Patents by Inventor Yong-Cheol CHO

Yong-Cheol CHO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12292849
    Abstract: A peripheral component interconnect express (PCIe) device includes a common function performing operations associated with a PCIe interface according to a function type, the common function being programmable to be a function type selected from a plurality function types, an access identification information controller generating first access identification information for allowing an access to the common function, and providing the first access identification information to an assigned system image to which the common function has been assigned, a data packet receiver receiving a data packet including target identification information indicating a target system image from the target system image, and an access allowance determiner determining whether or not to allow the target system image to access the common function based on the first access identification information and the target identification information.
    Type: Grant
    Filed: January 8, 2024
    Date of Patent: May 6, 2025
    Assignee: SK hynix Inc.
    Inventors: Yong Tae Jeon, Byung Cheol Kang, Seung Duk Cho, Sang Hyun Yoon, Se Hyeon Han, Jae Young Jang
  • Publication number: 20250062944
    Abstract: A method by which a first communication node operates in a communication system comprises the steps of: generating a first sequence and a second sequence; generating a first signal sequence on the basis of the first sequence and the second sequence; and transmitting a first signal generated by modulating the first signal sequence, wherein even-numbered elements and odd numbered elements of the first signal sequence are classified into a first element group and a second element group, respectively, and any one of the first sequence and the second sequence can be mapped in ascending order in the first element group, and the other one thereof can be mapped in descending order in the second element group.
    Type: Application
    Filed: December 21, 2022
    Publication date: February 20, 2025
    Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Kapseok CHANG, Byung Jae KWAK, Won Cheol CHO, Young-Jo KO, Yong Sun KIM
  • Publication number: 20230259581
    Abstract: Disclosed herein is a method for outer-product-based matrix multiplication for a floating-point data type includes receiving first floating-point data and second floating-point data and performing matrix multiplication on the first floating-point data and the second floating-point data, and the result value of the matrix multiplication is calculated based on the suboperation result values of floating-point units.
    Type: Application
    Filed: February 14, 2023
    Publication date: August 17, 2023
    Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Won JEON, Young-Su KWON, Ju-Yeob KIM, Hyun-Mi KIM, Hye-Ji KIM, Chun-Gi LYUH, Mi-Young LEE, Jae-Hoon CHUNG, Yong-Cheol CHO, Jin-Ho HAN
  • Publication number: 20220180162
    Abstract: Disclosed herein is an AI accelerator. The AI accelerator includes processors, each performing a deep-learning operation using multiple threads; and a cache memory including an L0 instruction cache for providing instructions to the processors and an L1 cache mapped to the multiple areas of mapped memory.
    Type: Application
    Filed: December 7, 2021
    Publication date: June 9, 2022
    Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Jin-Ho HAN, Young-Su KWON, Mi-Young LEE, Joo-Hyun LEE, Yong-Cheol CHO
  • Patent number: 10489520
    Abstract: Disclosed herein is a method and apparatus for injecting a fault and analyzing fault tolerance. The fault tolerance analysis apparatus extracts design information from a design. The fault tolerance analysis apparatus may inject a fault into a simulation of the design based on the extracted design information and parameters, and analyzes an influence of the fault on the simulation. Accordingly, in accordance with the fault tolerance analysis apparatus, fault tolerance for the fault injected into the simulation is analyzed, and the effect of the fault tolerance mechanism provided in the design is analyzed.
    Type: Grant
    Filed: May 13, 2016
    Date of Patent: November 26, 2019
    Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Yong-Cheol Cho, Young-Su Kwon
  • Publication number: 20160334467
    Abstract: Disclosed herein is a method and apparatus for injecting a fault and analyzing fault tolerance. The fault tolerance analysis apparatus extracts design information from a design. The fault tolerance analysis apparatus may inject a fault into a simulation of the design based on the extracted design information and parameters, and analyzes an influence of the fault on the simulation. Accordingly, in accordance with the fault tolerance analysis apparatus, fault tolerance for the fault injected into the simulation is analyzed, and the effect of the fault tolerance mechanism provided in the design is analyzed.
    Type: Application
    Filed: May 13, 2016
    Publication date: November 17, 2016
    Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Yong-Cheol CHO, Young-Su KWON