Patents by Inventor Yong Gap BAE

Yong Gap BAE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11474713
    Abstract: There are provided a storage device and an operating method thereof. The storage device includes: a nonvolatile memory device including a system block for storing firmware data including a program code of firmware, a signature in which the program code is encoded, and an authentication key; a volatile memory device configured to store operational firmware data; and a memory controller configured to, when power is applied to the storage device, store the firmware data as the operational firmware data in the volatile memory device, perform a firmware validity test for detecting whether the operational firmware data and the firmware data matches each other, in response to a test event, and perform a reset operation based on a result of the firmware validity test.
    Type: Grant
    Filed: March 30, 2021
    Date of Patent: October 18, 2022
    Assignee: SK hynix Inc.
    Inventors: Han Choi, Dae Hee Kim, Yong Gap Bae, Gak Yang
  • Publication number: 20220107737
    Abstract: There are provided a storage device and an operating method thereof. The storage device includes: a nonvolatile memory device including a system block for storing firmware data including a program code of firmware, a signature in which the program code is encoded, and an authentication key; a volatile memory device configured to store operational firmware data; and a memory controller configured to, when power is applied to the storage device, store the firmware data as the operational firmware data in the volatile memory device, perform a firmware validity test for detecting whether the operational firmware data and the firmware data matches each other, in response to a test event, and perform a reset operation based on a result of the firmware validity test.
    Type: Application
    Filed: March 30, 2021
    Publication date: April 7, 2022
    Inventors: Han CHOI, Dae Hee KIM, Yong Gap BAE, Gak YANG