Patents by Inventor Yong Hyeon Shin
Yong Hyeon Shin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20160274018Abstract: A gas permeability measurement apparatus and a gas permeability measurement method, including a first chamber filled with a measurement gas and maintained at a constant pressure, a second chamber connected in series to the first chamber, a third chamber connected in series to the second chamber, and a separating plate having a through-hole and separating the second chamber and the third chamber from each other. A conductance adjusting part is disposed between the second and third chambers to adjust conductance passing through the through-hole of the separating plate. A vacuum pump is connected to the third chamber to exhaust the third chamber. A differential pressure gauge measures differential pressure between the second and third chambers. A sample is disposed between the first and second chambers. The measurement gas is delivered to the second chamber after permeating the sample, and the conductance adjusting part sequentially provides at least two different conductances.Type: ApplicationFiled: May 31, 2016Publication date: September 22, 2016Inventors: Dae-Jin Seong, Yong-Hyeon Shin, In-Tae Lim
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Publication number: 20100282711Abstract: Provided are a process monitoring apparatus and method. The process monitoring apparatus includes a process chamber in which a process is performed, a probe assembly disposed on the process chamber, and comprising a probe electrode, a plasma generator generating plasma around the probe assembly, and a drive processor applying an alternating current (AC) voltage having at least 2 fundamental frequencies to the probe assembly, and extracting process monitoring parameters.Type: ApplicationFiled: December 12, 2008Publication date: November 11, 2010Inventors: Chin-Wook Chung, Minhyong Lee, Sung-Ho Jang, Ik-Jin Choi, Jung-Hyung Kim, Yong-Hyeon Shin
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Patent number: 7830505Abstract: The present invention relates to a spectroscopy analyzer for real-time diagnostics of process, and more particularly, to a spectroscopy analyzer for real-time diagnostics of process, in which a beam is injected to a reaction byproduct or a reactant and then an output beam is measured, thereby performing quantitative and qualitative analysis of the reaction byproduct or the reactant.Type: GrantFiled: August 7, 2008Date of Patent: November 9, 2010Assignee: Korea Research Institute of Standards and ScienceInventors: Sang Woo Kang, Ju Young Yun, Dae Jin Seong, Yong Hyeon Shin
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Patent number: 7784352Abstract: The present invention relates to a capacitance type pressure measurement apparatus by using a diaphragm, and more specifically to an apparatus for measuring pressure by using a diaphragm capable of measuring pressure of atmospheric pressure or less as well as pressure of atmospheric pressure or more without having a getter pump by fixedly mounting a pressure variable container on a sensor housing having a diaphragm mounted therein.Type: GrantFiled: December 29, 2008Date of Patent: August 31, 2010Assignee: Korea Research Institute of Standards and ScienceInventors: Seung Soo Hong, Yong Hyeon Shin, Jin Tae Kim
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Patent number: 7735373Abstract: The present invention relates to an apparatus for measuring pressure inside a vessel using a magnetostrictive acoustic transducer. The apparatus includes a magnetostrictive acoustic transducer, including an exciting coil unit wound on a first magnetization yoke disposed on an outer position of a vessel, a receiving coil unit wound on the first magnetization yoke, and a vibration unit disposed on an inner position of the vessel in which the first magnetization yoke is installed; a control unit for supplying a predetermined excitation current signal to the exciting coil unit; and a pressure measuring unit for measuring an internal pressure of the vessel based on an ultrasonic wave signal received by the receiving coil unit and an excitation current signal into the exciting coil unit.Type: GrantFiled: August 13, 2008Date of Patent: June 15, 2010Assignee: Korea Research Institute of Standards and ScienceInventors: Seung Hyun Cho, Bongyoung Ahn, Seung Soo Hong, Yong Hyeon Shin
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Patent number: 7716991Abstract: The present invention relates to an apparatus for measuring pressure inside a predetermined vessel based on the principle that the transmitting efficiency of ultrasonic waves is changed by acoustic impedance variation according to an internal pressure. The apparatus includes an ultrasound exciting unit 20 disposed inside the vessel 10 and generating predetermined ultrasonic waves, an ultrasound receiving unit 30 disposed inside the vessel 10 and placed on the same axis line as that of the ultrasound exciting unit 20, a control unit 70 for controlling a frequency and a waveform of the excitation signal transmitted into the ultrasound exciting unit 20, and a pressure measuring unit 80 for measuring an internal pressure of the vessel 10 based on an ultrasonic signal received by the ultrasound receiving unit 30 and the excitation signal transmitted into the ultrasound exciting unit 20.Type: GrantFiled: August 15, 2008Date of Patent: May 18, 2010Assignee: Korea Research Institute of Standards and ScienceInventors: Bongyoung Ahn, Seung Hyun Cho, Seung Soo Hong, Yong Hyeon Shin, Kwang Hwa Chung
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Publication number: 20090277273Abstract: The apparatus for measuring pressure inside a vessel using acoustic impedance matching layers may include an ultrasound exciting unit attached to the outer surface of the vessel wall that generates ultrasonic waves inside of the vessel. A first acoustic impedance matching layer attached to the inner surface of the vessel wall increases the transmitting efficiency of the ultrasonic waves. An ultrasound receiving unit attached to the outer surface of the vessel wall receives an ultrasonic signal traveling inside the vessel. A second acoustic impedance matching layer attached to the inner surface of the vessel wall increases the transmitting efficiency of the ultrasonic waves. A control unit connected to the ultrasound exciting unit controls the excitation signal transmitted into the ultrasound exciting unit. A pressure measuring unit connected to the control unit measures an internal pressure of the vessel based on the excitation signal and the received ultrasonic waves.Type: ApplicationFiled: August 12, 2008Publication date: November 12, 2009Inventors: Seung Soo HONG, Yong Hyeon SHIN, Bongyoung AHN, Seung Hyun CHO, Ki-Bok KIM
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Publication number: 20090277275Abstract: The present invention relates to an apparatus for measuring pressure inside a predetermined vessel based on the principle that the transmitting efficiency of ultrasonic waves is changed by acoustic impedance variation according to an internal pressure. The apparatus includes an ultrasound exciting unit 20 disposed inside the vessel 10 and generating predetermined ultrasonic waves, an ultrasound receiving unit 30 disposed inside the vessel 10 and placed on the same axis line as that of the ultrasound exciting unit 20, a control unit 70 for controlling a frequency and a waveform of the excitation signal transmitted into the ultrasound exciting unit 20, and a pressure measuring unit 80 for measuring an internal pressure of the vessel 10 based on an ultrasonic signal received by the ultrasound receiving unit 30 and the excitation signal transmitted into the ultrasound exciting unit 20.Type: ApplicationFiled: August 15, 2008Publication date: November 12, 2009Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCEInventors: Bongyoung AHN, Seung Hyun CHO, Seung Soo HONG, Yong Hyeon SHIN, Kwang Hwa CHUNG
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Publication number: 20090279391Abstract: The present invention relates to an apparatus for measuring pressure inside a vessel using a magnetostrictive acoustic transducer. The apparatus includes a magnetostrictive acoustic transducer, including an exciting coil unit wound on a first magnetization yoke disposed on an outer position of a vessel, a receiving coil unit wound on the first magnetization yoke, and a vibration unit disposed on an inner position of the vessel in which the first magnetization yoke is installed; a control unit for supplying a predetermined excitation current signal to the exciting coil unit; and a pressure measuring unit for measuring an internal pressure of the vessel based on an ultrasonic wave signal received by the receiving coil unit and an excitation current signal into the exciting coil unit.Type: ApplicationFiled: August 13, 2008Publication date: November 12, 2009Applicant: Korea Research Institute of Standards and ScienceInventors: Seung Hyun CHO, Bongyoung AHN, Seung Soo HONG, Yong Hyeon SHIN
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Publication number: 20090260448Abstract: The present invention relates to a capacitance type pressure measurement apparatus by using a diaphragm, and more specifically to an apparatus for measuring pressure by using a diaphragm capable of measuring pressure of atmospheric pressure or less as well as pressure of atmospheric pressure or more without having a getter pump by fixedly mounting a pressure variable container on a sensor housing having a diaphragm mounted therein.Type: ApplicationFiled: December 29, 2008Publication date: October 22, 2009Applicant: Korea Research Institute of Standards and ScienceInventors: Seung Soo Hong, Yong Hyeon Shin, Jin Tae Kim
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Patent number: 7569178Abstract: An apparatus and method for in-situ calibration of a vacuum gauge by absolute method and comparison method, which can carry out absolute calibration using a static type standard for measuring pressures of vacuum chambers by expanding and moving gas between four vacuum chambers of different volumes in order, and comparison calibration of vacuum gauges in an in-situ state without movement of the vacuum gauges according to a method for controlling gas flow through an orifice using a calibrated standard vacuum gauge. Thus, the absolute calibration and the comparative calibration of the vacuum gauges which have been separately carried out by different apparatuses till now can be carried out by just one apparatus, whereby economical efficiency and convenience in calibration of vacuum gauges are maximized.Type: GrantFiled: May 5, 2006Date of Patent: August 4, 2009Assignee: Korea Research Institute of Standards and ScienceInventors: Seung Soo Hong, Yong Hyeon Shin, Kwang Hwa Chung, In Tae Lim
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Publication number: 20090046285Abstract: The present invention relates to a spectroscopy analyzer for real-time diagnostics of process, and more particularly, to a spectroscopy analyzer for real-time diagnostics of process, in which a beam is injected to a reaction byproduct or a reactant and then an output beam is measured, thereby performing quantitative and qualitative analysis of the reaction byproduct or the reactant.Type: ApplicationFiled: August 7, 2008Publication date: February 19, 2009Inventors: Sang Woo Kang, Ju Young Yun, Dae Jin Seong, Yong Hyeon Shin
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Patent number: 7456633Abstract: Disclosed herein are an apparatus for and method of measuring the composition and the pressure of the discharged gas from an ion gauge by using a residual gas analyzer. In this regard, there are provided a vacuum container 200 divided into a pressure container 210 and a discharge container 220 by means of a partition 235 having an orifice 230 formed thereon; an ion gauge 100 mounted at the pressure container 210 side of the vacuum container 200 for discharging the gas at the time of vacuum formation; a residual gas analyzer 240 mounted at the pressure container 210 side of the vacuum container 200 for measuring the composition and the pressure of the residual gas; pump means disposed at one side of the discharge container 220 of the vacuum container 200 for discharging the inside gas; and heating means disposed at the vacuum container 200 for heating the vacuum container 200 to a predetermined temperature.Type: GrantFiled: October 21, 2006Date of Patent: November 25, 2008Assignee: Korean Research Institute of Standards and ScienceInventors: Seung Soo Hong, Kwang Hwa Chung, Yong Hyeon Shin
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Publication number: 20080048663Abstract: Disclosed herein are an apparatus for and method of measuring the composition and the pressure of the discharged gas from an ion gauge by using a residual gas analyzer. In this regard, there are provided a vacuum container 200 divided into a pressure container 210 and a discharge container 220 by means of a partition 235 having an orifice 230 formed thereon; an ion gauge 100 mounted at the pressure container 210 side of the vacuum container 200 for discharging the gas at the time of vacuum formation; a residual gas analyzer 240 mounted at the pressure container 210 side of the vacuum container 200 for measuring the composition and the pressure of the residual gas; pump means disposed at one side of the discharge container 220 of the vacuum container 200 for discharging the inside gas; and heating means disposed at the vacuum container 200 for heating the vacuum container 200 to a predetermined temperature.Type: ApplicationFiled: October 21, 2006Publication date: February 28, 2008Applicant: KOREAN RESEARCH INSTITUTE OF STANDARDS AND SCIENCEInventors: Seung Soo Hong, Kwang Hwa Chung, Yong Hyeon Shin
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Patent number: 7228742Abstract: Disclosed is a pressure measuring system for a vacuum chamber, in particular, a pressure measuring system for a vacuum chamber using ultrasonic wave. In this regard, there is provided a pressure measuring system for a vacuum chamber using ultrasonic wave, comprising a vacuum chamber 10 formed with desired vacuum at the inside thereof; ultrasonic wave-emitting means mounted close to an outer peripheral surface of the vacuum chamber 10 for emitting an ultrasonic wave 62 to the inside of the vacuum chamber 10; ultrasonic wave-receiving means for receiving a reflection wave 64 reflected after the striking of the ultrasonic wave 62 emitted from the ultrasonic wave-emitting means to the vacuum chamber; reflection wave-detecting means for detecting the reflection wave 64 from the ultrasonic wave-receiving means; and amplitude-analyzing means for analyzing the amplitude of the reflection wave 64 detected by the reflection wave-detecting means.Type: GrantFiled: May 5, 2006Date of Patent: June 12, 2007Assignee: Korea Research Institute of Standards and ScienceInventors: Seung Soo Hong, Yong Hyeon Shin, Kwang Hwa Chung
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Publication number: 20070108671Abstract: Disclosed therein is apparatus and method for in-situ calibration of a vacuum gauge by absolute method and comparison method, which can carry out absolute calibration using a static type standard for measuring pressures of vacuum chambers by expanding and moving gas to the vacuum chambers of different volumes in order and comparison calibration of vacuum gauges in an in-situ state without movement of the vacuum gauges according to a method for controlling gas flow through an orifice using a calibrated standard vacuum gauge. The present invention includes a technology for combining an absolute calibration of a standard vacuum gauge by a static method and a comparative calibration of a vacuum gauge by a method for controlling a gas flow through an orifice, technologies for generating and calibrating standard pressure from a low vacuum to a high vacuum, and a technology of comparative calibration of the vacuum gauge by a method for stabilizing the gas flow through the orifice.Type: ApplicationFiled: May 5, 2006Publication date: May 17, 2007Applicant: Korea Research Institute of Standards and ScienceInventors: Seung Soo Hong, Yong Hyeon Shin, Kwang Hwa Chung, In Tae Lim
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Patent number: 7061184Abstract: The present invention discloses a device for measuring and monitoring electron density of plasma. The device includes a chamber filled with plasma having varying electron density; a frequency probe having transmission/receiving antennas and a pair of waveguides, one end of which is mounted in the chamber, for radiating and receiving electromagnetic waves; an electromagnetic wave generator electrically connected to one of the waveguides of the frequency probe for generating electromagnetic waves; and a frequency analyzer for scanning the frequency of received electromagnetic waves and analyzing the scanned frequency with respect to the amplitude of the received electromagnetic waves. Coupled to the rear end of the frequency probe is preferably a transfer unit having a hydraulic cylinder structure such that the frequency probe is moved in the chamber to detect the spatial distribution of electron density.Type: GrantFiled: July 21, 2004Date of Patent: June 13, 2006Assignee: Korea Research Institute of Standards of ScienceInventors: Jung Hyung Kim, Yong Hyeon Shin, Kwang Hwa Chung, Sang Cheol Choi
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Patent number: 6687626Abstract: A flux distribution measuring apparatus measures distribution of flow rates of a flowable medium. The measuring apparatus includes thin metal wire(s) for scanning a flowable medium and lead wires connected to the thin metal wire(s), wherein a voltage difference is detected between adjacent lead wires while the measuring apparatus scans the flowable medium in the direction perpendicular to a flow path of the flowable medium. The voltage differences are generated due to temperature changes in the thin metal wire(s) while scanning the flowable medium having different flow rates. The measuring apparatus visualizes the distribution of flow rates of a flowable medium using a computer which receives and processes the voltage differences detected.Type: GrantFiled: February 19, 2002Date of Patent: February 3, 2004Assignee: Korea Research Institute of Standars and ScienceInventors: Dae Jin Seong, Yong Hyeon Shin, Jung Hyung Kim, Jong Yeon Lim, Kwang Hwa Jung
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Publication number: 20020134170Abstract: A flux distribution measuring apparatus measures distribution of flow rates of a flowable medium. The measuring apparatus includes thin metal wire(s) for scanning a flowable medium and lead wires connected to the thin metal wire(s), wherein a voltage difference is detected between adjacent lead wires while the measuring apparatus scans the flowable medium in the direction perpendicular to a flow path of the flowable medium. The voltage differences are generated due to temperature changes in the thin metal wire(s) while scanning the flowable medium having different flow rates. The measuring apparatus visualizes the distribution of flow rates of a flowable medium using a computer which receives and processes the voltage differences detected.Type: ApplicationFiled: February 19, 2002Publication date: September 26, 2002Inventors: Dae Jin Seong, Yong Hyeon Shin, Jung Hyung Kim, Jong Yeon Lim, Kwang Hwa Jung