reticle is inspected by running detected defects through the neural network to determine if the detected defect has a consequence.
    Type: Application
    Filed: May 6, 2002
    Publication date: May 8, 2003
    Applicant: APPLIED MATERIALS, INC.
    Inventor: Yonatan Lehman
  • Publication number: 20030048939
    Abstract: A simple, powerful technique for facilitating defect inspection in manufactured articles, especially articles used in or resulting from semiconductor fabrication. In the case of an article having a chrome and glass pattern thereon, such as a reticle or other article used in photolithography, a master version is identified, in as pristine a fashion as possible. That master version is imaged and stored, and that image used subsequently for comparison to other correspondingly patterned articles as part of an inspection process. The data provided by reading the recorded image of the master article substitutes for data derived from prior Die to Die or Die to Database comparisons. The invention also is directed to an apparatus which enables the nonvolatile storage of one or more of such master versions for use in article inspection.
    Type: Application
    Filed: October 31, 2002
    Publication date: March 13, 2003
    Applicant: Applied Materials, Inc.
    Inventor: Yonatan Lehman
  • Patent number: 6466314
    Abstract: A method of reticle inspection, comprising generating a test reticle comprising a plurality of test pattern-features thereon; manufacturing a wafer using the reticle; and determining a transfer of at least one of said plurality of pattern features from said reticle to said wafer. Preferably, a neural network is trained using the determination. Preferably, a reticle is inspected by running detected defects through the neural network to determine if the detected defect has a consequence.
    Type: Grant
    Filed: September 17, 1998
    Date of Patent: October 15, 2002
    Assignee: Applied Materials, Inc.
    Inventor: Yonatan Lehman
  • Patent number: 6366687
    Abstract: Data converter apparatus for converting in real time data stored in an input compact format into an output expanded real time format. The data including a plurality of groups and repetition of the groups. The groups including, each, many basic geometric figures (BGF). The data converter includes a processor adapted to selecting data relating to a predetermined division, dividing and processing the data into consecutive bins according to scan order, which bins have structural correspondence to the input format. The data converter is further capable of sub-dividing the division into sub-divisions which have structural correspondence to the output format. The data processor is further capable of processing and allocating the BGFs in the bins to sub-divisions to thereby produce a division data stream in the output expanded real time format.
    Type: Grant
    Filed: August 10, 1998
    Date of Patent: April 2, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Meir Aloni, Nissim Elmaliach, Mula Friedman, Yonatan Lehman