Patents by Inventor Yoneo Matsuzawa

Yoneo Matsuzawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4363059
    Abstract: A magnetic tape cassette holding a wound magnetic tape comprising a transparent base film and a magnetic layer having a thickness of 5.mu. or less coated on the base film comprises a hole facing a light source for detecting the tape position, a hole facing a photosenser provided so as to form a light path passing to the hole for light source through which the magnetic tape is passed and a light-shielding filter having a light transmittance in the range between 0.5 and 10 percent placed in the light path.
    Type: Grant
    Filed: October 2, 1980
    Date of Patent: December 7, 1982
    Assignee: TDK Electronics Co., Ltd.
    Inventors: Yoneo Matsuzawa, Yoshio Kawakami, Norifumi Kajimoto
  • Patent number: 4338367
    Abstract: A magnetic recording tape comprises a polyethyleneterephthalate base film coated with a magnetic layer which has an index H given by the equation:1.5>19.00-0.406 d.sub.B -0.016 H-0.553 d.sub.Td.sub.T .ltoreq.18(.mu.m)wherein the reference d.sub.T (.mu.m) designates a total thickness of the magnetic recording tape; d.sub.B (.mu.m) designates a thickness of the base film and H designates a sum of numbers of interference rings (H.sub.1, H.sub.2, H.sub.3 . . . )per 1 mm.sup.2.
    Type: Grant
    Filed: September 15, 1980
    Date of Patent: July 6, 1982
    Assignee: TDK Electronics Co., Ltd.
    Inventors: Yoshio Kawakami, Yoneo Matsuzawa, Norifumi Kajimoto
  • Patent number: 4304807
    Abstract: A magnetic recording tape comprising a polyethylene terephthalate substrate and a magnetic material-containing layer closely adhered onto the substrate, which tape exhibits a reduced envelope variation. The polyethylene terephthalate substrate satisfies the formula:0.051H.sub.1 -0.59A+0.14 .DELTA.n+0.0015 (H.sub.2 -66.67).sup.2 +50.92.ltoreq.20wherein A is the average particle size of the polyethylene terephthalate crystals as determined from the half height width by X-ray diffractometry, and H.sub.1 is the average number of projections present in a unit area of 1 mm.sup.2 on the surface of the substrate, which projections have a height falling within the range of from 0.27 to 0.53 micron, H.sub.2 is the average number of projections similar to H.sub.1 above but having a height falling within the range of from 0.54 to 0.80 micron, rather than 0.27 to 0.53 micron, and .DELTA.n is the birefringence of the substrate.
    Type: Grant
    Filed: June 19, 1979
    Date of Patent: December 8, 1981
    Assignee: TDK Electronics Co. Ltd.
    Inventors: Yoshio Kawakami, Yoneo Matsuzawa