Patents by Inventor YONG-GEUN OH

YONG-GEUN OH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11960752
    Abstract: A method of operating a memory system, which includes a memory controller and at least one non-volatile memory, includes storing, in the memory system, temperature-dependent performance level information received from a host disposed external to the memory system, setting an operation performance level of the memory system to a first performance level, operating the memory controller and the at least one non-volatile memory device according to the first performance level, detecting an internal temperature of the memory system, and changing the operation performance level of the memory system to a second performance level that is different from the first performance level. The operation performance level is changed by the memory controller of the memory system, and changing the operation performance level is based on the temperature-dependent performance level information and the detected internal temperature.
    Type: Grant
    Filed: June 24, 2021
    Date of Patent: April 16, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hyun-Seok Kim, Dae-Ho Kim, Yong-Geun Oh, Sung-Jin Moon
  • Patent number: 11942640
    Abstract: Provided is a negative electrode active material for a lithium secondary battery which includes: a silicon-silicon oxide-magnesium silicate composite comprising a silicon oxide (SiOx, 0<x?2) matrix; and silicon (Si) crystal grains, MgSiO3 crystal grains and Mg2SiO4 crystal grains present in the silicon oxide matrix, wherein the MgSiO3 crystal grains have a crystal size of 5-30 nm and the Mg2SiO4 crystal grains have a crystal size of 20-100 nm in the silicon-silicon oxide-magnesium silicate composite, and the content ratio of MgSiO3 crystal grains to Mg2SiO4 crystal grains is 2:1-1:1 on the weight basis. A method for preparing the negative electrode active material for a lithium secondary battery is also provided.
    Type: Grant
    Filed: January 20, 2020
    Date of Patent: March 26, 2024
    Assignee: LG Energy Solution, Ltd.
    Inventors: Il-Geun Oh, Dong-Hyuk Kim, Yong-Ju Lee
  • Publication number: 20230111732
    Abstract: A method of operating a memory system, which includes a memory controller and at least one non-volatile memory, includes storing, in the memory system, temperature-dependent performance level information received from a host disposed external to the memory system, setting an operation performance level of the memory system to a first performance level, operating the memory controller and the at least one non-volatile memory device according to the first performance level, detecting an internal temperature of the memory system, and changing the operation performance level of the memory system to a second performance level that is different from the first performance level. The operation performance level is changed by the memory controller of the memory system, and changing the operation performance level is based on the temperature-dependent performance level information and the detected internal temperature.
    Type: Application
    Filed: October 12, 2022
    Publication date: April 13, 2023
    Inventors: HYUN-SEOK KIM, Dae-Ho Kim, Yong-geun Oh, Sung-Jin Moon
  • Publication number: 20210326059
    Abstract: A method of operating a memory system, which includes a memory controller and at least one non-volatile memory, includes storing, in the memory system, temperature-dependent performance level information received from a host disposed external to the memory system, setting an operation performance level of the memory system to a first performance level, operating the memory controller and the at least one non-volatile memory device according to the first performance level, detecting an internal temperature of the memory system, and changing the operation performance level of the memory system to a second performance level that is different from the first performance level. The operation performance level is changed by the memory controller of the memory system, and changing the operation performance level is based on the temperature-dependent performance level information and the detected internal temperature.
    Type: Application
    Filed: June 24, 2021
    Publication date: October 21, 2021
    Inventors: HYUN-SEOK KIM, DAE-HO KIM, YONG-GEUN OH, SUNG-JIN MOON
  • Patent number: 11093166
    Abstract: A method of operating a memory system, which includes a memory controller and at least one non-volatile memory, includes storing, in the memory system, temperature-dependent performance level information received from a host disposed external to the memory system, setting an operation performance level of the memory system to a first performance level, operating the memory controller and the at least one non-volatile memory device according to the first performance level, detecting an internal temperature of the memory system, and changing the operation performance level of the memory system to a second performance level that is different from the first performance level. The operation performance level is changed by the memory controller of the memory system, and changing the operation performance level is based on the temperature-dependent performance level information and the detected internal temperature.
    Type: Grant
    Filed: January 7, 2019
    Date of Patent: August 17, 2021
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hyun-Seok Kim, Dae-Ho Kim, Yong-Geun Oh, Sung-Jin Moon
  • Publication number: 20190155538
    Abstract: A method of operating a memory system, which includes a memory controller and at least one non-volatile memory, includes storing, in the memory system, temperature-dependent performance level information received from a host disposed external to the memory system, setting an operation performance level of the memory system to a first performance level, operating the memory controller and the at least one non-volatile memory device according to the first performance level, detecting an internal temperature of the memory system, and changing the operation performance level of the memory system to a second performance level that is different from the first performance level. The operation performance level is changed by the memory controller of the memory system, and changing the operation performance level is based on the temperature-dependent performance level information and the detected internal temperature.
    Type: Application
    Filed: January 7, 2019
    Publication date: May 23, 2019
    Inventors: Hyun-Seok Kim, Dae-Ho Kim, Yong-Geun Oh, Sung-Jin Moon
  • Patent number: 10198214
    Abstract: A method of operating a memory system, which includes a memory controller and at least one non-volatile memory, includes storing, in the memory system, temperature-dependent performance level information received from a host disposed external to the memory system, setting an operation performance level of the memory system to a first performance level, operating the memory controller and the at least one non-volatile memory device according to the first performance level, detecting an internal temperature of the memory system, and changing the operation performance level of the memory system to a second performance level that is different from the first performance level. The operation performance level is changed by the memory controller of the memory system, and changing the operation performance level is based on the temperature-dependent performance level information and the detected internal temperature.
    Type: Grant
    Filed: January 21, 2015
    Date of Patent: February 5, 2019
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hyun-Seok Kim, Dae-Ho Kim, Yong-Geun Oh, Sung-Jin Moon
  • Publication number: 20150301744
    Abstract: A method of operating a memory system, which includes a memory controller and at least one non-volatile memory, includes storing, in the memory system, temperature-dependent performance level information received from a host disposed external to the memory system, setting an operation performance level of the memory system to a first performance level, operating the memory controller and the at least one non-volatile memory device according to the first performance level, detecting an internal temperature of the memory system, and changing the operation performance level of the memory system to a second performance level that is different from the first performance level. The operation performance level is changed by the memory controller of the memory system, and changing the operation performance level is based on the temperature-dependent performance level information and the detected internal temperature.
    Type: Application
    Filed: January 21, 2015
    Publication date: October 22, 2015
    Inventors: HYUN-SEOK KIM, DAE-HO KIM, YONG-GEUN OH, SUNG-JIN MOON