Abstract: A method and system for providing an adapter system for use with a first burn-in system is disclosed. The first burn-in system includes a heating chamber and a plurality of burn-in boards for use in the heating chamber. Each of the plurality of burn-in boards is for holding a plurality of semiconductor devices for testing in the first burn-in system. Each of the plurality of burn-in boards has a first connector for receiving a plurality of signals for a first portion of the plurality of semiconductor devices. Each of the plurality of signals is received in a first corresponding portion of the first connector. The method and system include providing an adaptor card for use with the first burn-in system and a driver board for a second burn-in system. The driver board is incompatible with the first burn-in system and has a second connector for outputting the plurality of signals. Each of the plurality of signals is provided in a second corresponding portion of the second connector.

Abstract: Aspects for generating test reports from memory device reliability testing are described. The aspects include utilizing a memory device reliability testing system for write endurance testing of a plurality of lots of memory devices. Program instructions are performed to automatically generate a test report from results data of each of a chosen number of the plurality of lots substantially simultaneously.

Abstract: A method and system for providing an adapter system for use with a first burn-in system is disclosed. The first burn-in system includes a heating chamber and a plurality of burn-in boards for use in the heating chamber. Each of the plurality of burn-in boards is for holding a plurality of semiconductor devices for testing in the first burn-in system. Each of the plurality of burn-in boards has a first connector for receiving a plurality of signals for a first portion of the plurality of semiconductor devices. Each of the plurality of signals is received in a first corresponding portion of the first connector. The method and system include providing an adaptor card for use with the first burn-in system and a driver board for a second burn-in system. The driver board is incompatible with the first burn-in system and has a second connector for outputting the plurality of signals. Each of the plurality of signals is provided in a second corresponding portion of the second connector.

Abstract: Nodes of a test station for testing IC devices are monitored to detect for the occurrence of any undesired DC transient. The test station for testing the IC devices includes a testing board for holding the IC devices, at least one voltage supply for biasing the IC devices, and a signal driver source for providing driving signals coupled to the IC devices, during testing of the IC devices. A system for protecting the IC devices from EOS (electro over stress) damage due to the undesired DC transient includes a signal measuring unit that monitors for occurrence of an undesired DC transient at any of the at least one voltage supply, of the signal driver source, and of at least one node of the testing board. The system also includes a data processing unit and a data interface bus coupled between the signal measuring unit and the data processing unit.